Meetings & Events

Fall 2006 logo2006 MRS Fall Meeting & Exhibit

November 27 - December 1, 2006 | Boston
Meeting Chairs:
 Babu R. Chalamala, Louis J. Terminello, Helena Van Swygenhoven

 

Symposium U : Advances in In Situ Characterization of Film Growth and Interface Processes

2006-11-27   Show All Abstracts

Symposium Organizers

Vladimir Matias Los Alamos National Laboratory
Robert Hammond Stanford University
Guus Rijnders University of Twente
Darrell Schlom The Pennsylvania State University
U1: Ion Scattering
Session Chairs
Vladimir Matias
Frances Ross
Monday AM, November 27, 2006
Room 300 (Hynes)

10:00 AM - **U1.1
Studies of Multifunctional Thin Film Growth and Interface Processes via Integrated In Situ Time-of-Flight Ion Beam and X-Ray Photoelectron Spectroscopy

Orlando Auciello 1
1 Materials Science Division, Argonne National Laboratory, Argonne, Illinois, United States

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10:30 AM - **U1.2
Mass Spectrometry of Recoiled Ions for In-situ Surface Analysis: Status and Possiblities.

J. Albert Schultz 1
1 , Ionwerks Inc., Houston, Texas, United States

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11:00 AM -
BREAK

12:00 PM - **U1.4
Time-of-Flight Ion Scattering Spectroscopy of Oxide Thin Films: Surface Structure Analysis and Sensitivity to Atomic Layer-by-layer Engineering.

Adrian Gozar 1 , Gennady Logvenov 1 , Ivan Bozovic 1
1 Condensed Matter and Materials Science, Brookhaven National Laboratory, Upton, New York, United States

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12:30 PM - U1.5
Ion Scattering Studies of High-κ Gate Stacks: Thermal Stability and Interdiffusion

Lyudmila Goncharova 1 , Tian Feng 1 , Eric Garfunkel 2 , Torgny Gustafsson 1
1 Physics, Rutgers University, Piscataway, New Jersey, United States, 2 Chemistry, Rutgers University, Piscataway, New Jersey, United States

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U2: Electron Microscopy
Session Chairs
Adrian Gozar
Darrell Schlom
Monday PM, November 27, 2006
Room 300 (Hynes)

2:30 PM - **U2.1
In situ Electron Microscopy as a Tool for Imaging the Growth of Nanostructures.

Frances Ross 1 , Suneel Kodambaka 1 , James Hannon 1 , Ruud Tromp 1 , Mark Reuter 1 , Arthur Ellis 1 , Jerry Tersoff 1
1 , IBM T.J. Watson Research Center, Yorktown Heights, New York, United States

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3:00 PM - **U2.2
A New Design for an Energy-Filtered, Aberration-Corrected LEEM/PEEM Instrument

Rudolf Tromp 1
1 , IBM T.J. Watson Research Center, Yorktown Heights, New York, United States

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3:30 PM -
BREAK

4:30 PM - **U2.3
Quantum Effects in Low Energy Electron Microscopy: a 3D view of Thin FilmGrowth and Structure.

Michael Altman 1
1 Department of Physics, Hong Kong University of Science and Technology, Kowloon Hong Kong

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5:00 PM - U2.4
Real-Time Oxidation Studies of Ru(0001) Using Low-Energy Electron Microscopy and Nanospectroscopy.

Jan Flege 1 , Peter Sutter 1
1 Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, New York, United States

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5:15 PM - **U2.5
In Situ Scanning Electron Microscopy of Single-Walled Carbon Nanotube Growth during Chemical Vapor Deposition.

Yoshikazu Homma 1 2 , Daisuke Takagi 1 , Iwao Wako 1
1 Department of Physics, Tokyo University of Science, Shinjuku, Tokyo, Japan, 2 CREST, Japan Science and Technology Agency, Kawaguchi, Saitama, Japan

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5:45 PM - U2.6
Chemical Mapping of Individual Semiconductor Nanostructures.

Fulvio Ratto 1 , Andrea Locatelli 2 , Stefano Fontana 2 , Sharmin Kharrazi 3 , Shriwas Ashtaputre 3 , Sulabha Kulkarni 3 , Stefan Heun 4 , Federico Rosei 1
1 , INRS - EMT, Varennes , Quebec, Canada, 2 , Sincrotrone Trieste S.C.p.A., Basovizza, TS, Italy, 3 , University of Pune, Pune India, 4 , TASC – INFM, Basovizza, TS, Italy

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2006-11-28   Show All Abstracts

Symposium Organizers

Vladimir Matias Los Alamos National Laboratory
Robert Hammond Stanford University
Guus Rijnders University of Twente
Darrell Schlom The Pennsylvania State University
U3: RHEED
Session Chairs
Robert Hammond
Guus Rijnders
Tuesday AM, November 28, 2006
Room 300 (Hynes)

10:00 AM - **U3.1
Use of RHEED Combined with Other Spectroscopic Methods for in-situ Characterization of Material Deposition.

Philippe Staib 1
1 , Staib Instruments, Williamsburg, Virginia, United States

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10:30 AM - **U3.2
High-pressure RHEED Controlled PLD of Complex Oxides.

Dave Blank 1 , Guus Rijnders 1
1 MESA Institute of Technology, University of Twente, AE Enschede Netherlands

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11:00 AM -
BREAK

11:30 AM - **U3.3
Advances in the use of RHEED-TRAX and Cathodoluminescence for In-Situ Growth Characterization and Control.

Thomas Myers 1 , Kyoungnae Lee 1 , Randy Tompkins 1 , Eric Schires 1 , David Lederman 1
1 Physics, West VIrginia University, Morgantown, West Virginia, United States

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12:00 PM - U3.4
Quantitative Study of Sub-monolayer growth of Ge(001) Homoepitaxy using Reflection High Energy Electron Diffraction.

Byungha Shin 1 , Michael Aziz 1
1 Division of Engineering and Applied Sciences, Harvard University, Cambridge, Massachusetts, United States

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12:15 PM - U3.5
Reflection High-energy Electron Diffraction (RHEED) Pole Figures for Surface Texture Analysis.

Fu Tang 1 , Gwo-Ching Wang 1 2 , Toh-Ming Lu 1 2
1 Department of Physics, Applied Physics and Astronomy, Rensselaer Polytechnic Institute, Troy, New York, United States, 2 Center for Integrated Electronics, Rensselaer Polytechnic Institute, Troy, New York, United States

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12:30 PM - U3.6
In situ RHEED Monitoring of Epitaxial Film Growth on Continuously Moving Tape.

Vladimir Matias 1 , Ruud Steenwelle 1
1 , Los Alamos National Laboratory, Los Alamos, New Mexico, United States

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12:45 PM - U3.7
Magnetic Interface Interactions in Cuprate-manganite Heterostructures and Superlattices.

Hanns-Ulrich Habermeier 1 , Christian Bernhard 2 , Jacques Chakhalian 1 , Soltan Soltan 1
1 , Max-Planck-Institute -FKF, Stuttgart Germany, 2 Physics, University of Fribourg, Fribourg Switzerland

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U4: SPM
Session Chairs
Dave Blank
Hanns-Ulrich Habermeier
Tuesday PM, November 28, 2006
Room 300 (Hynes)

2:30 PM - **U4.1
Grain Growth and Film Growth Observed with Real-time, in-situ STM.

Marcel Rost 1
1 Leiden Institute of Physics, Leiden University, Leiden Netherlands

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3:00 PM - U4.2
Monitoring Oxide Thin Film Growth with in-situ Atomic Force Microscopy.

Joska Broekmaat 1 , Frank Roesthuis 1 , Alexander Brinkman 1 , Horst Rogalla 1 , Dave H.A. Blank 1 , Guus Rijnders 1
1 , Faculty of Science & Technology and MESA+ Institute for Nanotechnology, University of Twente Netherlands

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3:15 PM - U4.3
Ultra-low Attempt Frequencies for the Formation of Vacancies on III-V Semiconductor Surfaces Measured by in-situ Scanning Tunneling Microscopy.

Philipp Ebert 1 , Mariya Yurechko 1 , Knut Urban 1
1 Institut fuer Festkoerperforschung, Forschungszentrum Juelich, Juelich Germany

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3:30 PM - U4.4
In-situ Characterization of Iron Oxide Quantum Dots and Thin Film Growth using AFM.

Jessica Thery 1 , Michael Gordon 1 , Thierry Baron 1 , Catherine Dubourdieu 2 , Celine Ternon 1 , Hervé Roussel 2
1 , CEA, Grenoble France, 2 , LMGP, Grenoble France

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3:45 PM - U4.5
in-situ Ultrahigh Vacuum Scanning Probe Microscopy Characterization of Ultra-Thin HfO2 Films on Initial Growth Stage

Lei Wang 1 , Kun Xue 1 , Jianbin Xu 1
1 Electronic Engineering, The Chinese University of Hong Kong, Hong Kong Hong Kong

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4:00 PM -
BREAK

4:30 PM - U4.6
In Situ Study of Optical Conductivity of Electroless Deposited Percolating Silver Films.

Stefan Kooij 1 , Anna Jo de Vries 1 , Agnes Mewe 1 , Herbert Wormeester 1 , Bene Poelsema 1
1 Solid State Physics, MESA+ Institute for Nanotechnology, University of Twente, Enschede Netherlands

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4:45 PM - U4.7
Atomic resolution STM of in-situ grown epitaxial SrRuO3 films: structure and electronic properties.

Junsoo Shin 1 2 , J. Zhou 3 , S. Kalinin 2 5 , V. Meunier 4 5 , E. Plummer 1 2 5 , A. Baddorf 2 5
1 Physics and Astronomy, University of Tennessee, Knoxville, Tennessee, United States, 2 Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States, 3 Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States, 5 Center for Nanophase Materials Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States, 4 Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States

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5:00 PM - U4.8
In-situ Investigation of Surface Oxygen Vacancies in Perovskites

Fabio Miletto Granozio 1 , Gabriella De Luca 4 , Roberto Di Capua 2 , Nathascia Lampis 2 , Paolo Perna 3 , Milan Radovic 2 , Marco Salluzzo 1 , Umberto Scotti di Uccio 3 , Alessia Sambri 2 , Ruggero Vaglio 1 2
1 Coherentia, CNR-INFM, Napoli Italy, 4 Physics Department, Università di Salerno, Salerno Italy, 2 Physics Department, Università Federico II, Napoli Italy, 3 DiMSAT, Università di Cassino, Cassino (FR) Italy

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5:15 PM - U4.9
In Situ Monitoring of the Stress Evolution During Electrochemical Deposition of Thin Films

Tianzhi Luo 1 , Robert Cammarata 1 2
1 Materials Science and Engineering, Johns Hopkins University, Baltimore, Maryland, United States, 2 Mechanical Engineering, Johns Hopkins university, Baltimore, Maryland, United States

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5:30 PM - U4.10
Stress Evolution due to Island Coalescence During Film Growth.

Abhinav Bhandari 1 2 , Brian Sheldon 1 , Sean Hearne 2
1 Engineering, Brown University, Providence, Rhode Island, United States, 2 , Sandia National Labs, Albuquerque, New Mexico, United States

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U5: Poster Session: In Situ Characterization
Session Chairs
Yves Chabal
Brian Stephenson
Tuesday PM, November 28, 2006
Exhibition Hall D (Hynes)

9:00 PM - U5.1
The Electronic Structure of 1,2-PCB10H11 Molecular Films: A Precursor to a Novel Semiconductor.

Snjezana Balaz 1 , Dimtcho Dimov 3 , Neil Boag 3 , Kyle Nelson 1 , Benjamin Montag 1 , Jennifer Brand 1 , Peter Dowben 2
1 College of Engineering and Technology, University of Nebraska-Lincoln, Lincoln, Nebraska, United States, 3 Chemistry and Nanotechnology, Institute for Materials Research, University of Salford, Salford United Kingdom, 2 Physics and Astronomy, University of Nebraska-Lincoln, Lincoln, Nebraska, United States

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9:00 PM - U5.10
Structural Depinning of Ne Monolayers on Pb at T < 6:5 K

Lorenzo Bruschi 2 , Giovanni Fois 2 , A. Pontarollo 2 , Giampaolo Mistura 2 , Bruno Torre 1 , Francesco Buatier de Mongeot 1 , Corrado Boragno 1 , Renato Buzio 1 , Ugo Valbusa 1
2 Dipartimento di Fisica G.Galilei, Università di Padova , Padova Italy, 1 Dipartimento di Fisica, Università di Genova, Genova Italy

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9:00 PM - U5.11
Retardation of Interfacial Layer Kinetics During Low Temperature UV Oxidation of Nitrogen Doped HfO2 Dielectrics.

Seungyoung Son 1 , Junnwoo Son 1 , Junghoon Jang 1 , Rajiv Singh 1
1 Materials Science & Engineering, University of Florida, Gaineville, Florida, United States

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9:00 PM - U5.12
Characterization of Alumina Optical Waveguides Grown by Ion Beam Assisted Deposition for SPARROW Biosensors.

Pavan Samudrala 1 , Joshua Nightingale 1 , Min Lim 2 , Timothy Cornell 1 , Praneetha Poloju 1 , Dimitris Korakakis 1 , Lawrence Hornak 1
1 Lane Department of Computer Science and Electrical Engineering, West Virginia University, Morgantown, West Virginia, United States, 2 Bennett Department of Chemistry, West Virginia University, Morgantown, West Virginia, United States

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9:00 PM - U5.13
Growth Kinetic Studies of Ge(001) Homoepitaxy by Pulsed Laser Deposition.

Lan Zhou 1 , Hua Zhou 1 , Randy Headrick 1
1 Physics, University of Vermont, Burlington, Vermont, United States

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9:00 PM - U5.14
In-situ Curvature Measurements During the Heteroepitaxy of Group-III-nitrides.

Armin Dadgar 1 3 , F. Schulze 1 , U. Haboeck 2 , F. Bertram 1 , J. Blaesing 1 , A. Diez 1 , T. Schenk 4 , K. Haberland 4 , A. Hoffmann 2 , T. Zettler 4 , C. Thomsen 2 , J. Christen 1 , A. Krost 1 3
1 FNW/IEP, Otto-von-Guericke-Universitaet magdeburg, Magdeburg Germany, 3 , AZZURRO Semiconductors AG, Magdeburg Germany, 2 Institut fuer Festkoerperphysik, TU-Berlin, Berlin Germany, 4 , Laytec GmbH, Berlin Germany

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9:00 PM - U5.15
Bismuth Nanoparticles Formation by Electron Beam Irradiation in TEM.

Selene Sepulveda-Guzman 1 , Nora Elizondo-Villarreal 1 , Xiaoxia Gao 2 , Alejandro Torres-Castro 1 , Miguel Jose-Yacaman 1 3
1 Chemical Engineering, The University of Texas, Austin, Texas, United States, 2 Texas Materials Institute, The University of Texas, Austin, Texas, United States, 3 Texas Advanced Materials Center, The University of Texas, Austin, Texas, United States

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9:00 PM - U5.16
Study on the Growth of Metal Oxide Nanowires by Synchrotron-based In-situ X-ray Diffraction

Guan Wang 1 , Xiao-Qing Yang 2 , Jonathan Hanson 2 , Xianrong Huang 1 , Michael Dudley 1
1 Materials Science Dept., Stony Brook University, Stony Brook, New York, United States, 2 Department of Chemistry, Brookhaven National Lab, Upton, New York, United States

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9:00 PM - U5.17
High Speed Piezo Force Microscopy (4 seconds per image) for Dynamic Piezoactuation Mapping at the Nanoscale

Ramesh Nath 1 , David Shuman 1 , Bryan Huey 1
1 Institute of Materials Science, University of Connecticut, Storrs, Connecticut, United States

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9:00 PM - U5.18
Electron Transport Properties of Organic Semiconductors Studied via Photoemission Spectroscopy and Current-Voltage Characteristics

Chih-I Wu 0
0 Electrical Engineering, National Taiwan University , Taipei, Taiwan, Taiwan

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9:00 PM - U5.19
Photoemission Studies of Substitution Dependent of Electronic Structures and Transport Properties in Oligofluorene Thin Films

Chih-I Wu 2 1
2 Graduate Institute of Electro-Optical Engineering, National Taiwan University, Taipei Taiwan, 1 Electrical Engineering, National Taiwan University , Taipei, Taiwan, Taiwan

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9:00 PM - U5.2
Passive Film Growth on Titanium Alloys in Simulated Body Fluid.

Julia Claudia Mirza Rosca 1 , Heinz Sturm 2 , Agustin Santana Lopez 1
1 Mechanical Engineering, Las Palmas de Gran Canaria University, Las Palmas de GC Spain, 2 BAM VI.2901, Federal Institute of Materials Research, Berlin Germany

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9:00 PM - U5.20
In Situ UHV-TEM Observation of the Formation of Copper Oxide Nanostructure.

Li Sun 1 , Chao Fang 1 , Xuetian Han 1 , Alan McGaughey 2 , Judith Yang 1
1 Department of Materials Science and Engineering, University of Pittsburgh, Pittsburgh, Pennsylvania, United States, 2 Department of Mechanical Engineering, Carnegie Mellon University, Pittsburgh, Pennsylvania, United States

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9:00 PM - U5.21
Depth Profiling Raman Spectra as a New Approach to Study in-situ Growth of YBCO Films.

Maria Branescu 1 , Coralie Naudin 2 , Arturas Vailionis 3
1 , National Institute for Materials Physics, Bucharest Romania, 2 , Horiba Jobin Yvon, Ville Neuve d’Ascq France, 3 , Stanford University, Palo Alto, California, United States

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9:00 PM - U5.3
Surface Reactions of Metal Catalysts for Carbon Nanotubes on an Oxide Thin Layer/Si Substrates Studied by in situ Micro X-ray Adsorption Spectroscopy using SPELEEM.

Fumihiko Maeda 1 , Hiroki Hibino 1 , Satoru Suzuki 1 , FangZhun Guo 2 , Yoshio Watanabe 2
1 NTT Basic Research Laboratories, NTT Corporation, Atsugi-shi, Kanagawa, Japan, 2 , The Japan Synchrotron Radiation Research Institute, Mikazuki-cho Sayo-gun, Hyogo, Japan

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9:00 PM - U5.4
Investigation of the Directed Self-Assembly of Poly(L-lactic acid) and Poly(D,L-lactic acid) at the Air-Water Interface via Planar Array Infrared Spectroscopy

Young Shin Kim 1 , D. Bruce Chase 2 , John Rabolt 1
1 Materials Science and Engineering, University of Delaware, Newark, Delaware, United States, 2 Central Research and Development, DuPont Experimental Station, Wilmington, Delaware, United States

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9:00 PM - U5.5
The Influence of Oxygen Diffusion on Residual Stress for Tantalum Thin Films.

Ming-Hsin Cheng 1 , Tsung-Chien Cheng 1 , Wen-Jun Huang 1 , Mao-Nan Chang 1 , Eddy-Jones Chung 2
1 , National Nano Device Laboratories, Hsinchu Taiwan, 2 , PANalytical, Taipei Taiwan

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9:00 PM - U5.6
Characterization of High k Dielectric Leakage by Non-contact Corona Kelvin Based Metrology.

Yunjung Jee 1 , Mi-sung Lee 1 , So-Yeon Yun 1 , Han-Soo Cho 1 , ChungSam Jun 1 , Tae-Sung Kim 1
1 , Samsung Electronics, Hwasung, Gyeonggi-do, Korea (the Republic of)

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9:00 PM - U5.7
In-situ X-ray Characterization of Nucleation, Growth, and Phase Stability of Magnetron Sputtered Tin+1AlNn Mn+1AXn Phase Thin Films.

Manfred Beckers 1 3 , Norbert Schell 2 3 , Rui Martins 2 3 , Wolfhard Möller 3 , Lars Hultman 1
1 Thin Film Physics Division, Department of Physics, Chemistry and Biology (IFM), Linköping University, Linköping Sweden, 3 Institute of Ion Beam Physics and Materials Research, Forschungszentrum Rossendorf, Dresden Germany, 2 ROBL-CRG , ESRF, Grenoble France

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9:00 PM - U5.8
Electrically Guided Assembly of Planar Colloidal Crystals.

Keqin Zhang 1 , Xiang-Yang Liu 1
1 , National University of Singapore, Singapore Singapore

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9:00 PM - U5.9
Kikuchi Features as the Origin of the Phase Shift of RHEED Intensity Oscillations During Homoepitaxy by MBE.

Byungha Shin 1 , John Leonard 2 , James McCamy 1 , Michael Aziz 1
1 Division of Engineering and Applied Sciences, Harvard University, Cambridge, Massachusetts, United States, 2 Materials Science and Engineering, University of Pittsburgh, Pittsburgh, Pennsylvania, United States

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2006-11-29   Show All Abstracts

Symposium Organizers

Vladimir Matias Los Alamos National Laboratory
Robert Hammond Stanford University
Guus Rijnders University of Twente
Darrell Schlom The Pennsylvania State University
U6: X-ray I
Session Chairs
Orlando Auciello
Tom Myers
Wednesday AM, November 29, 2006
Room 300 (Hynes)

9:30 AM - **U6.1
X-Ray Standing Wave Imaging of Atoms at Interfaces

Michael Bedzyk 1 2 , Chang-Yong Kim 1
1 Materials Science, Northwestern University, Evanston, Illinois, United States, 2 , Argonne National Laboratory, Argonne, Illinois, United States

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10:00 AM - **U6.2
Synchrotron-Based In Situ X-ray Scattering and Reflectivity Studies of Pulsed Laser Deposition.

Joel Brock 1 2
1 Cornell Center for Materials Research, Cornell University, Ithaca, New York, United States, 2 School of Applied and Engineering Physics, Cornell University, Ithaca, New York, United States

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10:30 AM - U6.3
Determining the Growth Mode of SrTiO3 (001) Homoepitaxy via Pulsed Laser Deposition using In Situ X-Ray Reflectivity.

John Ferguson 1 3 , Gokhan Arikan 1 2 , Aram Amassian 1 3 , Darren Dale 4 , Arthur Woll 4 , Joel Brock 1 2
1 Cornell Center for Materials Research, Cornell University, Ithaca, New York, United States, 3 Department of Materials Science and Engineering, Cornell University, Ithaca, New York, United States, 2 School of Applied and Engineering Physics, Cornell University, Ithaca, New York, United States, 4 Cornell High Energy Synchrotron Source, Cornell University, Ithaca, New York, United States

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10:45 AM - U6.4
Effects of Concurrent Discrete and Continuous Roughness on Surface Scattering.

Darren Dale 1 4 5 , Aaron Fleet 2 4 6 , Joel Brock 2 4 , Yuri Suzuki 3
1 Department of Materials Science and Engineering, Cornell University, Ithaca, New York, United States, 4 Cornell Center for Materials Research, Cornell University, Ithaca, New York, United States, 5 Cornell High Energy Synchrotron Source, Cornell University, Ithaca, New York, United States, 2 School of Applied and Engineering Physics, Cornell University, Ithaca, New York, United States, 6 , Lincoln Laboratory, Lexington, Massachusetts, United States, 3 Department of Materials Science and Engineering, UC Berkeley, Berkeley, California, United States

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11:00 AM -
BREAK

11:30 AM - U6.5
Interlayer Transport in Pulsed Laser Deposition of SrTiO3 Studied by Time-Resolved Surface X-Ray Diffraction

Gyula Eres 1 , J. Tischler 1 , B. Larson 1 , C. Rouleau 1 , D. Lowndes 1 , P. Zschack 2
1 Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States, 2 Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois, United States

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11:45 AM - U6.6
Time-resolved X-ray Studies of the Energetic Mechanisms Operant During Pulsed Laser Deposition of SrTiO3.

Gokhan Arikan 1 2 , John Ferguson 1 3 , Aram Amassian 1 3 , Darren Dale 4 , Arthur Woll 4 , Joel Brock 1 2
1 Cornell Center for Materials Research, Cornell University, Ithaca, New York, United States, 2 School of Applied and Engineering Physics, Cornell University, Ithaca, New York, United States, 3 Department of Materials Science and Engineering, Cornell University, Ithaca, New York, United States, 4 Cornell High Energy Synchrotron Source, Cornell University, Ithaca, New York, United States

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12:00 PM - U6.7
Real-time Synchrotron X-ray Studies of Ga Droplet and GaN Quantum Dot Formation by Droplet Heteroepitaxy on C-plane Sapphire.

Yiyi Wang 1 , Ahmet Ozcan 1 , Karl Ludwig 1 , Anirban Bhattacharyya 2 , Theodore Moustakas 2
1 Physics, Boston University, Boston, Massachusetts, United States, 2 Electrical and Computer Engineering, Boston University, Boston, Massachusetts, United States

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12:30 PM - U6.9
In-Situ X-Ray Studies of Oxygen Adsorption and Ordering on Cu (001).

Dillon Fong 1 , Jeffrey Eastman 1 , Guangwen Zhou 1 , Paul Fuoss 1 , Peter Baldo 1 , Loren Thompson 1 , Lynn Rehn 1
1 Materials Science Division, Argonne National Laboratory, Argonne, Illinois, United States

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12:45 PM - U6.10
Real-time Study of Low-energy Ion Bombardment-induced Surface Smoothing on Nanocorrugated Sapphire

Hua Zhou 1 , Lan Zhou 1 , Randall Headrick 1 , Gozde Ozaydin 2 , YiYi Wang 2 , Karl Ludwig Jr. 2
1 Physics, University of Vermont, Burlington, Vermont, United States, 2 Physics, Boston University, Boston, Massachusetts, United States

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U7: X-ray II
Session Chairs
Michael Bedzyk
Joel Brock
Wednesday PM, November 29, 2006
Room 300 (Hynes)

2:30 PM - **U7.1
In-Situ X-ray Studies of Metal-Organic Chemical Vapor Deposition.

Brian Stephenson 1 , R. Wang 1 , D. Fong 1 , F. Jiang 1 , S. Streiffer 1 , J. Eastman 1 , P. Fuoss 1 , K. Latifi 2 , Carol Thompson 2
1 Materials Science Division, Argonne National Laboratory, Argonne, Illinois, United States, 2 Department of Physics, Northern Illinois, DeKalb, Illinois, United States

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3:00 PM - U7.2
In-situ Synchrotron X-ray Diffraction during Pulsed Laser Deposition of Complex Oxides.

Guus Rijnders 1 , Arjen Janssens 1 , Vedran Vonk 1 , Mark Huijben 1 , Sybolt Harkema 1 , Dave Blank 1 , Heinz Graafsma 2 , Paul Tinnemans 3 , Elias Vlieg 3
1 MESA+ Institute for Nanotechnology & Faculty of Science and Technology, University of Twente, Enschede Netherlands, 2 , European Synchotron Radiation Facility, Grenoble France, 3 Solid State Chemistry, Radboud University, Nijmegen Netherlands

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3:15 PM - U7.3
Early-Stage Oxidation Behavior Of Cu-Ni Alloys

Jeffrey Eastman 1 , Dillon Fong 1 , Paul Fuoss 1 , Peter Baldo 1 , Guangwen Zhou 1 , Lynn Rehn 1 , Loren Thompson 1
1 Materials Science Division, Argonne National Laboratory, Argonne, Illinois, United States

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3:30 PM - U7.4
Time-resolved X-ray Reflectivity Study of Interfacial Reactions and Intermetallic Formation During In-situ Constant Heat-treatment.

Marta Gonzalez-Silveira 1 , Javier Rodriguez-Viejo 1 , M.Teresa Clavaguera-Mora 1 , Thierry Bigault 2
1 Dept. of Physics, Universitat Autonoma de Barcelona, Bellaterra, Barcelona, Spain, 2 , Institut Laue-Langevin, Grenoble France

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3:45 PM - U7.5
In situ Characterization of the Dynamics of Pentacene Growth.

Alex Mayer 1 , Aram Amassian 1 , George Malliaras 1
1 , Cornell University, Ithaca, New York, United States

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4:00 PM -
BREAK

4:30 PM - U7.6
Real-Time In-Situ X-Ray Diffraction Studies of Self-Propagating Exothermic Reactions in Nanostructured Reactive Multilayer Foils.

Jonathan Trenkle 1 , Lucas Koerner 2 , Harish Nathani 1 , Mark Tate 2 , Sol Gruner 2 3 , Timothy Weihs 1 , Todd Hufnagel 1
1 Department of Materials Science and Engineering, Johns Hopkins University, Baltimore, Maryland, United States, 2 Department of Physics, Cornell University, Ithaca, New York, United States, 3 Cornell High Energy Synchrotron Source, Cornell University, Ithaca, New York, United States

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4:45 PM - U7.7
Significant Shift of Phase Transition Temperature of Strained SrRuO3 Thin Films.

Kyoungjin Choi 1 , S. Baek 1 , H. Jang 1 , L. Belenky 1 , C. Eom 1
1 Materials Science and Engineering, University of Wisconsin - Madison, Madison, Wisconsin, United States

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5:00 PM - U7.8
Band Alignment in Alternative CMOS Gate Stacks

Eric Garfunkel 1 , Sylvie Rangan 2 , Eric Bersch 2 , Ozgur Celik 1 , Chien-lan Hsueh 2 , Robert Bartynski 2
1 Chemistry, Rutgers University, Piscataway, New Jersey, United States, 2 Physics, Rutgers, Piscataway, New Jersey, United States

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2006-11-30   Show All Abstracts

Symposium Organizers

Vladimir Matias Los Alamos National Laboratory
Robert Hammond Stanford University
Guus Rijnders University of Twente
Darrell Schlom The Pennsylvania State University
U8: Optical
Session Chairs
Gertjan Koster
Thursday AM, November 30, 2006
Room 300 (Hynes)

10:00 AM - **U8.1
In situ Infrared Absorption Spectroscopy for Thin Film Growth by Atomic Layer Deposition.

Yves Chabal 1
1 Laboratory for Surface Modification, Rutgers University, Piscataway, New Jersey, United States

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10:30 AM - U8.2
Using Multi Scale Modelling as a Characterization Tool to Complete Experimental Data.

Anne Hemeryck 1 , Alain Esteve 1 , Nicolas Richard 3 , Mehdi Djafari Rouhani 1 , Andrew Mayne 2 , Yves Chabal 4 , Gerald Dujardin 2 , Genevieve Comtet 2
1 Laboratoire d’Analyse et d’Architecture des Systèmes, CNRS, Toulouse France, 3 , CEA-DIF, Bruyères-le-Châtel France, 2 Laboratoire de PhotoPhysique Moléculaire, CNRS, Orsay France, 4 Laboratory for Surface Modification, Rutgers University, Piscataway, New Jersey, United States

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10:45 AM - U8.3
Nano-scale Imaging with Table-top Extreme Ultraviolet Lasers.

Carmen Menoni 1 , Georgyi Vaschenko 1 , Fernando Brizuela 1 , Courtney Brewer 1 , Yong Wang 1 , Miguel Larotonda 1 , Bradley Luther 1 , Mario Marconi 1 , Jorge Rocca 1 , Weilun Chao 2 , Alexander Liddle 2 , Erik Anderson 2 , David Attwood 2 3 , Alexander Vinogradov 4 , Igor Artioukov 4 , Yuri Pershyn 5 , Victor Kondratenko 5
1 Electrical and Computer Engineering, Colorado State University, Fort Collins, Colorado, United States, 2 Center for X Ray Optics, Lawrence Berkeley National Lab, Berkeley, California, United States, 3 Electrical Engineering and Computer Sciences, University of California Berkeley, Berkeley, California, United States, 4 , P.N. Lebedev Physical Institute, Moscow Russian Federation, 5 , KhPI National Technical University, Kiev Russian Federation

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11:00 AM -
BREAK

11:30 AM - **U8.4
What Is The Temperature At The Surface Of A Growing Thin Film?

Gertjan Koster 1
1 GLAM, Stanford University, Stanford, California, United States

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12:00 PM - U8.5
Subplantation and Enhanced Oxygen Incorporation During Bias-Assisted Low-Pressure Plasma Deposition of Oxides at the RF-Biased Electrode.

Aram Amassian 1 2 , Patrick Desjardins 2 , Ludvik Martinu 2
1 Materials Science and Engineering, Cornell University, Ithaca, New York, United States, 2 Regroupement québécois sur les matériaux de pointe and Engineering Physics Department, École Polytechnique de Montréal, Montréal, Quebec, Canada

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12:15 PM - U8.6
In Situ Characterization of Gas-Phase Processes During Hafnium Oxide Atomic Layer Deposition.

James Maslar 1 , Wilbur Hurst 1 , Donald Burgess 1 , William Kimes 1 , Nhan Nguyen 1 , Elizabeth Moore 1
1 , NIST, Gaithersburg, Maryland, United States

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12:30 PM - U8.7
In situ Defect Spectroscopy: Probing Dangling Bonds During a-Si:H Film Growth by Subgap Absorption.

Richard van de Sanden 1 , Igor Aarts 1 , Andrew Pipino 1 , Erwin Kessels 1
1 Applied Physics, Eindhoven University of Technology, Eindhoven Netherlands

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