Abstract submission ended June 15. Authors will be notified of their status in September.

Symposium TC01—Multifunctional and Multifrequency Scanning Probe Microscopy

Scanning Probe Microscopy (SPM) is one of the most powerful tools used in nanotechnology. It is playing a major role in advancing our understanding of material properties with implications in different research fields, from materials science and electronics to biotechnology and life science. The number and sophistication of the SPM methods has increased sharply by combining SPM with other characterization methods; by the development of specialized cantilever probes; by improving the theoretical models; by the use of faster and more powerful control systems; and through the implementation of multifrequency detection approaches that allow multiple types of measurements to be performed in a single-pass scan. The various techniques are applicable in a variety of environmental conditions –liquid, gas, low-pressure or vacuum– thus offering unprecedented capabilities for the development and characterization of new materials. Remarkably, those methods enable us to control chemical reactions and other nanoscale processes in their natural environment. Advanced Scanning Probe methods are expected to sustain our understanding of material properties at the atomic, molecular and nanoscale levels, with implications in energy storage, sustainability, medicine and communications.

The objective of this symposium is to bring together leading international probe microscopists who are conducting their research at the forefront of their respective disciplines, in order to discuss the application of novel techniques to existing and emerging problems in materials science, as well as to critically evaluate future steps and possibilities to improve SPM techniques.

Based on the extremely successful SPM-based symposia at previous MRS meetings, strong international and interdisciplinary participation is expected from academia, government and industry (including equipment manufacturers and industrial researchers), and from multiple research fields –materials science, engineering, condensed matter physics and biophysics– as well as from students engaged in SPM-related research or in the development of SPM itself.

Topics will include:

  • Energy systems
  • Electronic systems
  • 2-Dimensional materials
  • Polymers and other organic systems
  • Medicine, biophysics, biosensors and drug design
  • Novel SPM methods: multifrequency methods, high-speed imaging, optically-enhanced techniques, transport-based characterization
  • Probe-sample junction mechanics, transport and other interactions (magnetic, electric, electromagnetic, thermal)
  • Nanoscale chemical identification
  • Big data in SPM characterization
  • Nanomechanical spectroscopy and quantification of intrinsic material properties
  • Theory of SPM methods
  • A tutorial complementing this symposium is tentatively planned.

Invited Speakers:

  • Nina Balke (Oak Ridge National Laboratory, USA)
  • Hanna Cho (Ohio State University, USA)
  • Takeshi Fukuma (University of Kanazawa, Japan)
  • Franz Giessibl (University of Regensburg, Germany)
  • David Ginger (University of Washington, USA)
  • Gabriel Gomila (Institute for Bioengineering of Catalonia, Spain)
  • Rainer Hillenbrand (CIC NanoGUNE Nanoscience Cooperative Research Center, Spain)
  • Angelika Kuehnle (University of Mainz, Germany)
  • Elisa Riedo (The City College of New York, USA)

Symposium Organizers

Santiago Solares
The George Washington University
Mechanical and Aerospace Engineering
202-994-0372, ssolares@gwu.edu

Laura Fumagalli
University of Manchester
School of Physics and Astronomy
United Kingdom

Ricardo Garcia
Instituto de Ciencia de Materiales de Madrid
34-91-334-90-68, r.garcia@csic.es

Jason Killgore
National Institute of Standards and Technology Boulder
Nanoscale Reliability Division