Osamu Ueda is currently a visiting professor at the Renewable Energy Laboratory at Meiji University, Japan. He received his BS degree in engineering from The University of Tokyo in 1974. He also received his PhD degree in engineering from The University of Tokyo in 1990. He joined Fujitsu Laboratories Ltd. (FJL) in 1974. Since then, his research has been focused on the evaluation of defects and microstructures in various semiconducting materials and the understanding of various degradation mechanisms of compound semiconductor optical devices such as semiconductor lasers and LEDs for over 30 years. The key technique of his work is transmission electron microscopy (TEM) and related techniques for characterization of defects in semiconductors and degraded optical devices.
During his employment at FJL, Ueda joined the Department of Materials Science and Engineering at MIT as a visiting scientist in 1984-1986, studying the defect generation in bulk GaAs and Si crystals. It was a great honor for him to work at the laboratory of Harry C. Gatos at MIT who was one of the founders of MRS in 1973. He was also a visiting associate professor of Research Center for Interface Quantum Electronics at Hokkaido University in 1992-1993, a visiting professor of art, science and technology at the Center for Cooperative Research at Kyushu University in 2001-2002, and a visiting professor at Kanazawa Institute of Technology (KIT) in 1999-2005.
In December 2005, Ueda joined KIT as a Professor in the Graduate School of Engineering. He was also a professor of the Research Laboratory for Integrated Technological Systems at KIT. During this term, he intensively focused on various activities: i) educating professional researchers and engineers in industry for receiving PhD degrees; ii) continuing the research on defects in semiconductors (III-V compound semiconductors, GaN-related materials, and oxide semiconductors) and reliability physics in various semiconductor optical devices (semiconductor lasers, LEDs, and VCSELs); and iii) promoting collaborative research and technical consulting with industry on failure analysis and improvement of reliability in various optical devices.
Ueda has authored 56 patents, more than 170 scientific papers including 30 invited/review papers, and 15 books & book chapters. He has been recognized as a Fellow of the JSAP in 2007. Other honors include the Research Award by The Promotion Foundation of Electrical Science and Engineering in Japan in 2003 and APEX/JJAP Editorial Contribution Award by JSAP in 2010. Ueda is a member of Japan Society of Applied Physics (JSAP), The Japanese Society of Microscopy (JSM), The Japanese Association of Crystal Growth (JACG), Reliability Engineering Association of Japan (REAJ), and MRS. He was also a member of the Electrochemical Society (1990-2000). In Japan, he served as a Board of Director of JSAP in 2004-2005. He was also an organizing committee member of Thin Film and Surface Physics Division of JSAP (1997-2007), a head editor (1997-2010) and an Editor-in-Chief (2004-2005) of Japanese Journal of Applied Physics (JJAP).
Ueda has also been active in MRS from his early research career. He presented a contributed paper on defects in III-V compound semiconductor thin film at the 1983 MRS Fall Meeting. Since then, he presented fifteen papers including four invited papers. He has been a lead organizer for four symposia (Symp. B in 2009 Fall, Symp. G in 2012 Spring, Symp. CC in 2015 Spring, and Symp. EP04 in 2018 Spring). In the Fall of 2013, he has served as a Meeting Chair of the JSAP-MRS Joint Symposia held in Kyoto, Japan. He was also one of five Meeting Chairs of the first MRS Spring Meeting in Phoenix in 2016. Ueda was also appointed the MRS PacRim subcommittee member in 2010-2011 and the MRS Program Development Subcommittee (PDSC) member in 2016-2018.