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NN: Advanced Microscopy and Spectroscopy Techniques for Imaging Materials with High Spatial Resolution

NN: Advanced Microscopy and Spectroscopy Techniques for Imaging Materials with High Spatial Resolution Image

November 30 - December 3, 2009
Chairs
Manfred Ruehle     Max-Planck-Institute for Metals Research
Larry Allard     Oak Ridge National Laboratory
Joanne Etheridge     Monash University
David Seidman     Northwestern University

Symposium Support
CAMECA
Carl Zeiss SMT AG
CEOS GmbH
FEI Co
Hitachi High Technologies America Inc
Imago Scientific Instruments Corporation
JEOL USA Inc
Oak Ridge National Laboratory


* Invited paper

SESSION NN1: Overviews and Techniques
Chair: Manfred Ruehle
Monday Morning, November 30, 2009
Room 204 (Hynes)

8:30 AM *NN1.1
Correlating Atomic and Nanoscale 3D Structure and Chemistry by Aberration Corrected STEM, Electron Tomography and Atom Probe Tomography. Matthew Weyland1,2, Xiang-Yuan Xiong1,2, Jasmine Shih2,3 and Barry C. Muddle3; 1Monash Centre for Electron Microscopy, Monash University, Clayton, Victoria, Australia; 2Materials Engineering, Monash University, Clayton, Victoria, Australia; 3ARC Centre of Excellence of Design in Light Metals, Monash University, Clayton, Victoria, Australia.

9:00 AM *NN1.2
High-Precision Atomic Resolution Measurements by Aberration-Corrected Transmission Electron Microscopy. Knut W. Urban, Solid State Research, Research Center Juelich, Juelich, Germany.

9:30 AM *NN1.3
On the Many Advances in Laser Pulsing of Atom Probe Tomographs. Thomas Kelly, Imago Scientific Instruments Corporation, Madison, Wisconsin.

10:00 AM BREAK

10:30 AM NN1.4
Quantitative Scanning Transmission Electron Microscopy. James M. LeBeau1, Scott D. Findlay2, Xiqu Wang3, Allan J. Jacobson3, Leslie J. Allen4 and Susanne Stemmer1; 1Materials Department, University of California, Santa Barbara, California; 2Institute of Engineering Innovation, The University of Tokyo, Tokyo, 113-8656, Japan; 3Department of Chemistry, University of Houston, Houston, Texas; 4School of Physics, University of Melbourne, Melbourne, Victoria, Australia.

10:45 AM NN1.5
Imaging the Real Space Intensity Distribution of a Sub-Ångström Electron Probe after Scattering by a Crystal. Sorin Lazar1,2, Gianluigi A. Botton2 and Joanne Etheridge3; 1FEI Electron Optics, 5600 KA Eindhoven, Netherlands; 2Canadian Centre for Electron Microscopy, Dept of Materials Science and Engineering, Brockhouse Institute for Materials Research, McMaster University, Hamilton, L8S 4M1, Ontario, Canada; 3Monash Centre for Electron Microscopy and Dept of Materials Engineering, Monash University, 3800, Victoria, Australia.

11:00 AM NN1.6
Theoretical Analysis and Applications of Annular Bright Field Scanning Transmission Electron Microscopy Imaging. Scott D. Findlay1, Naoya Shibata1,2, Hidetaka Sawada3, Eiji Okunishi3, Yukihito Kondo3, Takahisa Yamamoto1,4 and Yuichi Ikuhara1,4,5; 1The University of Tokyo, Tokyo, Japan; 2PRESTO, Japan Science and Technology Agency, Saitama, Japan; 3JEOL Ltd., Tokyo, Japan; 4Japan Fine Ceramic Center, Nagoya, Japan; 5Tohoku University, Sendai, Japan.

11:15 AM NN1.7
Atomic Size Mismatch Strain Induced Reversed ADF-STEM Image Contrast Between Semiconductor Hetero-epitaxial Layers and Substrates. Xiaohua Wu, Jean-Marc Baribeau and James A. Gupta; Institute for Microstructural Sciences, National Research Council Canada, Ottawa, Ontario, Canada.

11:30 AM NN1.8
Crystallographic Analysis of a Precipitate Phase in Ni30Pt20Ti50 Shape Memory Alloys. Libor Kovarik1, Fan Yang1, Anita Garg2, Ronald Noebe2, David Diercks3, Michael Kaufman4 and Michael Mills1; 1The Ohio State University, Columbus, Ohio; 2NASA Glenn Research Center, Cleveland, Ohio; 3University of North Texas, Denton, Texas; 4Colorado School of Mines, Golden, Colorado.

11:45 AM NN1.9
Combined TEM and APT Characterization of Nano-structured Ferritic Alloys. James Bentley, M. K. Miller and D. T. Hoelzer; Materials Science & Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee.

SESSION NN2: Instrumentation
Chair: David Seidman
Monday Afternoon, November 30, 2009
Room 204 (Hynes)

1:30 PM *NN2.1
A Review of the TEAM Project at its Transition from the Development Phase to a Research Facility. Ulrich Dahmen, National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, California.

2:00 PM *NN2.2
Hitachi HD2700, a Dedicated High Spatial Resolution STEM for Materials Research. Yimei Zhu1, Hiromi Inada2,1, Lijun Wu1, Dong Su1 and Joe Wall1; 1Brookhaven National Laboratory, Upton, New York; 2Hitachi High Technologies Corp.,, Ibaraki, Japan.

2:30 PM *NN2.3
State-of-the-Art Atom Probe Tomography. Michael K. Miller and Kaye Russell; MSTD, Oak Ridge National Laboratory, Oak Ridge, Tennessee.

3:00 PM BREAK

3:30 PM NN2.4
Benefits of Cc-Corrected Imaging for High-Resolution and Energy-Filtered TEM. Bernd Kabius1, Peter Hartel2, Maximilian Haider2, Heiko Mueller2, Stephan Uhlemann2, Ulrich Loebau2, Joachim Zach2, Goetz Hofhaus1, Irene Wacker4 and Rasmus R. Schroeder3; 1Material Science Division, Argonne National Laboratory, Argonne, Illinois; 2CEOS GmbH, Heidelberg, Germany; 3CellNetworks, Heidelberg University, INF 267, Heidelberg, Germany; 4Forschungszentrum Karlsruhe, Eggenstein-Leopoldshafen, Germany.

3:45 PM NN2.5
Using Imaging Cs-Correctors to Optimize Image Contrast: What are The Best Settings for, e.g., Graphene at 80kV and Why? Edgar Voelkl1, Young-Chung C. Wang1, Bin Jiang1, Lianfeng Fu1, Jan Ringnalda1, Feng Shen1 and Dong Tang2; 1FEI Company, Hillsboro, Oregon; 2FEI Company, Einhoven, Netherlands.

4:00 PM NN2.6
Development of Multi-functional Analytical Environmental TEM and its Application. Toshie Yaguchi, Akira Watabe, Yasuhira Nagakubo, Takafumi Yotsuji, Kazutoshi Kaji and Takeo Kamino; Hitachi High-Technologies Corporation, Hitachinaka-shi, Japan.

4:15 PM NN2.7
Correlative STEM at the Atomic Scale: The Ultimate Materials Analysis Tool. David C. Bell1,4, Stephan Irsen2, Richard Schillinger3 and Stefan Meyer3; 1School of Enginnering and Applied Sciences, Harvard University, Cambridge, Massachusetts; 2Forschungszentrum Caesar, Bonn, Germany; 3Carl Zeiss NTS GmbH, Carl Zeiss SMT, Oberkochen, Germany; 4Center for Nanoscale Systems, Harvard University, Cambridge, Massachusetts.

4:30 PM NN2.8
On the Relation between Probe Size and Image Resolution in the Helium Ion Microscope. Larry Scipioni, Carl Zeiss SMT, Inc., Peabody, Massachusetts.

4:45 PM NN2.9
Laser-assisted Atom Probe Analysis of Bulk Ceramics. Tadakatsu Ohkubo1, Yimeng Chen2, Masaya Kodzuka2, Koji Morita1 and Kazuhiro Hono1,2; 1National Institute for Materials Science, Tsukuba, Japan; 2Graduate School of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Japan.

SESSION NN3: Poster Session
Chairs: Manfred Ruehle and Winfried Sigle
Monday Evening, November 30, 2009
8:00 PM
Exhibit Hall D (Hynes)


NN3.1
The Advantages and Limitations of FIB-Based Specimen Preparation for Atom Probe Tomography. Kaye F. Russell and Michael K. Miller; MSTD, Oak Ridge National Laboratory, Oak Ridge, Tennessee.

NN3.2
Raman Imaging - New Tool for Materials Characterization. Sergey Mamedov, Eunah Lee, Fran Adar and Andrew Whitley; Horiba Jobin Yvon Inc., Edison, New Jersey.

NN3.3
Difference Raman for Enhancing Image Resolution By Accurate Tip Positioning of An Atomic Force Probe That Enhances or Shadows The Raman Signal. Rimma Dekhter1, Hesham Taha1, Avraham Israel1, David Lewis1 and Aaron Lewis2; 1Nanonics Imaging Ltd., Jerusalem, Israel; 2Hebrew University of Jerusalem, Jerusalem, Israel.

NN3.4
Real Time, Digital Reciprocal Space X-ray Topographic Characterization of Substrate and Epitaxial Structures of Electronic and Related II-VI, III-V Type Materials. Ravi Ananth, Metallyrgy & Materials Engineering, Deeco Metals, Irvington, New Jersey.

NN3.5
An Introduction to Backcatter Spectroscopy with the Helium Ion Microscope. Sybren Sijbrandij, Chuong Huynh, John Notte and Larry Scipioni; ALIS Business Unit, Carl Zeiss SMT Inc., Peabody, Massachusetts.

NN3.6
Imaging and Analysis of Biologically Induced Fe Phosphate Precipitates in Porous Silica. James P. McKinley, Tetyana Peretyazhko, John M. Zachara, Satyanarayana V. Kuchibhatla and Donald R. Baer; Pacific Northwest National Laboratory, Richland, Washington.

NN3.7
Visualization of Actives Delivery to Stratum Corneum using Confocal Raman Microscopy. Laurence Senak, Materials Science, ISP, Wayne, New Jersey.

NN3.8
Electron Holographic and HREM Characterization of Au/SrTiO3 Nano-hetero Catalysts. Satoshi Ichikawa1, Seiji Takeda2, Tomoki Akita3, Koji Tanaka3 and Masanori Kohyama3; 1Institute for NanoScience Design, Osaka University, Toyonaka, Osaka, Japan; 2Department of Physics, Graduate School of Science, Osaka University, Toyonaka, Osaka, Japan; 3Research Institute for Ubiquitous Energy Devices, National Institute of Advanced Industrial Science and Technology (AIST), Ikeda, Osaka, Japan.

NN3.9
Multi-scale Characterization of Nd-Fe-B Permanent Magnets. Tadakatsu Ohkubo, Wanfeng Li, Hossein Sepehri-Amin and Kazuhiro Hono; Magnetic Materials Center, National Institute for Materials Science, Tsukuba, Japan.

NN3.10
Strain Relaxation in Planar InAs Epitaxial Layers Studied by High-Resolution Transmission Electron Microscopy. Krishnamurthy Mahalingam, Kurt G. Eyink, Marlon Twyman, Jodi Shoaf and Larry Grazulis; Air Force Research Laboratory, Wright-Patterson AFB, Ohio.

NN3.11
Transmission Electron Microscopy Observation on Hydrothermally-treated Aluminum Film in Ultrapure Water. Yusuke Hosoki1, Junichi Shimanuki2, Zhiyoug Qiu1 and Takashi Ishiguro1; 1Materials Science and Technology, Tokyo Univercity of Science, Noda Chiba, Japan; 2NISSAN ARC, Co. Ltd., Yokosuka Kanagawa, Japan.

NN3.12
Aberration-Corrected HRTEM Analysis of Transition Structure in Phase Boundary of ZrO2 Ultra-Thin Film. Takanori Kiguchi1,2, Toyohiko J. Konno1,2, Naoki Wakiya3 and Kazuo Shinozaki4; 1Institute for Materials Research, Tohoku University, Sendai, Miyagi, Japan; 2Center for Integrated NanoTechnology Support, Tohoku University, Sendai, Miyagi, Japan; 3Department of Materials Science and Chemical Engineering, Shizuoka University, Hamamatsu, Shizuoka, Japan; 4Department of Metallurgy and Ceramics Science, Tokyo Institute of Technology, Meguro, Tokyo, Japan.

NN3.13
On Texture and Grain Size Evolution in Electrodeposition. Patrick R. Cantwell1,2, Matthew M. Schneider1,2 and Eric A. Stach1,2; 1Materials Engineering, Purdue University, West Lafayette, Indiana; 2Birck Nanotechnology Center, Purdue University, West Lafayette, Indiana.

NN3.14
Informatics for Quantitative Analysis of Atom Probe Tomography Images.  Krishna Rajan; Materials Science and Engineering, Iowa State University, Ames, Iowa.

SESSION NN4: Quantitative Imaging and Spectroscopy
Chair: Larry Allard
Tuesday Morning, December 1, 2009
Room 204 (Hynes)

8:30 AM *NN4.1
Quantitative Imaging and Spectroscopy of Light Atoms by Aberration-corrected STEM. Stephen Pennycook1,2, Matthew Chisholm1, Maria Varela1, Juan-Carlos Idrobo1,2, Mark Oxley1,2, Valeria Nicolosi3, Matthew Murfitt4, Zoltan Szilagyi4, Niklas Dellby4 and Ondrej Krivanek4; 1Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee; 2Department of Physics and Astronomy, Vanderbilt University, Nashville, Tennessee; 3Department of Materials, University of Oxford, Oxford, United Kingdom; 4Nion Co., Kirkland, Washington.

9:00 AM *NN4.2
Quantitative Imaging of Nanostructures in 2D and 3D. Gustaaf Van Tendeloo, Sara Bals, Sandra Van Aert and Jo Verbeeck; University of Antwerp, Antwerp, Belgium.

9:30 AM NN4.3
Probing the Chemistry and Bonding in Materials at the Atomic Scale. Sorin Lazar1,2, Martin Couillard2, Lina Gunawan2, Yang Shao2 and Gianluigi A. Botton2; 1FEI Electron Optics, 5600 KA Eindhoven, Netherlands; 2Canadian Centre for Electron Microscopy, Materials Science and Engineering, BIMR, McMaster University, Hamilton, Ontario, Canada.

9:45 AM NN4.4
Structure and Chemistry of Intergranular Films at Metal-Ceramic Interfaces. Mor Baram and Wayne D. Kaplan; Materials Engineering, Technion - Israel Institute of Technology, Haifa, Israel.

10:00 AM BREAK

10:30 AM NN4.5
Quantitative High Resolution Electron Microscopy Investigation of the SrTiO3 Σ3(112) Grain Boundary. Karleen J. Dudeck1, Nicole A. Benedek2, Mike W. Finnis2 and David Cockayne1; 1Department of Materials, University of Oxford, Oxford, United Kingdom; 2Department of Materials, Imperial College London, London, United Kingdom.

10:45 AM NN4.6
An Atomistic Reconstruction of the Nanostructure of Pyrolitic Carbons Guided by HRTEM Data. Jean-Marc Leyssale1, Patrick Weisbecker1, Raphael Vitti2, Jean-Pierre Da Costa2, Christian Germain2 and Gerard Vignoles3; 1Laboratoire des Composites ThermoStructuraux - UMR 5801, CNRS, Pessac, France; 2Laboratoire IMS - UMR 5218, Université de Bordeaux, Bordeaux, France; 3Laboratoire des Composites ThermoStructuraux - UMR 5801, Université de Bordeaux, Bordeaux, France.

11:00 AM NN4.7
Atomic Resolution Imaging of Oxygen Positions in Perovskites. Maria Varela1, Mark Oxley2,1, Jaume Gazquez1, Weidong Luo2,1, Matthew Chisholm1, Sokrates Pantelides2,1 and Stephen Pennycook1,2; 1Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee; 2Vanderbilt University, Nashville, Tennessee.

11:15 AM NN4.8
Interfaces of Silicon Nitride Investigated with Aberration-Corrected Scanning Transmission Electron Microscopy Techniques and ab initio Methods. Weronika Walkosz1, Robert F. Klie1, Serdar Ogut1, Biljana Mikijelj2, Paul F. Becher3, Albina Y. Borisevich3, Stephen J. Pennycook3 and Juan C. Idrobo1,3,4; 1Department of Physics, University of Illinois at Chicago, Chicago, Illinois; 2Ceradyne Inc., Costa Mesa, California; 3Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee; 4Department of Physics, Vanderbilt University, Nashville, Tennessee.

11:30 AM NN4.9
High Resolution Bright-Field Tomography of Closed-Cage Structures - Closing the Gap to Atomic Resolution. Maya Bar Sadan, Lothar Houben and Knut Urban; Institute of Solid State Research, Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Research Centre Juelich GmbH, Juelich, Germany.

11:45 AM NN4.10
A Combined Approach to the Determination of As Depth Profiling in Si Ultra Shallow Junctions. Andrea Parisini1, Vittorio Morandi1, Jaap A. van den Berg2, Michael A. Reading2 and Damiano Giubertoni3; 1CNR-IMM Sezione di Bologna, Bologna, Italy; 2Institute for Materials Research, University of Salford, Salford, United Kingdom; 3Fondazione Bruno Kessler-irst, Povo-Trento, Italy.

SESSION NN5: Atomic Scale Chemical Imaging
Chair: Joanne Etheridge
Tuesday Afternoon, December 1, 2009
Room 204 (Hynes)

1:30 PM *NN5.1
Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy. David A. Muller, School of Applied and Engineering Physics, Cornell University, Ithaca, New York.

2:00 PM *NN5.2
Tomographic Atom Probe and Nanosciences. Didier Blavette1,2, Oana Cojocaru-Miredin1, Emmanuel Cadel1 and Bernard Deconihout1; 1Physics, University, St Etienne du Rouvray, France; 2Institut Universitaire de France, Paris, France.

2:30 PM NN5.3
Monolayer-resolved STEM/EEL Spectroscopy for the Atomic-scale Analysis of Interfaces and 1-Dimensional Nanostructures. Lothar Houben1, Markus Heidelmann1, Maya Bar Sadan1 and Juri Barthel2; 1Institute of Solid State Research, Research Centre Juelich, Juelich, Germany; 2Central Facility for Electron Microscopy, RWTH Aachen, Aachen, Germany.

2:45 PM NN5.4
Mechanical Alloying and Amorphization in Cu-Nb-Ag in Situ Composite Wires Studied by TEM and Atom Probe Tomography. S. Ohsaki2, Dierk Raabe1 and Kazuhiro Hono2; 1Max-Planck-Institut fuer Eisenforschung, Duesseldorf, Germany; 2National Institute for Materials Science, 1-2-1 Sengen, Tsukuba 305-0047, Japan.

3:00 PM BREAK

3:30 PM *NN5.5
X-ray Analysis in Aberration-corrected Scanning Transmission Electron Microscopes for Atomic-column X-ray Imaging. Masashi Watanabe, Dept. of Mater. Sci. & Eng., Lehigh University, Bethlehem, Pennsylvania.

4:00 PM NN5.6
Atomic-scale Distributions of Transition Metal Elements in Three-dimensions in Alloyed Nickel Monosilicide Thin Films Using Atom-probe Tomography. Praneet Adusumilli1, Conal E. Murray2, Lincoln J. Lauhon1 and David N. Seidman1; 1Materials Science and Engineering, Northwestern University, Evanston, Illinois; 2IBM T. J. Watson Research Center, Yorktown Heights, New York.

4:15 PM NN5.7
Atom Probe Tomography Study of Rhenium Clustering in Nickel Superalloys. Alessandro Mottura1, Michael K. Miller2, Mike W. Finnis1 and Roger C. Reed3; 1Department of Materials, Imperial College London, London, United Kingdom; 2Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee; 3Department of Metallurgy and Materials, The University of Birmingham, Edgbaston, Birmingham, United Kingdom.

4:30 PM NN5.8
Atomic Scale Segregation of Carbon in Auto-Tempered Martensitic Steels Studied by Atom Probe Tomography. Frederic Danoix1,3, Alain Guillet2 and Harald Leitner3; 1Groupe de Physique des Matériaux, CNRS Université de Rouen, Saint Etienne du Rouvray, France; 2Département Mécanique, INSA de Rouen, Saint Etienne du Rouvray, France; 3Christian Doppler Laboratory for Early Stages of Precipitation, Department Physical Metallurgy and Materials Testing - Montanuniversität Leoben, Leoben, Austria.

4:45 PM NN5.9
Study of High k material HfO2 by Using Laser Assisted Atom Probe Tomography. Baishakhi Mazumder1, Meenal Deo2, Vishal Thakare2, Angela Vella1, Francois Vurpillot1, Satish Ogale2 and Bernard Deconihout1; 1Groupe de Physique des Matériaux (GPM), University of Rouen, Saint Eteinne du Rouvray, France; 2Physical Chemistry Division, National Chemical Laboratory, Pune, India.

SESSION NN6: EELS for all Energy Losses
Chair: Masashi Watanabe
Wednesday Morning, December 2, 2009
Room 204 (Hynes)

8:30 AM *NN6.1
Electron Energy Loss Spectroscopy (EELS) for Plasmonic Mapping of Metallic Nanoparticles and Nanophotonic Devices. Christian Colliex, Mathieu Kociak, Odile Stephan, Stefano Mazzucco, Guillaume Boudarham and Jaysen Nelayah; Physique des Solides, CNRS Université Paris Sud 11, Orsay, France.

9:00 AM *NN6.2
Surface Plasmon Resonance Effects in Ag Nanoholes Studied by Energy-Filtering TEM. Wilfried Sigle, Jaysen Nelayah, Christoph T. Koch, Burcu Ogut, Peter A. van Aken and Lin Gu; Max Planck Institute for Metals Research, Stuttgart, Germany.

9:30 AM NN6.3
Measurement of Signal Delocalization in Atomic Scale Electron Energy Loss Spectroscopy. Amish B. Shah1,2, Quentin M. Ramasse3, Xiaofang Zhai2,4, Jian-Guo Wen2, Steven J. May5, Anand Bhattacharya5,6, James N. Eckstein2,4 and Jian-Min Zuo1,2; 1Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois; 2Fredrick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois; 3National Center for Electron Microscopy, Lawrence-Berkeley National Laboratory, Berkeley, California; 4Physics, University of Illinois at Urbana-Champaign, Urbana, Illinois; 5Materials Science Division, Argonne National Laboratory, Argonne, Illinois; 6Center for Nanoscale Materials, Argonne National Laboratory, Argonne, Illinois.

9:45 AM NN6.4
An Atom-Probe Tomographic and First-Principles Study of the Interplay between Tungsten and Tantalum Atoms in Ni-based Superalloys. Yaron Amouyal, Zugang Mao, Christopher Booth-Morrison and David N. Seidman; Materials Science and Engineering, Northwestern University, Evanston, Illinois.

10:00 AM BREAK

10:30 AM NN6.5
Characterisation of Samarium Doped Ceria Multilayer Thin Films for Fuel Cell Applications. James M. Perkins1, Stuart N. Cook1, Srinivasan Rajagopalan5, Sarah Fearn1, Richard J H. Morris4, Chris M. Rouleau2, Geoff D. West3, Hans M. Christen2, Hamish L. Fraser5, Stephen Skinner1, John A. Kilner1 and David W. McComb1; 1Materials, Imperial College London, London, United Kingdom; 2Center for Nanophase Materials Sciences, ORNL, Oak Ridge, Tennessee; 3Loughborough University, Loughborough, United Kingdom; 4University of Warwick, Coventry, United Kingdom; 5Materials Science and Engineering, Ohio State University, Columbus, Ohio.

10:45 AM NN6.6
EELS Study of Optical Properties of Noble-metal Nanostructures and Their Assemblies. Shaul Aloni, Molecular foundry, LBNL, Berkeley, California.

11:00 AM NN6.7
A New Method for the Imaging of Surface Plasmons Using Phase Shifts in the Transmission Electron Microscope. Vicki J. Keast1, Michael J. Gladys1, Tim C. Petersen2, Gerald Kothleitner3 and Christian Dwyer4; 1School of Mathematical and Physical Sciences, The University of Newcastle, Newcastle, New South Wales, Australia; 2Electron Microscope Unit, The University of Sydney, Sydney, New South Wales, Australia; 3Institute for Electron Microscopy, Graz University of Technology, Graz, Austria; 4Monash Centre for Electron Microscopy, Monash University, Melbourne, Victoria, Australia.

11:15 AM NN6.8
Nd Distribution in Nd-doped Polycrystalline YAG. Xin Li1, Juan Idrobo2, Steve Pennycook2, Adam Stevenson1, Gary Messing1 and Beth Dickey1; 1Materials Science and Engineering, Pennsylvania State University, University Park, Pennsylvania; 2Materials Science and Technology Division, Oak Ridge Nantional Lab, Oak Ridge, Tennessee.

11:30 AM NN6.9
Atomic Level Analysis of Amino Acids by the Scanning Atom Probe. Osamu Nishikawa1, Masahiro Taniguchi1 and Atsushi Ikai2; 1Kanazawa Institute of Technology, Nonoichi, Japan; 2Tokyo Insitute of Technology, Yokohama, Japan.

11:45 AM NN6.10
Imaging Buried Organic-Inorganic Interfaces in Biominerals. Lyle Gordon and Derk Joester; Materials Science and Engineering, Northwestern University, Evanston, Illinois.

SESSION NN7: Structure and Microstructure
Chair: Michael Miller
Wednesday Afternoon, December 2, 2009
Room 204 (Hynes)

1:30 PM *NN7.1
Evolution of Alloy Microstructures at the Atomic Scale. Emanuelle Marquis, Department of Materials, Oxford University, Oxford, United Kingdom.

2:00 PM *NN7.2
Ultra-high-vacuum Cs Corrected Scanning Transmission Electron Microscopy (STEM) and the Measurement of Small Lattice Displacement by STEM. Kazuo Furuya, National Institute for Materials Science (NIMS), Tsukuba, Ibaraki, Japan.

2:30 PM NN7.3
Influence of Analysis Parameters on the Microstructural Characterization of Nanoscale Precipitates. Ai Serizawa and Michael K. Miller; Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee.

2:45 PM NN7.4
Hierarchical Nanostructures and Nanoscale Texture Measurements of Ultra-high Strength Aluminium Alloys. Peter Liddicoat and S. P. Ringer; Australian Key Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, New South Wales, Australia.

3:00 PM BREAK

3:30 PM NN7.5
Interface Atomic Structure of SiC/Ti3SiC2 by STEM and First Principles. Wang Zhongchang1, Saito Mitsuhiro1, Tsukimoto Susumu1 and Ikuhara Yuichi1,2; 1WPI Research Center, Advanced Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan; 2Institute of Engineering Innovation, University of Tokyo, Tokyo 113-8656, Japan.

3:45 PM NN7.6
Properties of Multiferroic Interfaces from Atomic Displacements by STEM. Hye Jung Chang1, A. Y. Borisevich1, S. V. Kalinin2, O. S. Ovchinnikov2, R. Ramesh3, M. Huijben4 and S. J. Pennycook1; 1Materials Science Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee; 2Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, Tennessee; 3Department of Physics, University of California, Berkeley, California; 4Science & Technology, University of Twente, Enschede, Netherlands.

4:00 PM NN7.7
EELS/STEM Investigation of Electronic Structure in Conducting LaAlO3/SrTiO3 and LaGaO3/SrTiO3 Epitaxial Heterojunctions. Claudia Cantoni1, Jaume Gazquez1, Maria Varela1, Paolo Perna2,5, Davide Maccariello2, Umberto Scotti di Uccio2, Fabio Miletto Granozio2, Daniele Marre`3, I. Pallecchi3, M. Codda3, Stefano Gariglio4, Andrea Caviglia4, Nicolas Reyren4 and Jean Marc Triscone4; 1Materials Science & Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee; 2CNR-INFM Coherentia and Dipartimento di Scienze Fisiche, Federico II University, Naples, Italy; 3LAMIA CNR-INFM and Dipartimento di Scienze Fisiche, University of Genoa, Genoa, Italy; 4Condensed Matter Physics Department, DPMC, University of Geneva, Geneva, Switzerland; 5IMDEA Nanociencia Campus, Universidad Autónoma de Madrid, Madrid, Spain.

4:15 PM NN7.8
Crystallite Size Analysis by Two-Dimensional XRD. Bob B. He, Bruker AXS, Madison, Wisconsin.

4:30 PM NN7.9
Quantitative Chemical Mapping of Engineered Interfaces in Quaternary III-V Semiconductor Heterostructures using Exit-Wave Retrieval High-Resolution Transmission Electron Microscopy. Krishnamurthy Mahalingam, Heather Haugan, Gail J. Brown and Kurt G. Eyink; Air Force Research Laboratory, Wright-Patterson AFB, Ohio.

4:45 PM NN7.10
Polycrystalline Oxide Formation during Oxidation of (001) CuxNi1-x Binary Alloys Studied by In situ UHV-TEM. Zhuoqun Li, Katherine D. Rodgers and Judith C. Yang; Mechanical Engineering and Materials Science, University of Pittsburgh, Pittsburgh, Pennsylvania.

SESSION NN8: Segregation and Tomography
Chair: David McComb
Thursday Morning, December 3, 2009
Room 204 (Hynes)

8:30 AM *NN8.1
Cs Corrected STEM Characterization of Atomic Structures and Segregation Atoms of Ceramic Interfaces. Yuichi Ikuhara1,2,3, Scott D. Findaly1, Naoya Shibata1, Teruyasu Mizoguchi1 and Takahisa Yamamoto1,2; 1Institute of Engineering Innovation, The University of Tokyo, Tokyo, Japan; 2Nanostructures Research Laboratory, Japan Fine Ceramic Center, Nagoya, Japan; 3WPI Advanced Institute for Materials Research, Tohoku University, Sendai, Japan.

9:00 AM *NN8.2
Investigations of the Chemistry of Interfaces with Nanometer Resolution. Krystyna Stiller, Mattias Thuvander, Marie Sonestedt and Jonathan Weidow; Applied Physics, Göteborg, Sweden.

9:30 AM NN8.3
Investigation of Organic Multilayers using Aberration-corrected HRTEM. Soumaya Mauthoor, Salahud Din, David W. McComb and Sandrine E. M. Heutz; Department of Materials and London Centre for Nanotechnology, Imperial College London, London, United Kingdom.

9:45 AM NN8.4
Trapping of Au Atoms at Twin Defects in Si Nanowires Characterized Using Advanced Electron Microscopy Techniques. Eric Hemesath, Sujing Xie, Jinsong Wu, Vinayak Dravid and Lincoln J. Lauhon; Materials Science & Engineering, Northwestern University, Evanston, Illinois.

10:00 AM BREAK

10:30 AM *NN8.5
Atomistic Structure of Confined Solid-Liquid Interfaces. Wayne D. Kaplan, Department of Materials Engineering, Technion - Israel Institute of Technology, Haifa, Israel.

11:00 AM NN8.6
Interfacial Segregation of Tungsten in Ni-Based Superalloys: An Atom-Probe Tomographic, Transmission Electron Microscopy, and First-Principles Study. Yaron Amouyal, Zugang Mao and David N. Seidman; Materials Science and Engineering, Northwestern University, Evanston, Illinois.

11:15 AM NN8.7
Aberration-corrected Electron Microscopy of the Nanostructural Evolution During Emission from CsI Coated Carbon Fiber Cathodes. Lawrence Drummy1, Richard A. Vaia1 and Don Shiffler2; 1Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright Patterson AFB, Ohio; 2Directed Energy Directorate, Air Force Research Laboratory, Kirtland AFB, New Mexico.

11:30 AM NN8.8
Advanced Transmission Electron Microscopy Study of Cadmium Sulfide-Copper Sulfide Heterostructured Nanorods. Haimei Zheng1,2,3, Bryce Sadtler3, Paul Alivisatos2,3 and Christian Kisielowski1,2; 1National Center for Electron Microscopy, Lawrence Berkeley National Lab, Berkeley, California; 2Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California; 3Chemistry, University of California, Berkeley, California.

11:45 AM NN8.9
A Simple Specimen Preparation Method for Investigating Nanoparticle-substrate Interactions. Maria E. Messing1,2, Michael F. H. Wolff3, Kornelius Nielsch3, L. Reine Wallenberg2 and Knut Deppert1; 1Solid State Physics, Lund University, Lund, Sweden; 2Polymer and Materials Chemistry, Lund University, Lund, Sweden; 3Applied Physics, University of Hamburg, Hamburg, Germany.

SESSION NN9: Nanomaterials and Catalysis
Thursday Afternoon, December 3, 2009
Chair: Manfred Ruhle
Room 204 (Hynes)

1:30 PM *NN9.1
High Resolution 3-D Characterization of Nanomaterials using Electron and Atom Probe Tomography. Ilke Arslan, Chemical Engineering and Materials Science, University of California, Davis, Davis, California.

2:00 PM *NN9.2
Advances in Atom Probe Tomography for Semiconductor Materials. Ludovic Renaud, Isabelle Martin, Rabah Benbalagh, Beatrice Salle and Michel Schuhmacher; CAMECA Compagny, Gennevilliers Cedex, France.

2:30 PM NN9.3
HAADF-STEM Observation of Structure Change of Au Nano-particle on CeO2. Tomoki Akita1, Shingo Tanaka1, Koji Tanaka1, Masanori Kohyama1 and Masatake Haruta2; 1National Institute of Advanced Industrial Science and Technology, Ikeda, Osaka, Japan; 2Tokyo Metropolitan University, Hachioji, Tokyo, Japan.

2:45 PM NN9.4
3D Atom Probe Analysis of Au-Nanoclusters in Single Crystal Oxide Substrates. Satyanarayana Kuchibhatla1, V. Shutthanandan1, Chongmin Wang1, Theva Thevuthasan1, Peter Clifton2, Ty Prosa2 and D. Reinhard2; 1EMSL, PNNL, Richland, Washington; 2Imago Scientific Instruments, Madison, Wisconsin.

3:00 PM BREAK

3:30 PM NN9.5
Observing the Photocatalytic Active Sites in Niobate Photocatalytic Nanosheets by Cs-corrected STEM. Miaofang Chi1, Erwin Sabio2, Frank Osterloh2 and Nigel Browning2; 1Oak Ridge National Laboratory, Knoxville, Tennessee; 2University of California, Davis, Davis, California.

3:45 PM NN9.6
Metal-oxide Interfaces at the Nanoscale. Guangwen Zhou, Department of Mechanical Engineering and Multidisciplinary Program in Materials Science and Engineering, Binghamton University, Binghamton, New York.

4:00 PM NN9.7
Aberration-Corrected Scanning Transmission Electron Microscopy of Cation Site Location and Occupancy in M1 Selective Oxidation Catalysts. Douglas Blom1, William Pyrz2, Tom Vogt1, Douglas Buttrey2, Masahiro Sadakane3, Wataru Ueda4 and Vadim Guliants5; 1NanoCenter, University of South Carolina, Columbia, South Carolina; 2Center for Catalytic Science and Technology, University of Delaware, Newark, Delaware; 3Chemistry and Chemical Engineering, Hiroshima University, Hiroshima, Japan; 4Catalysis Research Center, Hokkaido University, Sapporo, Japan; 5Chemical and Materials Engineering, University of Cincinnati, Cincinnati, Ohio.

4:15 PM NN9.8
Size Effects on the Melting Temperature of Silver Nanoparticles: In-situ TEM Observations. Michael Asoro1, John Damiano2 and Paulo Ferreira1; 1Materials Science and Engineering, University of Texas at Austin, Austin, Texas; 2Protochips Inc., Raleigh, North Carolina.

4:30 PM NN9.9
Electron Microscopy Characterization of Novel Surface Layer in Polycrystalline Y2O3 Formed at High Pressure and Temperature Conditions. Jafar F. Al-Sharab1, Stuart Deutsch1, Stephen D. Tse2 and Bernard H. Kear1; 1Materials Science and Engineering, Rutgers University, Piscataway, New Jersey; 2Mechanical & Aerospace Engineering, Rutgers University, Piscataway, New Jersey.

4:45 PM NN9.10
The Origin of the Anomalous Interatomic Distances in Suspended Gold Atomic Chains Revisited. Pedro A. Autreto1, Maureen J. Lagos1,2, Fernando Sato3, Varlei Rodrigues1, Daniel Ugarte1 and Douglas S. Galvao1; 1Applied Physics, State University of Campinas, Campinas, São Paulo, Brazil; 2Brazilian Synchrotron Light Laboratory, Campinas, São Paulo, Brazil; 3Physics, Federal University of Juiz de Fora, Juiz de Fora, Minas Gerais, Brazil.



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