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Send Us Your FeedbackSymposium MM
In-Situ Electron Microscopy of Materials
MRS Proceedings Volume 907E
The volume is not available in print book form from MRS. Readers may access individual documents on line (see details below) or purchase an on-demand print collection from Curran Associates, Inc. Click here for details.
Editors: Paulo J. Ferreira, Ian M. Robertson, Gerhard Dehm, Hiroyasu Saka
Below are the published proceedings articles from Symposium MM from the 2005 MRS Fall Meeting.
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- MRS Members (login for access) and those with institutional access may view the complete article by selecting the "View Paper" button beneath each article. (NOTE: "View Paper" will only appear for logged-in users with the appropriate access.)
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Suggested format for citation of papers in this volume: List all author names: Title of article, in In-Situ Electron Microscopy of Materials, edited by Paulo J. Ferreira, Ian M. Robertson, Gerhard Dehm, Hiroyasu Saka (Mater. Res. Soc. Symp. Proc. 907E, Warrendale, PA, 2006), insert paper number.
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On the Mechanism of Resistive Switching in MIM Capacitors - An Approach with In-situ TEM Experiments 0907-MM06-02
Authors: Herbert Schroeder -
Mechanisms of Grain Growth in Free-Standing Nanograined Gold Thin Films 0907-MM06-03
Authors: J. A. Gregg; K. Hattar; C. H. Lei; I. M. Robertson -
In-situ Microscopic Study of Cu Intragranular Electromigration 0907-MM13-04
Authors: K. C. Chen, C. N. Liao, W. W. Wu and L. J. Chen -
In-situ HREM Observation of Phase Transformation Process in FePt and FePtCu Nanoparticles 0907-MM05-04
Authors: Masatoshi Nakanishi, Gen-ichi Furusawa, Kokichi Waki, Yasushi Hattori, Takeo Kamino, Katsuhiro Sasaki, Kotaro Kuroda, Hiroyasu Saka -
A versatile three-contact electrical biasing transmission electron microscope specimen holder for electron holography and electron tomography of working devices 0907-MM13-02
Authors: Takeshi Kasama, Rafal Dunin-Borkowski, Lionel Matsuya, Ronald Broom, Alison Twitchett, Paul Midgley, Simon Newcomb, Alan Robins, David Smith, Jeff Gronsky, Christine Thomas, Paul Fischione -
In-situ TEM Study of Thermally Induced Voids in 180 nm Cu Interconnects 0907-MM03-03
Authors: J.H. An, P.J. Ferreira -
Length Scale Effect on Deformation and Failure Mechanisms of Ultra-Fine Grained Aluminum 0907-MM01-03
Authors: K Hattar, J H Han, D M Follstaedt, S J Hearne, T A Saif, I M Robertson -
In Situ TEM Investigation of Abnormal Grain Growth in Nanocrystalline Nickel 0907-MM06-01
Authors: David M. Follstaedt, Khalid Hattar, James A. Knapp, Ian M. Robertson -
In-situ TEM studies of magnetization reversal processes in magnetic nanostructures 0907-MM04-01
Authors: Amanda K Petford-Long, Thomas Bromwich, Amit Kohn, Victoria Jackson, Takeshi Kasama, Rafal Dunin-Borkowski, Caroline A Ross -
In Situ Recrystallization Imaging of Polycrystalline Ni-S Alloy by SEM 0907-MM06-05
Authors: Marilyne CORNEN, Rene Le Gall -
In-situ TEM observation of electromagnetic field in some real materials 0907-MM04-02
Authors: Katsuhiro Sasaki, Zhouguang Wang, Keiichi Fukunaga, Tsukasa Hirayama, Kotaro Kuroda, Hiroyasu Saka -
In-situ Observations of Martensitic Transformation in Pure Ti Thin Films using the Dynamical Transmission Electron Microscope (DTEM) 0907-MM05-02
Authors: Thomas Bradley LaGrange, Geoff H. Campbell, Jeffrey D. Colvin, Wayne E. King, Nigel D. Browning, Michael R. Armstrong, Bryan W. Reed, Judy S. Kim, Brent C. Stuart
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