Monday, July 11 | 6:30 p.m.
Conclude the day with a drink and an evening full of in-situ metrology highlights. In addition, LayTec will disclose several new product developments.
Daniel Koleske, Sandia National Laboratories
In-situ reflectance and correlation to AlN quality on sapphire
Gary S. Tompa, Structured Materials Industries Inc.
Interfacing LayTec’s EpiTT to SMI Oxide and Nitride SpinCVD™ Systems
For more information, contact firstname.lastname@example.org.