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Author(s):
Wenge Yang, B.C. Larson, G.M. Pharr, G.E. Ice, J.D. Budai, J.Z. Tischler, Wenjun Liu

The use of three-dimensional x-ray structural microscopy for nondestructive investigations of the deformation microstructure under microindents was demonstrated. Point to point, micrometer-resolution x-ray microbeam measurements of local lattice rotations were made for selected positions under 100-mN Berkovich and conical indents in single-crystal copper. Local lattice orientation measurements were used to extract micrometer by micrometer lattice misorientations and rotation axes along x-ray microbeams. Measurements of the deformation microstructure in symmetry and off-symmetry geometries are reported and discussed in terms of their potential for fundamental deformation investigations.

© 2004 MRS

Member Price: $25.00; Non-Member Price: $25.00
Volume: 19
#: 1
Pages: 66-72
DOI: 10.1557/JMR.2004.0007