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    • Industrial Applications of X-Ray Diffraction
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Industrial Applications of X-Ray Diffraction

• Industrial Applications of X-Ray Diffraction

• Sunday, November 27, 2011
• Sheraton Boston Hotel - Boston, MA

Obtaining reliable materials properties parameters is critical for materials, parts, devices modeling and design. Materials properties parameters (mechanical, optical, electrical, etc.) are very closely related to materials structure and microstructure. There are several methods that can give information on structure and microstructure parameters.

The aim and focus of this workshop was on the structure and microstructure parameters that can be obtained from X-Ray Scattering/Diffraction techniques, both classical techniques and newly-available characterization techniques. The workshop started with a brief introduction to X-Ray Scattering/Diffraction and Crystallography, with an emphasis on what you need to know to do a Rietveld refinement. Then leading experts in the field of X-Ray Scattering/Diffraction characterization gave a practical tutorial on how to apply different X-Ray Scattering/Diffraction methods for materials characterizations, what are the parameters that can be extracted from each method and also what are the limitations of each method discussed and its material dependency.

The workshop included topics on but not limited to:

• Phase ID
• Unit cell refinement, quantification
• Diffraction in non-ambient conditions
• Residual stress
• Texture
• Line profile Analysis
• High Energy X-Ray Diffraction
• Pair Distribution Function
• etc.

Each session included practical examples and also tips and tricks on how to collect and interpret the data.