Resource Center
Send Us Your FeedbackX-Ray Scattering Methods for Characterization of Advanced Materials Workshop
December 4, 2009
Sheraton Hotel | Boston, MA
View Program
Advanced registration for this workshop is now closed. Register on-site at the Hynes Convention Center or on Friday at the Sheraton Liberty Ballroom.
Workshop attendees can pick up their name badges beginning Friday, December 4 at 7:00 AM outside the Liberty Ballroom, Sheraton Hotel, Level 2.
The aim of this workshop is to give the attendees valuable tools to help unravel the structural and micro or nanostructural parameters of samples and/or devices. These techniques will help in the design of advanced materials or devices and/or in the quality control process. The workshop will start with a brief history of the x-ray scattering methods and their classical application. Then the leading experts on each x-ray scattering method will give a practical tutorial on each of the methods discussed here, starting from the basic principles and including practical examples. Case studies of materials characterization in various fields will be used to present the x-ray based analytical methods employed, including but not limited to: the phase identification, quantification, crystallographic structure, crystallite size and distribution, defect types, defect density, texture, residual stress, layer thickness, interface roughness, composition, relaxation, mosaicity, phase transitions and kinetics as a function of non-ambient conditions, local structure in nano-materials, particle size distribution etc. Examples will range from powder diffraction analysis to thin film characterization and high-resolution reciprocal space mapping. Tips and tricks on how to collect and interpret the data will also be discussed. In addition, x-ray scattering methods will be compared to other complementary techniques.
The workshop will conclude with a field trip to tour PANalytical’s Applications Laboratory where you can see the latest developments in x-ray diffraction laboratory systems. Roundtrip transportation and refreshments will be provided.
Who should attend?
Academics, industrial laboratory staff, engineers, researchers, scientists, educators and leading professionals in the field of high-k dielectrics, semiconductors, nanomaterials, thin film, energy storage materials, solar cells, H-storage materials, batteries and advanced materials will be able to learn how classical and novel x-ray diffraction or scattering methods can help in their work.
Organizers and Instructors:
Dr. Iuliana Cernatescu
PANalytical Inc.
Westborough, MA 01581, USAProf. Robert L. Snyder
School of Materials Science and Engineering
Georgia Institute of Technology, Atlanta, GA 30332, USAProf. Tamas Ungar
Department of Materials Physics
Eötvös University Budapest, H-1518, POB 32, Budapest, HungaryProf. Valeri Petkov
Department of Physics
Central Michigan University, Dow 203, Mt. Pleasant MI 48858, USADr. Andrew Payzant
Oak Ridge National Laboratory
Oak Ridge, TN 37831, USAProf. Scott Misture
Alfred Unviversity
NYS College of Ceramics, Binns Merrill Hall, 2 Pine Street, Alfred, NY 14802 USADr. Martijn Fransen
PANalytical B.V.
Lelyweg 1, 7602 EA, Almelo, the Netherlands
Documents
- Program: X-Ray Scattering Methods for Characterization of Advanced Materials Workshop
Complete program for the X-Ray Scattering Methods Workshop
© 1995-2009, Materials Research Society 506 Keystone Drive, Warrendale, PA, 15086-7573, USA
Phone: 724 779.3003, Fax: 724 779.8313, Email: Customer Service, Member Service, Feedback