Tye T. Gribb
DTE Research & Design LLC
Thomas F. Kelly
Cameca Instruments, Inc.
David J. Larson
Cameca Instruments, Inc.
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“For the highly successful conception,
design, fabrication, and commercialization
of an ergonomic three-dimensional
local-electrode atom probe (LEAP)
tomograph that enables the determination
of the local composition information, on an
atom-by-atom basis, of metallic,
semiconducting, ceramic and organic
materials, on a subnanometer scale, in
direct space, with high mass resolving
power and signal-to-noise ratio, permitting
the determination of small concentrations of all elements.”
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Warren C. Oliver
Agilent Technologies
George M. Pharr
Oak Ridge National Laboratory
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"For seminal contributions to the
development of the instrumentation
and analysis methods of nanoindentation
for characterizing the mechanical
properties of materials at the micro‐ and nanometer-length scales. Their work on nanoindentation has profoundly impacted
all fields of materials research where mechanical behavior is important.”
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