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 June 2009 -- Nanofunctional Materials in Cancer Research: Challenges, Novel Methods, and Emerging Applications

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Author(s):
Sujit Sankar Datta, Cristian Staii, Nicholas J. Pinto, Douglas R. Strachan, AT Charlie Johnson

Electrostatic force microscopy (EFM) is a widely used scanning-probe technique for the characterization of electronic properties of nanoscale samples without the use of electrical contacts. Here we review the basic principles of EFM, developing a quantitative framework by which EFM measurements of extended nanostructures can be understood. We support our calculations with experimental data of EFM of carbon nanotubes and conducting or insulating electrospun polyaniline-based nanofibers. Furthermore, we explore routes towards extending EFM as a means of non-invasively probing the local electronic density of states of carbon nanotubes.

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Track ID:
Paper #: 1025-B13-03
DOI: