Radiation damage, and related phenomena, naturally occurs in many material settings, including the self-aging of radioactive materials, fission and fusion energy production, nuclear medicine, and implantation in semiconductors. In each of these settings, defects are generated at a high rate and the fate of these defects dramatically modifies the properties of a material. A large body of radiation damage research is devoted to understanding more fully the fate of these defects.
Radiation damage effects are inherently multiscale in nature, ranging from atomic scale events that occur on the picosecond timescale, to manifestations of such atomic scale events in macroscopic components that take years to develop. Traditionally, a sequential approach is adopted to understand radiation effects, by identifying key mechanisms at each scale and using a ‘parameter-passing’ paradigm to build up understanding across the scales. However, due to the highly non-linear nature of irradiation damage, which includes many-body effects, one must add convolutions and correlations in space and time that may make the standard paradigm insufficient to fully characterize irradiation damage effects. To truly understand and predict radiation damage effects, then, requires both a detailed description of atomic level processes as well as models that incorporate this behavior on much longer time and larger length scales. To be successful, this effort requires the synergistic interaction between experimentation and modeling at all scales.
This symposium will focus on the multiscale nature of radiation damage effects, with particular emphasis on fundamental mechanisms and their consequences on materials performance. Submissions emphasizing the relationship between experimentation and modeling to provide enhanced insight into radiation damage effects are strongly encouraged. In addition to these, submissions from fields beyond nuclear energy, where damage accompanies other phenomena, are invited such as implantation in, and modification of semiconductor devices.