Symposium PP: Three-Dimensional Tomography of Materials
ABSTRACT SUBMISSION: MAY 21 - JUNE 21, 2011
REMINDER: In fairness to all potential authors, late abstracts will not be accepted.
The structural complexity of modern materials and devices is such that a variety of imaging and diffraction techniques must be used to elucidate three-dimensional (3D) structure, chemical composition, and, ideally, electronic structure. This symposium will bring together a number of 3D imaging (tomog-raphy) techniques that enable materials to be imaged and analyzed across a range of length scales. At the finest level, 3D atom-probe tomography enables materials to be studied essentially atom-by-atom with atomic-scale 3D reconstructions of, e.g., dopant clusters, interfacial segregation, and fine-scale alloying. At the nanoscale, electron tomography in the TEM yields 3D reconstructions with subnanometer resolution across structures with submicron dimensions. In the FIB-SEM, a slice-by-slice approach can give a 3D reconstruction with ~5 nm resolution. X-ray tomography, especially using synchro-tron radiation and soft x-rays, can now achieve spatial resolution of only a few 10s of nm; using highly energetic x-rays, large engineering structures can be investigated in 3D. If the structure is optically transparent, then optical tomography is of great use; and here resolutions of 20 nm are possible. Addition-ally, 3D reconstructions of microstructures at larger length scales are considered, utilizing electron-backscattering diffraction (EBSD). All of these tomo-graphic techniques can be considered complementary, correlating 3D structure with electronic, chemical, and mechanical properties. Moreover, all tomographic techniques are based on reconstruction algorithms that require careful implementation and can suffer from artifacts and errors. This symposium will encourage cross-disciplinary discussion of algorithms and techniques, sharing ideas and problems, and realizing solutions that are applicable to many different tomographic data sets.
Session topics will include:
- 3D imaging techniques
- Atom probe tomography
- TEM tomography
- FIB/SEM tomography
- X-ray tomography
- Synchrotron tomography
- Optical tomography
- Sampling design
- Data acquisition
- Visualization
- Image processing/analysis
- Geometric models for microstructures
A tutorial complementing this symposium is tentatively planned. Further information will be included in the MRS Program that will be available online in September.
Invited speakers include:
Yoshitaka Adashi (NIMS, Japan): Automated 3D Serial Sectioning; Jon Barnard (Univ. of Cambridge, United Kingdom): Tomography of Dislocation Networks; Wolfgang Baumeister (MPI Martinsried, Germany): 3D of Biological Molecules; Marc de Graef (Carnegie Mellon Univ.): Serial Sectioning; Hiroshi Jinnai (Kyoto Inst. of Technology, Japan): 3D of Polymers; Derk Joester (Northwestern Univ.): Atom-Probe Tomography of Organic/Inorganic Interfaces; Thomas Kelly (Imago Scientific Instruments): 3D Atom Probe; Carolyn Larabell (Univ. of California-San Francisco):Tomography of Biological Materials; David Muller (Cornell Univ.): Single-Atom Tomography in the TEM; Peter Nellist (Univ. of Oxford, United Kingdom): Tomography in STEM; Anthony Rollett (Carnegie Mellon Univ.): 3D Microstructure by EBSD; Naoya Shibata (Univ. of Tokyo, Japan): 3-D Information by STEM; Nabuo Tanaka (Nagoya Univ., Japan): 3D of Catalysts; Peter Voorhees (Northwestern Univ.): Serial Section-ing and 3D Reconstruction; and Matthew Weyland (Monash Univ., Australia): STEM Tomography.
Symposium Organizers
Frank Mücklich
Saarland University, Dept. of Materials Science & Engineering,
Materials Engineering Centre, Saarland,
Campus D3 3, D-66123 Saarbrücken, Germany
Tel 49-681-302-70501, Fax 49-681-302-70502,
muecke@matsci.uni-sb.de
David Seidman
Northwestern University, Dept. of Materials Science
and Engineering, 2220 Campus Dr., Evanston, IL 60208
Tel 847-491-4391, Fax 847-467-2269,
d-seidman@northwestern.edu
Yuichi Ikuhara
The University of Tokyo, Institute of Engineering Innovation,
School of Engineering, 2-11-16 Yayoi, Bunkyo-ku,
Tokyo 113-8656, Japan
Tel 81-3-5841-7688, Fax 81-3-5841-7694,
ikuhara@sigma.t.u-tokyo.ac.jp
Paul Midgley
University of Cambridge, Dept. of Materials Science and Metallurgy,
Pembroke St., Cambridge, CB2 3QZ, United Kingdom
Tel 44-1223-334561, Fax 44-1223-334567, pam33@cam.ac.uk
Manfred Rühle
Max Planck Institute for Metals Research,
Heisenbergstr. 3, D-70569 Stuttgart, Germany
Tel 49-711-689-3520, Fax 49-711-689-3653, ruehle@mf.mpg.de
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