2012 MRS Fall Meeting Exhibitors
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- November 25-30, 2012
- Boston, Massachusetts
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Meeting Chairs:
Chennupati Jagadish, Thomas Lippert, Amit Misra, Eric Stach, Ting Xu
The 2012 MRS Fall Meeting Exhibit will be held in conjunction with the 2012 MRS Fall Meeting and will run from Tuesday, November 27 through Thursday, November 29. Exhibitors -- the exhibit space for this meeting is now sold out. We invite you to find out more about exhibiting at an upcoming MRS Meeting.
Exhibit Hours
(Exhibitors -- Move-In and Tear-Down hours are available here.)
- Tuesday, November 27 - 11 am - 5:30 pm
- Wednesday, November 28 - 11 am - 6 pm
- Thursday, November 29 - 10 am - 1:30 pm
The organizations listed below will exhibit at the 2012 MRS Fall Meeting:
- 10 Angstroms, Booth 323
Electron Beam Lithography Systems; Nanoindenters; Refurbished SEMs
- A & N Corporation, Booth 1025
Vacuum Chambers; Vacuum Fittings; Vacuum Valves
- Across International LLC, Booth 802
Induction Heaters; Ball Mills
- ACS Publications, Booth 125
ACS Nano; Nano Letters; Journal of Physical Chemistry C; ACS Applied Materials & Interfaces
- AdValue Technology, LLC, Booth 622
Alumina Product; Quartzware; Zirconia Products
- Advanced Polymer Materials Inc., Booth 1207
Block Copolymers; Functional Copolymers; Conductive Polymers
- Advanced Research Systems, Inc., Booth 304
Closed and Open Cycle Cryocooler; Cryogenic Probe Station; Helium Liquefiers
- Agilent Technologies, Booth 401
Nanoindenters; Universal Testing Systems; Field Emission Scanning Electron Microscopes; Atomic Force Microscopes
- AIP Publishing, Booth 117
Physics Journals; Online Hosting; Conference Proceedings
- AIST-NT, Inc., Booth 1308
Atomic Force/Scanning Probe Microscopes; Combined AFM & Raman Spectroscopy Systems
- AIXTRON SE, Booth 507
MOCVD/CVD/PECVD Equipment; OVPD and PVPD and Equipment; AVD and ALD Equipment
- AJA International, Inc., Booth 701
Sputtering Systems; Sputter Sources; Sputter Targets
- AldLab Chemicals LLC, Booth 1305
Nanowires; Nanoparticles; Nanotech Formulation and Drug Delivery
- Aldrich Materials Science, Booth 1024
Organic Electronics; Alternative Energy; Nanomaterials
- Alfa Aesar, A Johnson Matthey Company, Booth 912
High-Purity Metals; Evaporation Materials; Ceramics
- Alfred University, Booth 225
Energy; Research
- Alicat Scientific, Inc., Booth 1123
Mass Flow Control (MFCs); Pressure & Differential Pressure Control
- Amastan LLC, Booth 733
Nanomaterials; Nanomaterial Manufacturing Equipment; Spheroidization
- American Physical Society, Booth 121
Publications; Physics Journals; Online Journals
- ANA Innovation Huts and Services Inc., Booth 320
Confocal Raman AFM; UHV ESCA/XPS/ARPES; UHV Components and Systems, Cryo UHV AFM/STM
- Anasys Instruments Corp., Booth 621
AFM+; Nanoscale Infrared Spectroscopy (nanoIR); nano-TA2
- Andeen-Hagerling, Inc., Booth 519
Precision Capacitance and Loss Bridges; Precision Reference Capacitors
- Anfatec Instruments AG, Booth 1211
SPM Controllers; LockIn Amplifiers; AFM/Kelvin Probe
- Angstrom Engineering Inc., Booth 928
CVD, PVD, Sputter Deposition Systems; Thermal Evaporation Systems; Electron Beam Systems; Glovebox Integrated Thin Film Technologies
- Angstrom Sciences, Booth 1307
Magnetrons; Sputtering Material; Sputtering Cathodes
- Angstrom Scientific Inc., Booth 707
Electron Microscopy; Nano-manipulators
- Angstrom Sun Technologies, Inc., Booth 931
Spectroscopic Ellipsometer; Microspectrophotometer; Film Thickness Tools
- Annealsys, Booth 806
RTP; RTCVD; Annealing; MOCVD; Spray-CVD; LPCVD
- Anton Paar USA, Booth 205
Small Angle X-Ray Scattering; SAXS; X-Ray Diffraction
- Apple Academic Press, Inc., Booth 1302
Professional/Academic Books
- Applied Nanostructures, Inc., Booth 1206
AFM Probes; MEMS; Microscope Parts
- Applied Surface Technologies, Booth 609
CO2 Snow Jet Cleaning; Surface Cleaning; Substrate Cleaning
- Arradiance, Inc., Booth 723
ALD Systems; ALD Services; ALD-Activated Microchannel Plates and Detectors
- Asahi Spectra Co., Ltd., Booth 1107
Xenon Light Source; Solar Simulator; Optical Filter
- ASMEC GmbH, Booth 1210
Nano Hardness Tester; Nanoindenter; Analysing Software
- Asylum Research, Booth 510
Atomic Force/Scanning Probe Microscopes; Nanoindenter
- attocube systems AG, Booth 509
Nanopositioning Systems; Low-vibration Cryogen-free Cryostats; Low Temperature Scanning Probe and Confocal Microscopes; Fiber-based Interferometric Sensor Systems
- Attolight AG, Booth 720
Cathodoluminescence System; SEM
- AVS, Booth 123
Publishing; Education; Membership
- B&W Tek, Inc., Booth 1023
Raman Spectrometers; Spectrometer Modules; Lasers
- Baden-Württemberg International, Booth 111
Discover Scientific Excellence Made in Germany and Explore Career Opportunities
- Balazs NanoAnalysis, a Division of Air Liquide, Booth 709
Analytical Testing; Materials Characterization; AMC-SMC
- BaySpec, Inc., Booth 832
Raman Microscope; Raman Moving Lab; Raman Benchtop 1064, 785, 532
- BigC: DinoLite Scopes, Booth 735
Handheld Digital Microscopes
- Biolin Scientific, Inc., Booth 606
Quartz Crystal Microbalance with Dissipation Monitoring; Farfield Dual Polarization Interferometer; Attension Theta Optical Tensiometer
- BioLogic USA, Booth 907
Electrochemical Research; Potentiostats; Fuel Cell/Battery Testing
- Blue Wave Semiconductors, Inc., Booth 803
Substrate Wafer Heaters; Thin Film Deposition Systems; Thin Films and Coating Materials and R&D Services
- Bluestone Global Tech, Inc., Booth 1200A
Graphene Film; Graphene on Wafer; Graphene-based Device and Application
- Brooks Automation, Inc., Booth 722
835 Vacuum Quality Monitor System; XC Cryochiller
- Bruker, Booth 408
X-Ray Diffraction
- Bruker Nano Surfaces Division, Booth 409
Atomic Force Microscopes; 3D Optical Microscopes; Stylus Profilers; Tribometers; Nano-Micro- and Macro-Indenters; Scratch Testers; AFM Probes
- Cambridge University Press, Booth 105
Books; Journals
- Capovani Brothers Inc., Booth 1314
Used Scientific Equipment
- Carl Zeiss Microscopy, LLC, Booth 501
Light Microscopes; Electron Microscopes; Cameras & Software
- Chemat Technology, Inc., Booth 201
Spin Coating; Dip Coating; Chemical Precursors
- ColdEdge Technologies, Inc., Booth 719
Cryostats; Cryocoolers; Cryogenics
- COMSOL, Inc., Booth 705
COMSOL Multiphysics
- CRAIC Technologies, Inc., Booth 1102
Microspectrophotometers; Raman
- Cryogenic Limited, Booth 611
Superconducting Magnets; Measurement Systems; Cryogen Free Systems
- Crystal Bank, Booth 820
Single Crystals; Copper Single Crystals; Substrates
- CRYSTAL GmbH, Booth 909
Substrate/Wafer; Laser Crystals; Optical Components
- CrystalMaker Software Ltd., Booth 929
CrystalMaker; CrystalDiffract; SingleCrystal
- CSM Instruments Inc., Booth 617
Scratch Testers; Indentation Testers; Pin-on-Disk Tribometer; Testing Services
- cyberTECHNOLOGIES USA, LLC, Booth 729
Surface Quality Measurement Systems; Flatness & Thickness Measurement Systems; Total Thickness Measurement Systems
- DCA Instruments, Inc., Booth 520
UHV Deposition Systems; Effusion Cell; Substrate Heater Stage
- DELMIC BV, Booth 1125
SPARC System; SECOM Platform
- Delong America Inc., Booth 706
Benchtop Combined TEM and SEM; Low Voltage TEM
- Denton Vacuum, LLC, Booth 913
Sample Preparation Tools; High Vacuum Carbon Evaporators; Thin Film Deposition Systems
- Digital Surf SARL, Booth 704
Surface Imaging and Analysis Software for SPMs; Microscopes; Profilometers
- EBARA Technologies, Inc., Booth 809
Vacuum Pumps; Turbo Pumps
- Ecopia Corp., Booth 321
Variable Temperature Hall Effect Measurement System; Probe Station; RTF System
- eDAQ, Inc., Booth 823
High Resolution Impedance Analysis; Tethered Membrane Analysis; General Data Recording
- Electron Microscopy Sciences, Booth 307
Laboratory Supplies; Chemicals/Adhesives Equipment
- Elsevier, Booth 101
Books; Journals; Electronic Products
- EM4SYS Co., Ltd., Booth 1118
AFM; Nano State; Nano Measurement
- Energetiq Technology, Booth 1020
UV Light Source; Broadband Light Source; High Brightness Light Source
- European Synchrotron Radiation Facility, Institut Laue Langevin, Booth 219
Synchrotron X-ray and Neutron Facilities
- FEI Company, Booth 311
Scanning Electron Microscopes; Transmission Electron Microscopes; DualBeam SEM/FIB Microscopes
- First Nano, A Division of CVD Equipment Corporation, Booth 702
CVD Equipment; Gas/Chemical Delivery Systems; Gas Abatement Systems;CVD Materials
- Fischer Technology, Inc., Booth 203
Fischerscope XRF; Microhardness Testers
- Fischione Instruments, Booth 508
Electron Microscope Accessories; Sample Preparation
- Flow Sciences, Inc., Booth 1122
Glove Box; Isolater; Safety Hood
- FM Lab, Booth 731
F-Mobile Energy; Energy Storage; Functional Materials
- FUJIFILM Dimatix, Inc., Booth 1007
Dimatix Materials Printer; Dimatix Materials Cartridge; Other Dimatix Printheads & SYstems
- Gamry Instruments, Booth 910
Potentiostats; Quartz Crystal Microbalance; Electrochemistry Accessories
- Gatan, Inc., Booth 301
Materials Characterization; Nanotechnology; Photovoltaics
- Geib Refining Corp., Booth 807
Reclaim of Precious Metals; Precious Metal Products
- Goodfellow Corporation, Booth 1017
Metals and Materials for Research & Development
- Guangzhou Mikrouna Mechatronics Technology Co., Ltd., Booth 1029
Glove Box; Gas Purification System
- Hamamatsu Corporation, Booth 804
Quantum Yield Measurement; NIR; VUV; Electron Detection and Imaging
- HeatWave Labs Inc., Booth 903
Substrate Heaters; Cathodes; Electron Guns
- Heidelberg Instruments Inc., Booth 1120
Maskless Lithography Laser Writers
- Herzan LLC, Booth 1304
Vibration Isolation; Acoustic Isolation; Environmental Solutions; Site Survey Analysis
- Hiden Isochema Ltd., Booth 221
Gas/Vapor Sorption Analyzers; Moisture Sorption Analyzers
- Hielscher USA, Inc., Booth 1204
Ultrasonic Mixers; Dispersion Technology; Sonochemistry; Nano-Particle Milling; Sonocatalysis
- Hitachi High Technologies America, Inc., Booth 524
Electron Microscopes; Focused Ion Beam; Sample Prep
- HORIBA Scientific, Booth 901
Raman; Spectroscopy; Ellipsometry
- Hummingbird Scientific, Booth 207
TEM Specimen Holders
- Huntington Mechanical Laboratories, Inc., Booth 1001
Vacuum Manipulation & Positioning; Vacuum Chambers; Vacuum Valves & Components
- Hysitron, Inc., Booth 324
PI 95 TEM PicoIndenter; PI 85 SEM PicoIndenter; PI 87 SEM PicoIndenter
- Hysitron, Inc., Booth 417
TI 950 TriboIndenter; TI 750 Ubi; TS 75 TriboScope
- Image Metrology A/S, Booth 1112
SPIP Image Analysis Software
- Imina Technologies, Booth 1109
Micro- and Nanomanipulator; Electrical Prober; Microscope Accessories
- Inel, Inc., Booth 325
X-ray Diffractometers; Position Sensitive Detectors; X-ray Generators
- INFICON, Booth 613
Thin Film Deposition; Quartz Crystal Microbalance Research; Vacuum Gauges and Components
- Innovative Technology, Inc., Booth 725
Glove Boxes; Vapor Deposition Equipment; Spin Coaters; Gas Purification Systems
- InstruTech, Inc., Booth 1019
Vacuum Gauges; Vacuum Measurement Controllers; Convection & Ionization Vacuum Gauges
- International Centre for Diffraction Data (ICDD), Booth 505
X-Ray Powder Diffraction; Database; Software
- Intlvac Thin Film, Booth 1313
Ion Beam Etch Systems; Physical Vapor Deposition
- ION-TOF USA, Inc., Booth 818
TOF-SIMS; AFM; Ion Scattering
- IOP Publishing, Booth 110
Leading journals including Nanotechnology and Science & Technology of Advanced Materials
- iXRF Systems, Inc., Booth 523
Microanalysis Systems (EDS); XRF for the SEM; EBSD
- Janis Research Company, LLC, Booth 930
Micromanipulated Probe Stations; Cryostats; Cryocoolers
- Japan Advanced Institute of Science and Technology, Booth 202
Education; Research; Advanced Materials Science Technology
- Japan Science and Technology Agency, Booth 204
Technology Licensing for Categories including New Materials, Electronic Devices and Water Cleaning
- Japan Society of Applied Physics, Booth 200
Journals, including Applied Physics Express, Japanese Journal of Applied Physics
- JASCO, Booth 1124
Raman; Near Field; FT-IR; UV-Vis/NIR; Thin-Film Thickness Analysis; Materials Analysis; Nanotechnology; Fluorescence
- JEOL USA, Inc., Booth 300
TEM; SEM; Auger/MicroProbe
- Kaufman & Robinson, Inc., Booth 222
Ion Source; Plasma Sources; Ion Beam Assist
- Keithley Instruments, Inc., Booth 601
Sensitive Electrical Measurement Instruments; I-V Characterization Systems; DMMs and Power Supplies
- Kimball Physics, Inc., Booth 700
UHV Electron and Ion Guns; Cathodes; Vacuum Chambers and Fittings
- KLA-Tencor Corporation, Booth 600
Stylus Profiler; Universal Microscope
- KP Technology Ltd., Booth 824
Scanning and UHV Work Function (Kelvin) Probes; Air Photoemission System
- Kurt J. Lesker Company, Booth 400
Pure Targets and Materials; Vacuum Components; Thin Film Deposition Systems; Target Bonding Services; UHV Manipulation
- Labtec Sales Partners LLC, Booth 721
Plasma Etch; Thin Film Deposition and ALD; Maskless Lithography Systems
- Lake Shore Cryotronics, Inc., Booth 800
Hall Effect Measurement Systems; Probe Stations; Cryogenic Instruments and Sensors
- Leica Microsystems Inc., Booth 316
Microscopes; Sample Preparation; Imaging Systems
- LovaLite SAS, Booth 1312
Micro Optical Component; Nanotechnology; Modelling Software
- M. Braun, Inc., Booth 317
Gloveboxes & Gas Purifiers; Vacuum Systems; Solvent Purification Systems; TFD systems
- MANTIS Deposition Ltd., Booth 605
Nanoparticle Deposition; PVD; Thin Film Deposition Tools
- McCrone Group, Booth 1106
Microscopes; Analytical/Testing Services; Benchtop SEM
- MDC Vacuum Products, LLC, Booth 900
High & Ultra High Vacuum Products; Ceramic-to-Metal Feedthroughs; UHP Weldments
- Metrohm USA, Inc., Booth 322
Electrochemical Systems; Impedance Characterizations; Sensors
- METTLER TOLEDO, Booth 1011
MP; DSC1; TGA/DSC1; Flash DSC
- Michelson Prize & Grants, Booth 730
- Micro Materials Limited, Booth 1309
NanoTest System; MicroTest System
- Micro Photonics Inc., Booth 1016
X-Ray Micro CT; X-Ray Diffraction
- MicroFab Technologies, Inc., Booth 805
Precision Printing & Microdispensing Systems; Jetting Components; Application Development Services
- Microtrac Inc., Booth 906
Particle Size; Imaging; Surface Area
- MicroXact Inc., Booth 918
Analytical Probe Stations
- Milestone Inc., Booth 830
UltraWAVE; SynthWAVE; START
- MMR Technologies, Inc., Booth 1003
Hall Effect Measurement Systems; Seebeck Effect Measurement Systems; Variable Temperature Microprobe Systems
- Molmex Scientific Inc., Booth 623
Small Angle X-ray Scattering Instrumentation; AFM/SPM
- Montana Instruments Corporation, Booth 821
Cryostation
- MTI Corporation, Booth 810
Multiple Zone Furnaces; High Vacuum Furnaces; PECVD Furnaces; Battery Research Equipment
- MV Laboratories Inc., Booth 908
High Purity Inorganics; Rare Earth Products; Precious Metal Products
- NanoAndMore USA Inc., Booth 608
AFM Probes; Digital Optical Microscopes; Digital Holographic Microscopes
- Nanofactory Instruments AB, Booth 904
In situ TEM Electrical, Mechanical and Optical Probing Systems
- NanoInk, Inc., Booth 811
Micro/Nano Patterning; BioMEMS; Biomimetic Surfaces for Cell Engineering
- NANOLANE, Booth 710
Nanotechnology; Optical Microscopy; Characterization Tools
- NanoMagnetics Instruments Ltd., Booth 1101
Atomic Force Microscope; Magnetic Force Microscope; Nanopositioner
- Nanomechanics, Inc., Booth 1030
Analytical Services; In Situ Mechanical Testing; Nanoindentation
- Nanonics Imaging Ltd., Booth 625
NSOM/SNOM; AFM; AFM/Raman
- Nanoscience Instruments, Inc., Booth 1113
Scanning Electron Microscopes; Atomic Force Microscopes; 3D Optical Microscope
- Nanosurf, Inc., Booth 911
FlexAFM; LensAFM ; FluidAFM
- Nanovea, Booth 829
Nano/Micro/Macro Mechanical Tester; 3D Non-Contact Profilometers; Tribometers
- National Nanotechnology Infrastructure Network, Booth 217
Nanofabrication; Nanotechnology
- National Reconnaissance Office, Booth 224
Research & Development Funding; Remote Sensing; Innovative Research
- Nature Publishing Group, Booth 124
Medical & Scientific Journals
- Neaspec GmbH, Booth 1205
Aperturless NSOM/SNOM; Nanoscale Infrared Spectroscopy; Raman Spectroscopy
- Neocera, LLC, Booth 716
Pulsed Laser Deposition Systems; Pulsed Electron Deposition Systems
- Netzsch Instruments N.A. LLC, Booth 924
Thermal Analysis; Thermal Conductivity; Thermal Expansion; Calorimetry
- NIST/CNST, Booth 220
Nanoscale Research Program; Nanofabrication Facility; User Facility
- NIST/MSD, Booth 216
Standard Reference Materials; Data and Calibration Services
- NOF America Corporation, Booth 1121
Phosphorylcholine (PC) Polymers; PC Derivatives
- Nor-Cal Products, Inc., Booth 425
Vacuum Components & Chambers; Flanges & Fittings; Valves
- Novarials Corporation, Booth 1209
Various Nanowires: TiO2, Al2O3, MgO, MnO2, MoO3, V2O5 Nanowires
- NT-MDT Co., Booth 211
SPM/AFM/STM; Raman TERS; Spectroscopy
- Oerlikon Leybold Vacuum, Booth 1306
Thin Film PVD Coating Systems; Vacuum Equipment; Leak Detectors
- Olympus America Inc., Booth 1013
Inverted Metallographs; Upright Microscopes; Stereo Microscopes; Filter Inspection
- Omicron Nanotechnology USA, Booth 817
UHV SPM; Surface Science Instrumentation; MBE
- OptiGrate Corporation, Booth 1108
Volume Bragg Gratings; Ultra-Narrow-Band Notch Filters; BragGrate Bandpass Filters
- OriginLab Corporation, Booth 616
Origin Software
- Oxford Instruments America Inc., Booth 816
ALD; Cryogenic Systems; Ion Beam; Microanalysis Systems; Nanomanipulators; Plasma
- Oxford University Press, Booth 126
Publications
- PANalytical Inc., Booth 1000
X-ray Diffraction (XRD); Computed Tomography (CT); Small Angle X-ray Scattering (SAXS); X-ray Fluorescence (XRF)
- Park Systems Inc., Booth 416
Atomic Force Microscopes
- Particle Sizing Systems, Booth 1022
AccuSizer SPOS; Nicomp DLS; Teclis
- Pascal Technologies Inc., Booth 822
Vacuum Systems; Vacuum Equipment; Leak Detectors
- PerkinElmer, Booth 1100
Spectrum Two; DSC
- Pfeiffer Vacuum, Booth 711
Vacuum Pumps; Vacuum Instrumentation
- Photon etc., Booth 1311
Hyperspectral Imager; Raman Hyperspectral Imager; Tunable Filters and Sources; SWIR Camera
- Photon Technology International, Inc., Booth 1008
Steady State Photoluminescence; Time-Resolved Photoluminescence; NIR Photoluminescence
- Photonic Cleaning Technologies, LLC, Booth 728
Manufacturer of First Contact Polymer Products
- Physical Electronics, Booth 712
Scanning Auger; SIMS; XPS; ESCA; TOF-SIMS; Materials Analysis; Surface Analysis
- Plasma-Therm LLC, Booth 618
Semiconductor Manufacturing Equipment
- Plasmaterials, Inc., Booth 421
Sputtering Targets; Backing Plates; Evaporation Materials; Bonding
- Princeton Instruments, Booth 223
Spectroscopy Systems; CCD Cameras; Spectrometers
- Princeton Scientific Corp., Booth 305
Metal Crystals; Laser Crystals; Superconductor Wafers
- Protochips, Inc., Booth 302
Microscopes, Electron Microscopy & Instrumentation; Nanotechnology; Biological, Biomedical, Bio-related Sciences
- PVD Products, Inc., Booth 1200
Pulsed Laser Deposition Equipment; Sputtering Systems; Evaporation Systems
- Quantum Design, Inc., Booth 511
Physical Property and Magnetic Property Measurement Systems
- Quartz Imaging Corporation, Booth 922
Digital Imaging Solutions; Laboratory Information Management System; X-ray Microanalysis System
- R.D. Mathis Company, Booth 718
Evaporation Sources; Evaporation Materials; Power Supplies
- Radiant Technologies, Inc., Booth 420
Ferroelectric Tester; Multiferroic Testers
- Refining Systems, Inc., Booth 1009
Sputtering Targets; Crucibles and Dishes; Evaporation Materials; Wires and Tubing
- Renishaw Inc., Booth 624
Raman Microscopes; Spectrometers
- Research and PVD Materials Corporation, Booth 834
PVD Materials; Sputtering Targets; Evaporation Sources
- RHK Technology, Inc., Booth 612
SPM Universal Controls; UHV STM; UHV AFM/STM
- Rigaku Americas Corporation, Booth 517
X-ray Diffraction Systems; Small Angle X-ray Scattering Systems
- Rigaku Innovative Technologies, Booth 522
Multilayer X-ray Optics; X-ray Monochromators; Microfocus X-ray Generators; X-ray CCD Cameras; Rotary Motion Feedthroughs
- Rigaku Raman Technologies, Booth 521
First Guard Handheld Raman Spectrometer
- Rocky Mountain Vacuum Tech, Inc., Booth 423
Vacuum Systems; Vacuum Components
- RSC Publishing, Booth 120
Journals; Books
- S.E.O. (Surface Electro Optics), Booth 1105
Contact Angle Analyzer; Surface Tension
- SAGE Publications, Booth 1300
Books; Journals
- Scientific Instruments, Inc., Booth 708
9700 Controller; SCM10; Diodes
- Seki Technotron USA, Booth 801
Microwave Plasma CVD Systems; Hot Filament CVD Systems; Plasma CVD Systems
- SemiconSoft, Inc., Booth 1303
MProbe Thin-film Measurement System; TFCompanion Software
- Semicore Equipment Inc., Booth 1212
Sputtering Systems; Evaporation Systems; Custom PVD Systems & Components
- Sentys Inc., Booth 1208
Effusion Cells and MBE; RHEED; Low-Temperature STM
- Solartron Analytical (AMETEK), Booth 917
ModuLab MTS; 1260 Impedance Analyzer; Cryostats & Furnaces
- SonoPlot, Inc., Booth 1018
Microplotter; Printed Electronics; Materials Priner
- SouthWest NanoTechnologies Inc. (SweNT), Booth 1116
Single-wall Carbon Nanotubes (CNT); Specialty Multiwall CNT; CNT-based Printable Inks; CNT-based Smart Fabrics
- SPECS Surface Nano Analysis, Inc., Booth 303
JT Scanning Tunneling Microscope; NAP PHOIBOS Energy Analyzer; Curlew SPM
- SPEX SamplePrep LLC, Booth 905
Mixer/Mills; Freezer/Mills; X-Press
- SPI Supplies, Division of Structure Probe, Inc., Booth 1202
Supplies for Electron Microscopy; Plasma Etching Systems; TEM Membrane Grid
- Springer, Booth 100
Books; Journals; E-Books
- STAIB Instruments, Inc., Booth 717
RHEED; Spectrometers; Surface Analysis
- Strem Chemicals, Inc., Booth 825
High Purity Chemicals for R&D; Nanomaterials; MOCVD, CVD and ALD Precursors & Bubblers; Quantum Dots; Graphene
- Structured Materials Industries, Inc., Booth 607
MOCVD Systems; ALD Systems; Thin Film Deposition Components
- Super Conductor Materials, Inc., Booth 620
Sputtering Targets; Evaporation Materials; Crucibles
- SVT Associates, Inc., Booth 404
Molecular Beam Epitaxy; Pulsed Laser Deposition; Atomic Layer Deposition
- TA Instruments, Booth 1021
DSC; TGA; Flash Diffusivity; Dilatometry
- Taylor & Francis–CRC Press, Booth 116
Books; Journals; Online Products
- Taylor Hobson, a Division of Ametek, Booth 919
Optical Profiler
- TCI America, Booth 1117
Fine Organic Chemicals; Bulk Chemicals; Lab Reagent R&D Chemicals
- Ted Pella, Inc., Booth 516
Vacuum Coaters; Calibration; Microscopy Sample Preparation & Supplies/Accessories
- Tescan USA Inc., Booth 923
Electron Microscopes; SEM/FIB Microscopes; Time of Flight TOF SIMS
- The Mellen Company, Inc., Booth 902
Furnaces; Crystal Growth; Custom Designs
- Thermionics Vacuum Products, Booth 406
Sample Handling; Evaporation Sources; Gate Valves
- Thermo Scientific, Booth 422
Raman Microscope; XPS Spectrometer; X-Ray Microanalysis System
- Toho Technology, Booth 604
FLX2320 Series; FLX3300 Series; FP Series Stylus Profilers
- Toshima Manufacturing Co., Ltd., Booth 1119
Sputtering Targets; MOCVD Precursor; Functional Ceramics
- TREK, INC., Booth 831
High-Voltage Amplifiers; Electrostatic Voltmeters; Surface/Volume Resistance Measurement
- Trion Technology, Inc., Booth 1006
Reactive Ion Etcher (RIE); Plasma Enhanced Chemical Vapor Deposition (PECVD); Stripping Systems
- TSI Inc., Booth 921
Research Optical Particle Sizer; Water-Based Condensation Particle Counters; Counters & Sizers
- UES, Inc., Booth 1104
RoboMet.3D; Advanced Coatings for Die Casting
- ULVAC Technologies, Inc., Booth 713
Nano Particle Deposition Systems; Rapid Thermal Annealing Equipment; Thermoelectric Measuring Equipment
- United Mineral & Chemical Corporation, Booth 1310
MBE Source Materials; MBE Equipment; Dopants
- USHIO America, Inc., Booth 1110
Electron Beam; Equipment; Custom Building
- Vacuum Atmospheres Company, Booth 1012
Glove Boxes & Gas Purification; Thin Film Deposition; Solvent Purification
- VAT, Inc., Booth 916
Vacuum Valves; Transfer Valves; Pressure Control System
- VG Scienta, Inc., Booth 703
Surface Analysis Systems and UHV Systems & Components; Valves; Sample Manipulators
- Vigor Gas Purification Technologies Inc., Booth 828
Glove Box; Gas Purification System; Solvent Purification System
- Wafer World Inc., Booth 1010
Silicon Wafers; Germanium Wafers; GaAs Wafers
- Wiley, Booth 112
Books; Journals; Online Resources
- WITec Instruments Corp., Booth 610
Confocal Raman Microscopy; Scanning Near-FieldMicroscopy; Atomic Force Microscopy
- J.A. Woollam Company, Inc., Booth 1004
Spectroscopic Ellipsometers
- World Scientific Publishing Co., Booth 1301
Books/eBooks; Journals/eJournals
- XEI Scientific, Inc., Booth 1028
Remote Plasma De-contaminators for SEM, TEM and FIB Chambers; Sample Precleaning
- XOS, Booth 1127
Polycapillary Optics; Doubly-curved Crystal; X-Beam–X-ray Source with Optics
- Xradia, Booth 920
UltraXRM; Versa XRM; UltraSPX
- Yeagle Technology Inc., Booth 808
High Vacuum Systems; On-site Service; High Vacuum Components
- Zeta Instruments, Booth 1111
3D Optical Profiler; 3D Microscope; Film Thickness Measurements
- Zygo Corporation, Booth 813
Noncontact Inspection; Profilers; Metrology
- Exhibit
- Tuesday, November 27 - 11 am - 5:30 pm
- Wednesday, November 28 - 11 am - 6 pm
- Thursday, November 29 - 10 am - 1:30 pm
- Exhibitor Move-In
- Monday, November 26 - 9 am - 6 pm
- Tuesday, November 27 - 7 am - 10 am
- Exhibitor Tear-Down
- Thursday, November 29 - 1:30 pm - 6 pm
- Friday, November 30 - 8 am - 9 am
(Freight pick-up only)
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