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Symposium CM1 : New Frontiers in Aberration Corrected Transmission Electron Microscopy

2016-03-29   Show All Abstracts

Symposium Organizers

Thomas Walther, University of Sheffield
Rafal E Dunin-Borkowski, Research Centre Jülich
Jean-Luc Rouviere, CEA Grenoble
Masashi Watanabe, University of California, Berkeley

Symposium Support

Bruker Nano Analytics
CEOS GmbH
FEI Electron Optics BV
Gatan, Inc
Hitachi High Technologies America, Inc.
HREM Research
JEOL USA, Inc
Nion Company
Protochips
Thermo Fisher Scientific
CM1.1: Aberration Corrected STEM
Session Chairs
Rafal Dunin-Borkowski
David Smith
Tuesday PM, March 29, 2016
PCC North, 100 Level, Room 121 AB

1:30 PM - *CM1.1.01
Achieving Absolutely Quantitative Atomic Scale Imaging with the Electron Microscope

James LeBeau 1,Xiahan Sang 1,Everett Grimley 1,Changning Niu 1,Douglas Irving 1,Tony Schenk 2,Uwe Schroeder 2

1 North Carolina State Univ Raleigh United States,2 NaMLab Dresden Germany

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2:00 PM - CM1.1.02
Time-Resolved Imaging and Analysis of Single Atom Diffusion on Graphene Oxide

Thomas Furnival 1,Rowan Leary 1,Eric Tyo 2,Stefan Vajda 2,John Thomas 1,Paul Bristowe 1,Paul Midgley 1

1 Department of Materials Science amp; Metallurgy, University of Cambridge Cambridge United Kingdom,2 Materials Science Division Argonne National Laboratory Argonne United States

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2:15 PM - CM1.1.03
Electron Beam Damage in Cerium Dioxide: The Role of Dose Rate #xD;

Aaron Johnston-Peck 1,Joseph DuChene 2,Alan Roberts 2,Wei David Wei 2,Andrew Herzing 1

1 National Institute of Standards and Technology Gaithersburg United States,2 University of Florida Gainesville United States

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2:30 PM - CM1.1.04
Single-Atom Sensitivity Imaging and Spectroscopy of Nanodiamonds

Rhonda Stroud 1,Nabil Bassim 1

1 Materials Science and Technology Division Naval Research Laboratory Washington United States,

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2:45 PM - CM1.1.05
Cs-Corrected STEM Imaging of Unstained Self-Assembled DNA Nanostructures

Nabil Bassim 2,Anirban Samanta 2,Keith Whitener 2,Jeremy Robinson 2,Ellen Goldman 2,Mario Ancona 2,Rhonda Stroud 2,Paul Sheehan 2,Igor Medintz 2,Susan Buckhout-White 2,Juan Idrobo 1

2 U.S. Naval Research Laboratory Washington United States,1 Oak Ridge National Laboratory Oak Ridge United States

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3:00 PM -
BREAK

3:30 PM - CM1.1.06
Atomic Resolution Low-Loss Spectroscopy of Defects in Two-Dimensional Materials

Mark Oxley 1,Myron Kapetanakis 2,Wu Zhou 1,Juan Idrobo 3,Sokrates Pantelides 2

1 Materials Science and Technology Division ORNL Oak Ridge United States,2 Department of Physics and Astronomy Vanderbilt University Nashville United States3 Center for Nanophase Materials Sciences ORNL Oak Ridge United States

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3:45 PM - *CM1.1.07
Minimum Electron Budget for Maximum Structural Information of Beam-Sensitive Nanoparticles Using Quantitative Scanning Transmission Electron Microscopy

Sandra Van Aert 1,Annelies De Wael 1,Karel van den Bos 1,Julie Gonnissen 1,Annick De Backer 1,Lewys Jones 2,Gerardo T. Martinez 1,Peter Nellist 2

1 EMAT - University of Antwerp Antwerp Belgium,2 Department of Materials University of Oxford Oxford United Kingdom

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4:15 PM - CM1.1.08
Aberration Corrected Scanning Transmission Microscopy Investigation of Non-Precious Metal Nanoparticulate Guests Hosted within Titania Aerogels

Todd Brintlinger 1,Paul DeSario 1,Jeremy Pietron 1,Rhonda Stroud 1,Debra Rolison 1

1 US Naval Research Lab Washington United States,

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4:30 PM - CM1.1.09
Quantitative Compositional Characterisation of Catalyst Nanoparticles Using EDX Cross Sections

Katherine MacArthur 1,Thomas Slater 2,Sarah Haigh 2,Dogan Ozkaya 3,Peter Nellist 4,Sergio Lozano-Perez 4

1 Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons Institute for Microstructure Research Aachen Germany,2 University of Manchester Manchester United Kingdom3 Johnson Matthey Reading United Kingdom4 Department of Materials University of Oxford Oxford United Kingdom

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4:45 PM - CM1.1.10
In Situ Studies of Mechanical Strain Induced Effects on Electrical Transport Properties of III-V Semiconductor Nanowires

Lunjie Zeng 1,Thomas Nordqvist 2,Peter Krogstrup 2,Wolfgang Jaeger 1,Eva Olsson 1

1 Department of Applied Physics Chalmers University of Technology Gothenburg Sweden,2 Center for Quantum Devices, Nano-Science Center, Niels Bohr Institute University of Copenhagen Copenhagen Denmark3 Institute for Materials Science University of Kiel Kiel Germany,1 Department of Applied Physics Chalmers University of Technology Gothenburg Sweden

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2016-03-30   Show All Abstracts

Symposium Organizers

Thomas Walther, University of Sheffield
Rafal E Dunin-Borkowski, Research Centre Jülich
Jean-Luc Rouviere, CEA Grenoble
Masashi Watanabe, University of California, Berkeley

Symposium Support

Bruker Nano Analytics
CEOS GmbH
FEI Electron Optics BV
Gatan, Inc
Hitachi High Technologies America, Inc.
HREM Research
JEOL USA, Inc
Nion Company
Protochips
Thermo Fisher Scientific
CM1.2/CM3.4: Joint Session: Advanced In Situ TEM
Session Chairs
Lars Pastewka
Thomas Walther
Wednesday AM, March 30, 2016
PCC North, 100 Level, Room 121 AB

8:00 AM - CM1.2.01/CM3.4.01
Compressive Property of Aerographite Spiky-Shell Particles as Studied by In Situ Electron Microscopy

Kaori Hirahara 2,Koji Hiraishi 1,Konan Imadate 1,Yuichiro Hirota 3,Norikazu Nishiyama 3

1 Department of Mechanical Engineering, Graduate School of Engineering, Osaka University Osaka University Suita Japan,2 Center for Atomic and Molecular Technologies, Graduate School of Engineering Osaka University Suita Japan,1 Department of Mechanical Engineering, Graduate School of Engineering, Osaka University Osaka University Suita Japan3 Division of Chemical Engineering, Graduate School of Science and Engineering Osaka University Suita Japan

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8:15 AM - CM1.2.02/CM3.4.02
In Situ TEM Observations of Superelastic Deformation in Ferroelectric Nanostructures

Yu Deng 3,Chengping Zhang 1,Christoph Gammer 2,Jim Ciston 3,Andrew Minor 2

1 Physics School, Nanjing Univ. Nanjing China,3 National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory Berkeley United States,1 Physics School, Nanjing Univ. Nanjing China3 National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory Berkeley United States,2 Department of Materials Science amp; Engineering, University of California Berkeley United States3 National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory Berkeley United States

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8:30 AM - *CM1.2.03/CM3.4.03
In Situ TEM Investigations of Mechanics and Tribology at the Nanoscale

Hiroyuki Fujita 1

1 Univ of Tokyo Tokyo Japan,

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9:00 AM - CM1.2.04/CM3.4.04
Micro Strain Measurements on Amorphous Titanium Aluminide Thin-Films during in situ TEM Straining

Rohit Sarkar 1,Christian Ebner 2,Jagannathan Rajagopalan 1,Christian Rentenberger 2

1 Arizona State University Tempe United States,2 University of Vienna Vienna Austria

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9:15 AM - CM1.2.05/CM3.4.05
Characterization of Defect Motion at High Strain Rates by Dynamic TEM in situ Mechanical Testing

Thomas Voisin 1,Michael Grapes 1,Yong Zhang 1,Nicholas Lorenzo 2,Jonathan Ligda 2,Brian Schuster 2,Melissa Santala 3,Tian Li 3,Geoffrey Campbell 3,Timothy Weihs 1

1 Johns Hopkins University Baltimore United States,2 Army Research Laboratory Aberdeen Proving Ground United States3 Lawrence Livermore National Laboratory Livermore United States

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9:30 AM - *CM1.2.06/CM3.4.06
Local Strain Measurements during in situ TEM Deformation with Nanobeam Electron Diffraction

Andrew Minor 2

1 Univ of California-Berkeley Berkeley United States,2 Lawrence Berkeley National Laboratory Berkeley United States,

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10:00 AM -
BREAK

10:30 AM - *CM1.2.07/CM3.4.07
In Situ Transmission Electron Microscope on Micro-Plastic Behavior under Single Asperity Friction

Scott Mao 1

1 Dept. of Mechanical Engineering and Materials Science Univ of Pittsburgh Pittsburgh United States,

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11:00 AM - CM1.2.08/CM3.4.08
In Situ TEM Straining with Automated Crystal Orientation Mapping of Ultrafine-Grained Aluminum Films with Different Textures

Ehsan Izadi 1,Amith Darbal 2,Rohit Sarkar 1,Pedro Peralta 1,Jagannathan Rajagopalan 1

1 Arizona State University Tempe United States,2 AppFive, LLC Tempe United States

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11:15 AM - CM1.2.09/CM3.4.09
Anomalous Beam Effects During In Situ TEM Deformation of Nanocrystalline and Ultrafine-Grained Metals

Rohit Sarkar 1,Christian Rentenberger 2,Jagannathan Rajagopalan 1

1 Arizona State Univ Tempe United States,2 University of Vienna Vienna Austria

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11:30 AM - *CM1.2.10/CM3.4.10
Quantitative Dislocation Dynamics through In Situ Indentation in HRTEM

Nan Li 3,Jian Wang 2,Amit Misra 1

3 LANL Los Alamos United States,2 Univ of Nebraska Lincoln United States1 Univ of Michigan Ann Arbor United States

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CM1.3/CM3.5: Joint Session: In Situ Session
Session Chairs
Edward Boyes
Thomas Walther
Wednesday PM, March 30, 2016
PCC North, 100 Level, Room 121 AB

1:30 PM - CM1.3.01/CM3.5.01
Characterizing Working Catalysts with Correlated Electron and Photon Probes

Eric Stach 1,Yuanyuan LI 2,Shen Zhao 3,Anatoly Frenkel 2,Ralph Nuzzo 3,Jingguang Chen 4,Andrew Gamalski 1

1 Center for Functional Nanomaterials Brookhaven National Laboratory Upton United States,2 Department of Physics Yeshiva University New York United States3 Department of Chemistry University of Illinois, Urbana Champaign Urbana United States4 Department of Chemical Engineering Columbia University New York United States

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1:45 PM - CM1.3.02/CM3.5.02
Aberration-Corrected Scanning Transmission Electron Microscopy of Supported Metal Single-Atom Catalysts

Jingyue Liu 1

1 Arizona State Univ Tempe United States,

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2:00 PM - CM1.3.03/CM3.5.03
Aberration Corrected Operando TEM of Catalyst Nanoparticle Surfaces during Catalysis

Benjamin Miller 1,Peter Crozier 1

1 Arizona State University Tempe United States,

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2:15 PM - CM1.3.04/CM3.5.04
Understanding the Reduction Processes of Shape Controlled Fe2O3 Catalysts by Aberration-Corrected Environmental TEM

Yan Zhou 1,Yong Li 1,Datong Yuchi 2,Jingyue Liu 3,Wenjie Shen 1

1 State Key Laboratory of Catalysis Dalian Institute of Chemical Physics Dalian China,2 School for Engineering of Matter, Transport and Energy Arizona State University Tempe United States3 Department of Physics Arizona State University Tempe United States

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2:30 PM - *CM1.3.05/CM3.5.05
AC ESTEM/ETEM Studies of the Dynamics of Single Atoms and Nanoparticles in Catalysts under Continuous in situ Reaction Conditions

Edward Boyes 2,Pratibha Gai 1

2 University of York York United Kingdom,1 Chemistry University of York York United Kingdom

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3:00 PM -
BREAK

3:30 PM - *CM1.3.06/CM3.5.06
In Situ Environmental TEM study of Materials Processes at the Atomic Scale Using a Cs Corrector

Seiji Takeda 1,Naoto Kamiuchi 1,Ryotaro Aso 1,Kentaro Soma 1,Hideto Yoshida 1

1 Osaka Univ Ibaraki Japan,

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4:00 PM - CM1.3.07/CM3.5.07
Testing and Application of an in situ Illumination System for an Aberration-Corrected ETEM

Qianlang Liu 1,Peter Crozier 1

1 Arizona State Univ Tempe United States,

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4:15 PM - CM1.3.08/CM3.5.08
Differential Phase Contrast Analysis with a Unitary Detector for Multiscale Characterization of Magnetic Nanomaterials

Sergei Lopatin 1,Yurii Ivanov 1,Jurgen Kosel 1,Andrey Chuvilin 2

1 King Abdulla University of Science amp; Technology Thuwal Saudi Arabia,2 CIC nanoGUNE Donostia-San Sebastian Spain

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4:30 PM - CM1.3.09/CM3.5.09
Controlled Dose for Aberration Corrected In Situ (Scanning) Transmission Electron Microscopy Observations of Iron Oxide Nanoparticle Reduction Dynamics

Ryan Hufschmid 2,Eric Teeman 1,Layla Mehdi 2,Eric Jensen 2,Chiwoo Park 3,Kannan Krishnan 1,Nigel Browning 2

1 Materials Science and Engineering University of Washington Seattle United States,2 Fundamental and Computational Sciences Directorate Pacific Northwest National Laboratory Richland United States,1 Materials Science and Engineering University of Washington Seattle United States2 Fundamental and Computational Sciences Directorate Pacific Northwest National Laboratory Richland United States3 Industrial and Manufacturing Engineering Florida State University Tallahassee United States

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2016-03-31   Show All Abstracts

Symposium Organizers

Thomas Walther, University of Sheffield
Rafal E Dunin-Borkowski, Research Centre Jülich
Jean-Luc Rouviere, CEA Grenoble
Masashi Watanabe, University of California, Berkeley

Symposium Support

Bruker Nano Analytics
CEOS GmbH
FEI Electron Optics BV
Gatan, Inc
Hitachi High Technologies America, Inc.
HREM Research
JEOL USA, Inc
Nion Company
Protochips
Thermo Fisher Scientific
CM1.4: Novel Electron Detectors
Session Chairs
Jean-Luc Rouviere
Thursday AM, March 31, 2016
PCC North, 100 Level, Room 121 A

8:30 AM - *CM1.4.01
WITHDRAW 3/31/16 Measuring Physical and Electronic Properties at the Nanoscale

David Muller 1

1 Cornell University Ithaca United States,

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9:00 AM - CM1.4.02
Evaluation of a Direct Electron Detector for EELS

James Hart 1,Andrew Lang 1,Colin Trevor 2,Ray Twesten 2,Mitra Taheri 1

1 Materials Science and Engineering Drexel University Philadelphia United States,2 Analytical Projects Ramp;D Gatan Pleasanton United States

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9:15 AM - CM1.4.03
Application of Single-Electron-Detection Camera for Phase Contrast Imaging

Shery Chang 1,Christian Dwyer 1,Juri Barthel 2,Lei Jin 2,Chris Boothroyd 2,Rafal Dunin-Borkowski 2

1 Arizona State Univ Tempe United States,2 Forschungszentrum Julich Juelich Germany

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9:30 AM - *CM1.4.04
New Adventures in STEM Imaging with Pixelated Detectors

Ian MacLaren 1,Magnus Nord 1,Gary Paterson 1,Damien McGrouther 1,Hao Yang 3,Lewys Jones 2,Peter Nellist 2

1 School of Physics and Astronomy University of Glasgow Glasgow United Kingdom,2 Department of Materials University of Oxford Oxford United Kingdom,3 Molecular Foundry Lawrence Berkeley National Laboratory Berkeley United States2 Department of Materials University of Oxford Oxford United Kingdom

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10:00 AM -
BREAK

CM1.5: Aberration Corrected TEM
Session Chairs
Jean-Luc Rouviere
Thursday AM, March 31, 2016
PCC North, 100 Level, Room 121 A

10:30 AM - CM1.5.01
Combining Aberration-Correction and Direct Electron Detection to Image the Molecular Structure of Liquid Crystal Polymers

Eric Stach 1,Jing Li 2,Dmitri Zakharov 2,Huolin Xin 1,Elsa Reichmanis 3

2 Center for Functional Nanomaterials Brookhaven National Laboratory Upton United States,1 Department of Materials Science and Engineering Stony Brook University Stony Brook United States,1 Department of Materials Science and Engineering Stony Brook University Stony Brook United States,2 Center for Functional Nanomaterials Brookhaven National Laboratory Upton United States2 Center for Functional Nanomaterials Brookhaven National Laboratory Upton United States3 School of Chemical amp; Biomolecular Engineering Georgia Institute of Technology Atlanta United States

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10:45 AM - *CM1.5.02
Off-Axial Aberration Correction Using a B-COR for Lorentz and HREM Modes

Etienne Snoeck 1,Yoshifumu Taniguchi 2,Christophe Gatel 1,Aurelien Masseboeuf 1,Martin Hytch 1,Florent Houdellier 1

1 CNRS-CEMES Toulouse France,2 Hitachi High-Technologies Corporation Hitachinaka Japan

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11:15 AM - CM1.5.03
Atomic Observation of Partial Dislocation Structure and Dynamics in Monolayer Graphene at High Temperature

Alex Robertson 1,Gun-Do Lee 2,Kuang He 1,Ye Fan 1,Christopher S. Allen 1,Kim Heeyeon 3,Euijoon Yoon 2,Haimei Zheng 4,Angus Kirkland 1,Jamie Warner 1

1 Univ of Oxford Oxford United Kingdom,2 Seoul National University Seoul Korea (the Republic of)3 Korea Institute of Energy Research Daejeon Korea (the Republic of)4 Lawrence Berkeley National Lab Berkeley United States

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11:30 AM - CM1.5.04
Stability of Twin Boundary Junction Structure in Nanotwinned Copper Nanowires Prepared by Pulsed Electrodeposition

Wei-Lun Weng 1,Chien-Neng Liao 1

1 Department of Materials Science and Engineering, National Tsing-Hua University Hsinchu Taiwan,

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CM1.6: Monochromators
Session Chairs
Jean-Luc Rouviere
Thursday PM, March 31, 2016
PCC North, 100 Level, Room 121 A

1:30 PM - *CM1.6.01
New Horizons in Aberration-Corrected Stem

Ondrej Krivanek 2,Michael Hotz 1,Tracy Lovejoy 1,Niklas Dellby 1

1 Nion Co Kirkland United States,2 Physics Arizona State University Tempe United States,1 Nion Co Kirkland United States

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2:00 PM - CM1.6.02
Local Detection of Hydrogen-Oxygen Bonds in Nanoparticles with Ultra-High Energy Resolution Vibrational EELS

Peter Crozier 1,Toshihiro Aoki 1,Qianlang Liu 1

1 Arizona State Univ Tempe United States,

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2:15 PM - *CM1.6.03
Vibrational EELS of Nanosctructured Oxides

Maureen Joel Lagos 1,Tracy Lovejoy 2,Niklas Dellby 2,Ondrej Krivanek 2,Philip Batson 1

1 Rutgers University Piscataway United States,2 Nion Kirkland United States

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2:45 PM - CM1.6.04
Optimization of Electron Energy-Loss Spectroscopy Acquisition Techniques for the Analysis of Interfaces in CuPc/C60 and P3HT/PCBM Organic Solar Cells

Jessica Alexander 1,Frank Scheltens 1,James Gilchrist 3,Sandrine Heutz 3,Lawrence Drummy 2,Michael Durstock 2,David McComb 1

1 Ctr for Electron Microscopy and Analysis The Ohio State University Columbus United States,3 Dept. of Materials Imperial College London London United Kingdom2 Air Force Research Laboratory Dayton United States

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3:00 PM -
BREAK

CM1.7: Chromatic Aberration Correction
Session Chairs
Rafal Dunin-Borkowski
Maximilian Haider
Thursday PM, March 31, 2016
PCC North, 100 Level, Room 121 A

3:30 PM - *CM1.7.01
Instrumentation for Low-Energy High-Resolution Electron Microscopy

Maximilian Haider 2,Martin Linck 1,Peter Hartel 1,Stephan Uhlemann 1,Heiko Mueller 1

1 CEOS GmbH Heidelberg Germany,2 LEM Karlsruhe Institute of Technology Karlsruhe Germany,1 CEOS GmbH Heidelberg Germany

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4:00 PM - CM1.7.02
Amplitude Contrast Imaging in High-Resolution Electron Microscopy with the Correction of Spherical and Chromatic Aberration

Jianguo Wen 1,Dean Miller 1,Ho Nyung Lee 2,Xifan Wu 3

1 Electron Microscopy Center – Center for Nanoscale Materials Argonne National Laboratory Argonne United States,2 Materials Science and Technology Division Oak Ridge National Laboratory Oak Ridge United States3 Department of Physics Temple University Philadelphia United States

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4:15 PM - *CM1.7.03
Energy-Filtered and Low-Voltage Chromatic Aberration-Corrected High-Resolution TEM on the PICO Instrument

Lothar Houben 2,Juri Barthel 3,Martina Luysberg 1,Peter Hartel 4,Rafal Dunin-Borkowski 1

1 Peter Gruenberg Institut Forschungszentrum Juelich Juelich Germany,2 Department of Chemical Research Support Weizmann Institute of Science Rehovot Israel,3 Gemeinschaftslabor für Elektronenmikroskopie RWTH Aachen Aachen Germany1 Peter Gruenberg Institut Forschungszentrum Juelich Juelich Germany4 CEOS GmbH Heidelberg Germany

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4:45 PM - CM1.7.04
Prospects for Atomic-Resolution Chromatic Aberration Corrected Transmission Electron Microscopy in Lorentz Mode on the Titan PICO Microscope

Rafal Dunin-Borkowski 1,Amir Tavabi 1,Zi-An Li 2

1 Forschungszentrum Juelich Juelich Germany,2 University of Duisburg-Essen Duisburg Germany

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CM1.8: Poster Session
Session Chairs
Rafal Dunin-Borkowski
Jean-Luc Rouviere
Thomas Walther
Masashi Watanabe
Thursday PM, March 31, 2016
Sheraton, Third Level, Phoenix Ballroom

8:00 PM - CM1.8.02
Exploring the Carbon Deposition Mechanism on Ni/Gd Ceria Catalysts

Ethan Lawrence 1,Peter Crozier 1

1 Arizona State Univ Tempe United States,

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8:00 PM - CM1.8.03
Revealing the Influence of Capping Agents on Gold Nanocrystal Growth Modes with in situ Liquid S/TEM

Silvia Canepa 1,Raymond Unocic 2,Brian Sneed 2,Kristian Molhave 1

1 Department of Micro- and Nanotechnology (DTU Nanotech) Technical University of Denmark (DTU) Kgs. Lyngby Denmark,2 Center For Nanophase Materials Sciences Division Oak Ridge National Laboratory (ORNL) Oak Ridge United States

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8:00 PM - CM1.8.04
Monochromated STEM-EELS Study of Plasmonic Metal-Semiconductor Interactions

Jiake Wei 2,Jia Xu 3,Xuedong Bai 2,Jingyue Liu 3

2 Surface Physics Institute of Physics, Chinese Academy of Science Beijing China,3 Physics Arizona State University Tempe United States

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8:00 PM - CM1.8.05
ACTEM on the Effect of Interface Roughness on Superconducting Transition Temperatures of Nb/Co Multilayers

Liying Liu 1,Yutao Xing 2,Dietrich Haeussler 3,Wolfgang Jaeger 3,Guillermo Solorzano 1

1 DEQM - PUC-Rio Rio de Janeiro Brazil,2 Universidade Federal Fluminense Rio de Janeiro Brazil3 Institute for Materials Science Christian-Albrechts Universität zu Kiel Kiel Germany

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8:00 PM - CM1.8.06
Impact of the Dynamical Scattering Effect on the Contrast of Aberration-Corrected High-Resolution Transmission Electron Microscope Images

Cai Wen 2

1 School of Science Southwest University of Science and Technology Mianyang China,2 Department of Physics Arizona State University Tempe United States,

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8:00 PM - CM1.8.07
Nano Beam Diffraction: A Versatile Tool to Characterize the Local Structure of Amorphous and Crystalline Materials

Xiaoke Mu 1,Aaron Kobler 1,Di Wang 1,Christian Kuebel 1

1 Karlsruhe Institute of Technology Eggenstein-Leopoldshafen Germany,

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8:00 PM - CM1.8.08
Dynamics and Stability of Defects in Hexagonal Boron Nitride

Thang Pham 1,Ashley Gibb 1,Stephen Gilbert 1,Colin Ophus 2,Chengyu Song 2,Alex Zettl 1

1 Univ of California-Berkeley Berkeley United States,2 National Center for Electron Microscopy Berkeley United States

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8:00 PM - CM1.8.09
Detection and Characterization of Local Bandgap and Surface States on Nanoparticles with High Energy Resolution EELS

Qianlang Liu 1,Liuxian Zhang 1,Katia March 2,Toshihiro Aoki 1,Peter Crozier 1

1 Arizona State Univ Tempe United States,2 Université Paris-Sud Orsay Cedex France

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8:00 PM - CM1.8.10
Real-Time Observation of Resistive Switching in TiO2 Nanoparticles Using Electron Holography

Janghyun Jo 1,Vadim Migunov 2,Dirk Schmidt 3,Ulrich Simon 3,Miyoung Kim 1,Rafal Dunin-Borkowski 2

1 Materials Science and Engineering Seoul National University Seoul Korea (the Republic of),2 Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute Forschungszentrum Jülich Juelich Germany3 Inorganic Chemistry RWTH Aachen University Aachen Germany

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2016-04-01   Show All Abstracts

Symposium Organizers

Thomas Walther, University of Sheffield
Rafal E Dunin-Borkowski, Research Centre Jülich
Jean-Luc Rouviere, CEA Grenoble
Masashi Watanabe, University of California, Berkeley

Symposium Support

Bruker Nano Analytics
CEOS GmbH
FEI Electron Optics BV
Gatan, Inc
Hitachi High Technologies America, Inc.
HREM Research
JEOL USA, Inc
Nion Company
Protochips
Thermo Fisher Scientific
CM1.9: Materials Science Applications
Session Chairs
Rolf Erni
Masashi Watanabe
Friday AM, April 01, 2016
PCC North, 200 Level, Room 232 C

8:30 AM - *CM1.9.01
Understanding Complex Heterointerfaces Using Aberration-Corrected STEM

David Smith 1

1 Arizona State Univ Tempe United States,

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9:00 AM - CM1.9.02
Atomically Resolved Energy Dispersive X-Ray Spectroscopy of Segregation within Stacking Faults in Ni-Based Superalloys

Bryan Esser 1,Timothy Smith 1,Robert Williams 1,Hamish Fraser 1,David McComb 1

1 Materials Science and Engineering The Ohio State University Columbus United States,

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9:15 AM - CM1.9.03
STEM Study of (101) Twins in Natural and Synthetic Cassiterite

Nina Daneu 1,Sara Tominc 1,Goran Drazic 2,Francisco Zepeda 2,Masahiro Kawasaki 3,Aleksander Recnik 1

1 Jozef Stefan Institute Ljubljana Slovenia,2 National Institute of Chemistry Ljubljana Slovenia3 JEOL USA Inc. Peabody United States

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9:30 AM - CM1.9.04
Structural Analysis of Au Yolk-Shell Nanoparticles by HAADF-STEM and Electron Tomography

Alejandra Londono-Calderon 1,Daniel Bahena-Uribe 2,Miguel Yacaman 1

1 University of Texas at San Antonio San Antonio United States,2 Laboratorio Avanzado de Nanoscopía Electrónica, CINVESTAV, Av. Instituto Politecnico Nacional Mexico D.F. Mexico

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9:45 AM - CM1.9.05
Monolayer Transition Metal Dichalcogenide Alloys with Tunable Band Gaps: Atomic Structure and Optical Properties

Amin Azizi 1,Yuanxi Wang 2,Zhong Lin 2,Ke Wang 3,Mauricio Terrones 2,Vincent Crespi 2,Nasim Alem 1

1 Department of Materials Science and Engineering The Pennsylvania State University University Park United States,2 Department of Physics The Pennsylvania State University University Park United States3 Materials Characterization Lab Materials Research Institute, The Pennsylvania State University State College United States

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10:00 AM -
BREAK

10:30 AM - *CM1.9.06
Investigations of Sensitive Functional Materials by Analytical (S)TEM

Vesna Srot 1,Birgit Bussmann 1,Ute Salzberger 1,Masashi Watanabe 2,Monserrat Espanol 4,Thorsten Hesjedal 5,Piet Schoenherr 5,Peter van Aken 1

1 Max-Planck-Institute for Solid State Research Stuttgart Germany,2 Department of Materials Science and Engineering Lehigh University Bethlehem United States3 Department of Materials Science and Metallurgical Engineering Technical University of Catalonia Barcelona Spain,4 Centre for Research in Nanoengineering Technical University of Catalonia Barcelona Spain5 Department of Physics, Clarendon Laboratory University of Oxford Oxford United Kingdom

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11:00 AM - CM1.9.07
Atomic Mapping of Novel Domain Configurations in Strained Ferroelectric Films

Xiuliang Ma 1,Yunlong Tang 1,Yinlian Zhu 1,Yujia Wang 1

1 Chinese Academy of Sciences Shenyang China,

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11:15 AM - CM1.9.08
EDS: Characterization of the Chemical Composition, Structure, Distribution and Surroundings of Nanoparticles

Meiken Falke 1,Brian Miller 1,Hosanna Schroeder 1

1 Bruker Berlin Germany,

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11:30 AM - CM1.9.09
Characterizing Atomic Ordering in Intermetallic Compounds Using X-Ray Energy Dispersive Spectroscopy in an Aberration-Corrected (S)TEM

Robert Williams 1,Arda Genc 2,Anna Carlsson 2,John Sosa 1,David McComb 1,Hamish Fraser 1

1 The Ohio State University Columbus United States,2 FEI COMPANY Eindhoven Netherlands

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11:45 AM - CM1.9.10
Studying High Resolution Scanning Transmission Electron Microscopy Images by Template Matching Analysis: Towards the Observation of Punctual Defects

Jean-Luc Rouviere 3,Benedikt Haas 1,Bastien Bonef 1,Jian-Min Zuo 4

2 INAC University Grenoble Alpes Grenoble France,3 INAC CEA Grenoble France,2 INAC University Grenoble Alpes Grenoble France,1 CEA - University Grenoble Alpes Grenoble France4 Materials Research Laboratory University of Illinois, Urban-Champaign United States

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CM1.10: New Quantification Methods
Session Chairs
Gianluigi Botton
Masashi Watanabe
Friday PM, April 01, 2016
PCC North, 200 Level, Room 232 C

1:30 PM - *CM1.10.01
From Catalysis to Plasmonics: Probing the Structure of Nanoscale Materials with STEM and EELS

Gianluigi Botton 1,Edson Bellido 1,Isobel Bicket 1,Matthieu Bugnet 1,Lidia Chinchilla-Reyes 1,Hanshuo Liu 1,Sagar Prabhudev 1,David Rossouw 1,Samantha Stambula 1,Steffi Woo 1

1 McMaster Univ Hamilton Canada,

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2:00 PM - CM1.10.02
A Comparison of CBED and ABF Atomic Imaging for GaN Polarity Determination

Alexana Roshko 1,Matthew Brubaker 1,Paul Blanchard 1,Kris Bertness 1,Todd Harvey 1,Roy Geiss 2

1 NIST Boulder United States,2 Colorado State University Fort Collins United States

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2:15 PM - CM1.10.03
Single La Vacancy Detection in LaMnO3 by High Precision Quantitative Scanning Transmission Electron Microscopy

Jie Feng 1,Alexander Kvit 1,Chenyu Zhang 1,Dane Morgan 1,Paul Voyles 1

1 University of Wisconsin-Madison Madison United States,

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2:30 PM - *CM1.10.04
Transmission Electron Microscopy of Advanced Functional Materials for Energy and Electronic Applications

Rolf Erni 1,Piyush Agrawal 1,Yadira Dasilva 1,Marta Rossell 1

1 Electron Microscopy Center Empa Dubendorf Switzerland,

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3:00 PM -
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3:30 PM - CM1.10.05
Investigation of Phase Separation in Ingan by Plasmon Loss Spectroscopy in a Transmission Electron Microscope

Xiaoyi Wang 1,Marie-Pierre Chauvat 2,Pierre Ruterana 2,Thomas Walther 1

1 University of Sheffield Sheffield United Kingdom,2 CIMAP Caen France

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3:45 PM - *CM1.10.06
Novel Approaches to Quantitative STEM

Jack Zhang 1,Jinwoo Hwang 2,Susanne Stemmer 1

1 University of California Santa Barbara Santa Barbara United States,2 Ohio State University Columbus United States

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4:15 PM - CM1.10.07
Quantitative Atomic-Resolution Chemical Mapping in the Scanning Transmission Electron Microscope

Christian Dwyer 1

1 Department of Physics Arizona State University Tempe United States,

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4:30 PM - CM1.10.08
Validation of Multivariate Statistical Analysis on Spectrum-Imaging Datasets

Masashi Watanabe 1,Kazuo Ishizuka 2

1 Lehigh Univ Bethlehem United States,2 HREM Research Inc. Saitama Japan

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