2011 Innovation in Materials Characterization Award
Thursday, April 28, 5:15 pm
Marriott Marquis, Golden Gate A/B
Talk Presentation:The Second Revolution in Atom Probe Tomography by Jules Verne
This award honors an outstanding advance in materials characterization that notably increases knowledge of the structure, composition, in situ behavior under outside stimulus, electronic behavior, or other characterization feature, of materials. The impact of the advance on materials research is the primary consideration in making this award, which is not limited to the method of characterization or the class of materials observed.
The 2011 IMC Award will be presented to Tye T. Gribb, (DTE Research & Design LLC), Thomas F. Kelly, and David J. Larson (Cameca Instruments, Inc.) “for the highly successful conception, design, fabrication, and commercialization of an ergonomic three-dimensional local-electrode atom probe (LEAP) tomograph that enables the determination of the local composition information, on an atom-by-atom basis, of metallic, semiconducting, ceramic and organic materials, on a subnanometer scale, in direct space, with high mass resolving power and signal-to-noise ratio, permitting the determination of small concentrations of all elements.”
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(Left to right) Thomas F. Kelly, Tye T. Gribb, David J. Larson |
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