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September, 2009 -- Electromechanics on the Nanometer Scale: Emerging Phenomena, Devices, and Applications

Volume 1224
Editors: J. Lou, E. Lilleodden, B. Boyce, L. Lu, P.M. Derlet, D. Weygand, J. Li, M.D. Uchic, E. Le Bourhis
ISBN: 978-1-60511-197-1

Volume 1222
Editors: J. Bagdahn, N. Sheppard, K. Turner, S. Vengallatore
ISBN: 978-1-60511-195-7

Volume 1217
Editors: C-Y. Mou, J. Liu, H.H. Kung, S. Dai
ISBN: 978-1-60511-190-2

Volume 1209
Editors: S.S. Mao, L. Merhari, J. van Schijndel, L. Tsakalakos, R. Hurt, H. Liu, T.J. Webster
ISBN: 978-1-60511-182-7

Volume 1204
Editors: Y.K. Yap, K. Hata, A. Loiseau, M. Zheng
ISBN: 978-1-60511-177-3

Volume 1203
Editors: P. Bergonzo, J.E. Butler, R.B. Jackman, K.P. Loh, M. Nesladek
ISBN: 978-1-60511-176-6

Volume 1202
Editors: S. Gwo, J.W. Ager, F. Ren, O. Ambacher, L. Schowalter
ISBN: 978-1-60511-175-9

Volume 1196
Editors: I. Kymissis, M. Shtein, A.C. Arias, T. Sekitani
ISBN: 978-1-60511-169-8

Volume 1195
Editors: O. Ueda, M. Fukuda, S. Pearton, E. Piner, P. Montanegro
ISBN: 978-1-60511-168-1

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In Situ Transmission Electron Microscopy
Volume 33, No. 2
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Guest Editors: P.J. Ferreira, K. Mitsuishi, and E.A. Stach

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Introductory article: In Situ Transmission Electron Microscopy
P.J. Ferreira, K. Mitsuishi, and E.A. Stach, Guest Editors