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LayTec’s 21st In-situ Seminar

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Monday, July 11 | 6:30 p.m.
Nautilus  

Conclude the day with a drink and an evening full of in-situ metrology highlights. In addition, LayTec will disclose several new product developments.

Invited Speakers

Daniel Koleske, Sandia National Laboratories
In-situ reflectance and correlation to AlN quality on sapphire

Gary S. Tompa, Structured Materials Industries Inc.
Interfacing LayTec’s EpiTT to SMI Oxide and Nitride SpinCVD™ Systems  

For more information, contact info@laytec.de.

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