Get Involved...

• printer-friendly

• Constrained Diffusional Creep in Thin Copper Films P1.2
  Authors: D. Weiss, H. Gao, and E. Arzt


• An Experimental and Computational Study of the Elastic-Plastic Transition in Thin Films P1.3
  Authors: Erica T. Lilleodden, Jonathan A. Zimmerman, Stephen M. Foiles, and William D. Nix


• "Reverse" Stress Relaxation In Cu Thin Films P1.4
  Authors: R. Spolenak, C. A. Volkert, S. Ziegler, C. Panofen, and W.L. Brown


• Stress Evolution in a Ti/Al(Si,Cu) Dual Layer During Annealing P1.5
  Authors: Ola Bostrom, Patrice Gergaud, Olivier Thomas, and Philippe Boivin


• Study of the Yielding and Strain Hardening Behavior of a Copper Thin Film on a Silicon Substrate Using Microbeam Bending P1.9
  Authors: Jeffrey N. Florando and William D. Nix


• Mechanical Behavior of Thin Cu Films Studied by a Four-Point Bending Technique P1.10
  Authors: Volker Weihnacht and Winfried Brückner


• Dislocation Dynamics Simulations of Dislocation Interactions in Thin FCC Metal Films P2.2
  Authors: Prita Pant, K.W. Schwarz, and S.P. Baker


• Discrete Dislocation Simulation of Thin Film Plasticity P2.3
  Authors: B. von Blanckenhagen, P. Gumbsch, and E. Arzt


• Influence of Film/Substrate Interface Structure on Plasticity in Metal Thin Films P2.6
  Authors: G. Dehm, B.J. Inkson, T.J. Balk, T. Wagner, and E. Arzt


• Observations of Dislocation Motion and Stress Inhomogeneities in a Thin Copper Film P2.7
  Authors: T. John Balk, Gerhard Dehm, and Eduard Arzt


• Solid Solution Alloy Effects on Microstructure and Indentation Hardness in Pt-Ru Thin Films P3.2
  Authors: Seungmin Hyun, Oliver Kraft, and Richard P. Vinci


• Lack of Hardening Effect in TiN/NbN Multilayers P3.3
  Authors: Jon M. Molina-Aldareguia, Stephen J. Lloyd, Zoe H. Barber and William J. Clegg


• Temperature and Strain Rate Dependence of Deformation-Induced Point Defect Cluster Formation in Metal Thin Foils P3.5
  Authors: K. Yasunaga, Y. Matsukawa, M. Komatsu, and M. Kiritani


• Dislocation Locking by Intrinsic Point Defects in Silicon P3.9
  Authors: Igor V. Peidous, Konstantin V. Loiko, Dale A. Simpson, Tony La, and William R. Frensley


• Optical Study of SiGe Films Grown With Low Temperature Si Buffer P3.11
  Authors: Y. H. Luo, J. Wan, J. L. Liu, and K. L. Wang


• Thickness-Fringe Contrast Analysis of Defects in GaN P3.12
  Authors: Jeffrey K. Farrer, C.Barry Carter, Z. Mao, and Stuart McKernan


• Modeling of Dislocations in an Epitaxial Island Structure P4.2
  Authors: X.H. Liu, F.M. Ross, and K.W. Schwarz


• Misfit Dislocation Introduction During the Epitaxial Growth of InAs Islands on GaP P4.3
  Authors: Vidyut Gopal, Alexander L. Vasiliev, and Eric P. Kvam


• X-ray Diffuse Scattering from Misfit Dislocation at Buried Interface P4.9
  Authors: Kaile Li, Paul F. Miceli, Christian Lavoie, Tom Tiedje, and Karen L. Kavanagh


• Development of Cross-Hatch Morphology During Growth of Lattice Mismatched Layers P5.2
  Authors: A. Maxwell Andrews, J.S. Speck, A.E. Romanov, M. Bobeth, and W. Pompe


• Mechanism for the Reduction of Threading Dislocation Densities in Si_0.82Ge_0.18 Films on Silicon on Insulator Substrates P5.3
  Authors: E.M. Rehder, T.S. Kuan, and T.F. Kuech


• TEM Study of Strain States in III-V Semiconductor Epitaxial Layers P5.5
  Authors: André Rocher, Anne Ponchet, Stéphanie Blanc, and Chantal Fontaine


• A Kinetic Model for the Strain Relaxation in Heteroepitaxial Thin Film Systems P5.11
  Authors: Y.W. Zhang, T.C. Wang, and S.J. Chua


• Dislocation Core Spreading at Interfaces between Crystalline and Amorphous Solids P6.6
  Authors: Huajin Gao, Lin Zhang, and Shefford P. Baker


• Dislocation Networks Strain Fields Induced by Si Wafer Bonding P6.9
  Authors: J. Eymery, F. Fournel, K. Rousseau, D. Buttard, F. Leroy, F. Rieutord, and J.L. Rouvière


• Misfit Dislocations in Epitaxial Ni/Cu Bilayer and Cu/Ni/Cu Trilayer Thin Films P7.1
  Authors: Tadashi Yamamoto, Amit Misra, Richard G. Hoagland, Mike Nastasi, Harriet Kung, and John P. Hirth


• Structure and Mechanical Behavior Relationship in Nano-Scaled Multilayered Materials P7.3
  Authors: A.Sergueeva, N.Mara, and A.K.Mukherjee


• Dislocations in Thin Metal Films Observed With X-ray Diffraction P7.6
  Authors: Léon J. Seijbel and Rob Delhez


• Local Microstructure and Stress in Al(Cu) Thin Film Structures Studied by X-Ray Microdiffraction P7.7
  Authors: B.C. Valek, N. Tamura, R. Spolenak, A.A. MacDowell, R.S. Celestre, H.A. Padmore, J.C. Bravman, W.L. Brown, B. W. Batterman, and J. R. Patel


• Deformation Microstructure of Cold Gas Sprayed Coatings P7.10
  Authors: C.Borchers, T.Stoltenhoff, F.Gartner, H.Kreye, and H.Assadi


• Plastic Deformation of Thin Metal Foils Without Dislocations and Formation of Point Defects and Point Defect Clusters P7.11
  Authors: Michio Kiritani, Kazufumi Yasunaga, Yoshitaka Matsukawa and Masao Komatsu