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2010 MRS Fall Meeting & Exhibit

November 29-December 3, 2010 | Boston
Meeting Chairs
: Ana Claudia Arias, Robert F. Cook, Clemens Heske, Shu Yang

Symposium VV : Novel Development and Applications of Scanning Probe Microscopy

2010-11-29   Show All Abstracts

Symposium Organizers

Bryan D. Huey University of Connecticut
Oleg V. Kolosov Lancaster University
Seungbum Hong Argonne National Laboratory
Hyunjung Shin Kookmin University
VV1: Molecular Studies
Session Chairs
Bryan Huey
Monday AM, November 29, 2010
Fairfax A (Sheraton)

9:30 AM - **VV1.1
Touching Molecules at Forces Less than a Single Atomic Bond.

Stephen Minne 1 , C. Su 1 , S. Hu 1 , N. Erina 1 , J. Kindt 1 , A. Slade 1
1 AFM Unit, Bruker Corporation, Goleta, California, United States

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10:00 AM - VV1.2
Force Spectroscopy Study in Liquids by Frequency Modulation AFM Toward Local Charge Mapping at Solid/liquid Interface.

Ken-ichi Umeda 1 , Yoshiki Hirata 3 , Noriaki Oyabu 1 , Kei Kobayashi 2 , Matsushige Kazumi 1 , Hirofumi Yamada 1
1 Department of Electronic Science and Engineering, Kyoto University, Kyoto Japan, 3 Institute for Biological Resources and Functions, National Institute of Advanced Industrial Science and Technology, Tsukuba Japan, 2 Innovative Collaboration Center, Kyoto University, Kyoto Japan

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10:15 AM - VV1.3
Low Frequency Dielectrophoretic Force Microscopy (LF-DEPFM): A Novel Non-contact AFM Mode for Surface Topography and Charge Imaging in Aqueous Solution.

Erik Hsiao Liao 1 , David Marchand 1 , Seong Kim 1
1 Chemical Engineering, The Pennsylvania State University, University Park, Pennsylvania, United States

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10:30 AM -
BREAK

11:00 AM - **VV1.4
Catalytic Model Systems Studied by High-resolution, Video-rate Scanning Tunneling Microscopy.

Flemming Besenbacher 1
1 Interdisciplinary Nanoscience Center (iNANO), Aarhus University, Aarhus Denmark

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11:30 AM - VV1.5
Crystallographic Processing of Scanning Probe Microscopy Images of Molecular 2D Periodic Monolayer Arrays.

Peter Moeck 1 , Jack Straton 1 , Pavel Placinda 1 , Taylor Bilyeu 1 , Marius Toader 2 , Michael Hietschold 2 , Norbert Koch 3 , Juergen Rabe 3
1 Physics, Portland State University, Portland, Oregon, United States, 2 Physics, University of Technology, Chemnitz Germany, 3 Physics, Humboldt University, Berlin Germany

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11:45 AM - VV1.6
Molecular Resolution Imaging at Ambient Conditions with AFM Operating in AM Mode.

Andrey Krayev 1 , Sergey Bashkirov 1 , Victor Baukov 1 , Alexey Belyaev 1 , Vasily Gavrilyuk 1 , Dmitry Evpolv 1 , Dmitry Eliseev 1 , Vladimir Zhizhimontov 1 , Mikhail Zhdanov 1 , Vladimir Ivanov 1 , Sergey Katsur 1 , Sergey Kostromin 1 , Mikhail Savvateev 1 , Alexey Temiryazev 1 , Mikhail Trusov 1 , Yuri Turlapov 1 , Alexander Yagovkin 1 , Alexander Yalovenko 1 , Sergey Saunin 1
1 , AIST-NT Inc, Novato, California, United States

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12:00 PM - **VV1.7
Atomic Resolution Imaging of Single Molecules with Noncontact Atomic Force Microscopy.

Fabian Mohn 1 , Leo Gross 1 , Nikolaj Moll 1 , Jascha Repp 2 1 , Gerhard Meyer 1
1 , IBM Research - Zurich, Rueschlikon Switzerland, 2 Institute of Experimental and Applied Physics, University of Regensburg, Regensburg Germany

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12:30 PM - VV1.8
Surface Electrochemical Potential Mapping of Graphene on SiC(0001).

Shuaihua Ji 1 , James B. Hannon 1 , Rudolf Tromp 1 , Arthur W. Ellis 1 , Mark C. Reuter 1 , Frances M. Ross 1
1 , IBM Research Division, T. J. Watson Reseach Center, Yorktown Heights, New York, United States

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VV2: New Probes, Optics and SPM
Session Chairs
Seungbum Hong
Monday PM, November 29, 2010
Fairfax A (Sheraton)

2:30 PM - **VV2.1
High Resolution Field Effect Sensing of Ferroelectric Charges.

Hyoungsoo Ko 1 2 , Kyunghee Ryu 3 , Hongsik Park 1 4 , Chulmin Park 1 2 , Daeyoung Jeon 1 5 , Yong Kwan Kim 1 2 , Juhwan Jung 1 2 , Dong-Ki Min 1 2 , Yunseok Kim 6 , Ho Nyung Lee 7 , Yoondong Park 2 , Hyunjung Shin 3 , Seungbum Hong 1 8
1 Semiconductor Devices Laboratory, Samsung Advanced Institute of Technology, Yongin Korea (the Republic of), 2 Semiconductor Devices Laboratory, Samsung Electronics, Kyunggi-do Korea (the Republic of), 3 School of Advanced Materials Engineering, Kookmin University, Seoul Korea (the Republic of), 4 Division of Engineering, Brown University, Providence, Rhode Island, United States, 5 School of Electrical Engineering, Korea University, Seoul Korea (the Republic of), 6 Microstructure Physics, Max Planck Institute, Halle Germany, 7 Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States, 8 Materials Science Division, Argonne National Laboratory, Lemont, Illinois, United States

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3:00 PM - VV2.2
High Resolution Electrostatic Force Microscopy with Coaxial Probes.

Keith Brown 1 , Jesse Berezovsky 1 2 , Robert Westervelt 1 3
1 School of Engineering and Applied Science, Harvard University, Cambridge, Massachusetts, United States, 2 Department of Physics, Case Western Reserve University, Cleveland, Ohio, United States, 3 Department of Physics, Harvard University, Cambridge, Massachusetts, United States

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3:15 PM - VV2.3
Microfabrication of the combined AFM-SECM Sensors utilizing Focused Ion Beam and isotropic Inductively Coupled Plasma-Reactive Ion Etching.

Amra Avdic 1 , Alois Lugstein 1 , Ming Wu 3 , Bernhard Gollas 2 3 , Ilya Pobelov 4 , Thomas Wandlowski 4 , Emmerich Bertagnolli 1
1 Institute of Solid State Electronics,, Vienna University of Technology, Vienna Austria, 3 , Competence Centre for Electrochemical Surface Technology, Wiener Neustadt Austria, 2 Institute for Chemistry and Technology of Materials, Graz University of Technology, Graz Austria, 4 Department of Chemistry and Biochemistry, University of Bern, Bern Switzerland

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3:30 PM - VV2.4
Advances in Nanometer Scale Manufacturing Using Heated Atomic Force Microscope Probes.

Jonathan Felts 1 , Patrick Fletcher 1 , James Pikul 1 , Suhas Somnath 1 , Bikram Bhatia 1 , Nicholas Maniscalco 1 , Zhenting Dai 1 , William King 1
1 Mechanical Science and Engineering, University of Illinois Urbana-Champaign, Urbana, Illinois, United States

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3:45 PM - VV2.5
The Fiber Force Probe: Using Nanowires to Gently Image Soft Materials.

Babak Sanii 1 , Paul Ashby 1
1 Molecular Foundry, Lawrence Berkeley National Lab, Berkeley, California, United States

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4:00 PM -
BREAK

4:30 PM - VV2.6
AFM-Raman-SNOM and Tip Enhanced Raman Studies of Modern Nanostructures.

Pavel Dorozhkin 1 , Alexey Shchokin 1 , Evgenii Kuznetsov 1 , Sergey Timofeev 1 , Bykov Victor 1
1 , NT-MDT Co., Zelenograd Moscow Russian Federation

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4:45 PM - VV2.7
Parallel Scanning Near-field Photolithography: The Snomipede.

Ehtsham Haq 1 4 , Zhuming Liu 2 , Yuan Zhang 3 , Shahrul Alang Ahmad 1 , Lu-Shin Wong 5 , Steven Armes 1 , Jamie Hobbs 1 4 , Graham Leggett 1 , Jason Micklefield 5 , Clive Roberts 2 , John Weaver 3
1 Department of Chemistry, University of Sheffield, Sheffield United Kingdom, 4 Department of Physics and Astronomy, University of Sheffield, Sheffield United Kingdom, 2 School of Pharmacy, University of Nottingham, Nottingham United Kingdom, 3 Department of Electronics and Electrical Engineering, University of Glasgow, Glasgow United Kingdom, 5 School of Chemistry & Manchester Interdisciplinary Biocentre, The University of Manchester, Manchester United Kingdom

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5:00 PM - VV2.8
Nano-scale Strain Mapping using Near-field Microscopy.

Antonio Llopis 1 , Arkadii Krokhin 1 , Sergio Pereira 2 , Arup Neogi 1
1 , Univ. of North Texas, Denton, Texas, United States, 2 CICECO, Univ. of Aveiro, Aveiro Portugal

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5:15 PM - VV2.9
Infrared Imaging Spectrometry in an Atomic Force Microscope.

Beomjin Kwon 1 , Matthew Schulmerich 2 , Laura Elgass 2 , Rong Kong 2 , Sarah Holton 2 , Rohit Bhargava 2 , William King 1
1 Mechanical Science and Engineering, University of Illinois Urbana-Champaign, Urbana, Illinois, United States, 2 Bioengineering, University of Illinois, Urbana, Illinois, United States

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5:30 PM - VV2.10
Multiprobe AFM Bio-Imaging: The Next Evolution in SPM.

Rimma Dichter 1 , Galina Fish 1 , Sofia Kokotov 1 , Hesham Taha 1 , David Lewis 1 , Aaron Lewis 2
1 , Nanonics Imaging Ltd., Jerusalem Israel, 2 Department of Applied Physics Selim and Rachel Benin School of Engineering and Computer Science, The Hebrew University of Jerusalem, Jerusalem Israel

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5:45 PM - VV2.11
Digital Pulsed Force Mode AFM and Confocal Raman Microscopy in Drug-eluting Coatings Research.

Greg Haugstad 1 , Klaus Wormuth 2
1 Characterization Facility, College of Sci/Eng, University of Minnesota, Minneapolis, Minnesota, United States, 2 , Surmodics, Inc., Eden Prairie, Minnesota, United States

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VV3: Poster Session: Electronic Measurements and Nanolithography
Session Chairs
Monday PM, November 29, 2010
Exhibition Hall D (Hynes)

9:00 PM - VV3.1
Quantifying the Inelastic and Elastic Scattering Lengths of Nanometer Thick Cu and Ag Films Using Ballistic Electron Emission Microscopy.

John Garramone 1 , Joseph Abel 1 , Ilona Sitnitsky 1 , Vincent LaBella 1
1 College of Nanoscale Science and Engineering, University at Albany, Albany, New York, United States

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9:00 PM - VV3.10
Electrical Properties of TiO2 Nanotube by Conducting-AFM.

Hyunjung Shin 1 , Myungjun Kim 1 , Changdeuck Bae 1
1 School of Advanced Materials Engineering, Kookmin Univ., Seoul Korea (the Republic of)

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9:00 PM - VV3.11
Nanoscale Polarization Switching across 180° Domain Wall in Barium Titanate.

Vasudeva Aravind 1 , Katyayani Seal 2 , Stephen Jesse 2 , Venkatraman Gopalan 3 , Sergei Kalinin 2
1 Physics, Clarion University, Clarion, Pennsylvania, United States, 2 , Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States, 3 , Pennsylvania State University, University Park, Pennsylvania, United States

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9:00 PM - VV3.12
Measurement of Piezoelectric Transverse and Longitudinal Displacement with Atomic Force Microscopy for PZT Thick Films.

Yuta Kashiwagi 1 2 , Takashi Iijima 2 , Toru Aiso 3 , Takashi Yamamoto 4 , Ken Nishida 4 , Hiroshi Funakubo 5 , Takashi Nakajima 1 , Soichiro Okamura 1
1 , Tokyo University of Science, Tokyo Japan, 2 , National Institute of Advanced Industrial Science and Technology , Tsukuba Japan, 3 , Toyo Corporation, Tokyo Japan, 4 , National Defense Academy, Yokosuka Japan, 5 , Tokyo Institute of Technology, Yokohama Japan

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9:00 PM - VV3.13
Scanning Electrochemical Microscope as an Etching Tool for a Direct ITO Patterning.

Federico Grisotto 1 , Romain Metaye 1 , Bruno Jousselme 1 , Serge Palacin 1 , Julienne Charlier 1 , Adina Morozan 1
1 Chemistry of Surfaces and Interfaces, CEA, Gif sur Yvette France

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9:00 PM - VV3.14
Control of Nanoparticle Deposition with Atomic Force Based Electrophoresis.

Talia Yeshua 1 , Mila Palchan 1 , Hesham Taha 2 , Aaron Lewis 1
1 Department of Applied Physics Selim and Rachel Benin School of Engineering and Computer Science, The Hebrew University of Jerusalem, Jerusalem Israel, 2 , Nanonics Imaging Ltd., Jerusalem Israel

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9:00 PM - VV3.15
Exploring Carbon Nanotubes as High Resolution Heat Probes for Scanning Thermal Microscopy.

Peter Tovee 1 , Manuel Pumarol 1 , Kevin Kjoller 2 , Oleg Kolosov 1
1 Physics, Lancaster University, Lancaster United Kingdom, 2 , Anasys Instruments, Santa Barbara, California, United States

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9:00 PM - VV3.2
Using Electric Force Microscopy to Study Surface Induced Fluctuations above Organic Materials - a Novel Measurement of Local Charge Mobility.

Nikolas Hoepker 1 , Showkat Yazdanian 1 , Roger Loring 1 , John Marohn 1
1 , Cornell University, Ithaca, New York, United States

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9:00 PM - VV3.3
Correlation of Structures and Surface Potential at Vanadyl Phthalocyanine / HOPG Interface.

Weiguang Xie 1 , Jin An 1 , Kun Xue 1 , Xi Wan 1 , Jun Du 1 , Jianbin Xu 1
1 Department of Electronic Engineering, Chinese University of Hong Kong, Hong Kong China

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9:00 PM - VV3.4
Mapping Conservative and Dissipative Magnetic Response of the Ordered Arrays of Ferromagnetic Nanostructures by the Band Excitation Magnetic Force Microscopy.

Senli Guo 1 , Stephen Jesse 1 2 , Nozomi Shirato 3 , Hare Krishna 4 5 , Anup Gangopadhyay 4 5 , Ramki Kalyanaraman 3 6 7 , Sergei Kalinin 1 2
1 CNMS, Oak Ridge National Lab, Oak Ridge, Tennessee, United States, 2 Materials Science and technology Division, Oak Ridge National Lab, Oak Ridge, Tennessee, United States, 3 Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee, United States, 4 Physics, University of Washington in St. Louis, St. Louis, Missouri, United States, 5 Center for materials Innovation, University of Washington in St. Louis, São João Del Rei , Minas Gerais, Brazil, 6 Chemical and Biomolecular Engineering, University of Tennessee, Knoxville, Tennessee, United States, 7 Sustainable Energy and Education Research Center, University of Tennessee, Knoxville, Tennessee, United States

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9:00 PM - VV3.5
Development of a Scanning Near-field Microwave Microscope for Localized Magnetic Resonance Measurements.

Christian Long 1 , Jonghee Lee 1 , Stephen Kitt 1 , Samuel Lofland 2 , Ichiro Takeuchi 1
1 , University of Maryland, College Park, Maryland, United States, 2 , Rowan University, Glassboro, New Jersey, United States

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9:00 PM - VV3.6
Development of Scanning Differential Potential Microscopy for Evaluation and Modeling of Electrical Contacts on Nanoscale Materials.

Seungbum Hong 1 , Alexandra Joshi-Imre 2 , Hongsik Park 3 , Bryan Huey 4
1 Materials Science Division, Argonne National Laboratory, Lemont, Illinois, United States, 2 Center for Nanoscale Materials, Argonne National Laboratory, Lemont, Illinois, United States, 3 Division of Engineering, Brown University, Providence, Rhode Island, United States, 4 Institute of Materials Science, University of Connecticut, Providence, Rhode Island, United States

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9:00 PM - VV3.7
Local Switching Characteristics near Macroscopic Defects in Ferroelectric Capacitors.

Amit Kumar 1 , Flavio Griggio 2 , Susan McKinstry 2 , Stephen Jesse 1 , Sergei Kalinin 1
1 CNMS, Oak Ridge National Lab, Oak Ridge, Tennessee, United States, 2 Materials Science and Eng., Pennsylvania State University, University Park, Pennsylvania, United States

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9:00 PM - VV3.8
Imaging Three-dimensional Polarization of Ferroelectric Domain Structures in PbTiO3 Nanotubes using Piezoresponse Force Microscopy.

Sunmi Moon 1 , Gir-eun Choi 1 , Yunseok Kim 2 , Changdeuck Bae 1 , Hyunjun Yoo 1 , Youngjin Yoon 1 , Jooho Moon 3 , Jang-Sik Lee 4 , Seungbum Hong 5 , Kwangsoo Ko 6 , Hyunjung Shin 1
1 National Research Lab. for Nanotubular Structures of Oxides, Center for Materials and Processes of Self-Assembly, and School of Advanced Materials Engineering, Kookmin University, Seoul Korea (the Republic of), 2 , Max Planck Institute of Microstructure Physics, Halle Germany, 3 Department of Materials Science and Engineering, Yonsei University, Seoul Korea (the Republic of), 4 Center for Materials and Processes of Self-Assembly, and School of Advanced Materials Engineering, Kookmin University, Seoul Korea (the Republic of), 5 Materials Science Division, Argonne National Laboratory, Argonne, Illinois, United States, 6 Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon Korea (the Republic of)

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9:00 PM - VV3.9
Comparison of Si-rich nitride and Silicon oxynitride in Si/Oxide/Nitride/Oxide/Si (SONOS) Memory Devices by Temperature-Variable Kelvin Probe Force Microscopy.

Wonsup Choi 1 , Hyunjun Yoo 1 , Changdeuck Bae 1 , Jooho Moon 2 , Jang-Sik Lee 1 , Hyunjung Shin 1
1 School of Advanced Materials Engineering, Kookmin University, Seoul Korea (the Republic of), 2 Department of Materials Science and Engineering, Yonsei University, Seoul Korea (the Republic of)

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2010-11-30   Show All Abstracts

Symposium Organizers

Bryan D. Huey University of Connecticut
Oleg V. Kolosov Lancaster University
Seungbum Hong Argonne National Laboratory
Hyunjung Shin Kookmin University
VV4: Thermal Measurements, Tribilogy, and Metrology
Session Chairs
Oleg Kolosov
Tuesday AM, November 30, 2010
Fairfax A (Sheraton)

9:00 AM - VV4.1
Nonlinear Interaction Imaging and Spectroscopy in Scanning Probe Microscopy.

Stephen Jesse 1 , Sergei Kalinin 1
1 Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge , Tennessee, United States

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9:15 AM - VV4.2
Cantilever Resonance Enhanced Photoacoustic Spectroscopic Microscopy with Mid-infrared Quantum Cascade Lasers.

Feng Lu 1 , Mikhail Belkin 1
1 Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas, United States

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9:30 AM - **VV4.3
Atomic Force Microscope Cantilever Based Nanoscale Heat Transfer Measurements.

Arvind Narayanaswamy 1 , Ning Gu 1 , Carlo Canetta 1
1 , Columbia University, New York, New York, United States

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10:00 AM - VV4.4
Scanning Thermal Microprobe for Thermal and Thermoelectric Characterization at Contact and Noncontact Mode.

Yanliang Zhang 1 , Eduardo Castillo 1 , Theodorian Borca-Tasciuc 1 , Rutvik Mehta 2 , Ganpati Ramanath 2
1 Department of Mechanical, Aerospace and Nuclear Engineering, Rensselaer Polytechnic Institute, Troy, New York, United States, 2 Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, New York, United States

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10:15 AM - VV4.5
Advancing Scanning Thermal Microscopy – Controlling Tip-surface Interaction via Non-contact and Vacuum Measurements.

Manuel Pumarol 1 , Peter Tovee 1 , Oleg Kolosov 1
1 Physics, Lancaster University, Lancaster United Kingdom

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10:30 AM - VV4.6
Transition Temperature Microscopy: A New Technique for Probing the Nanoscale Thermal Properties of Coatings and Multi-layer Films.

Khoren Sahagian 1 , Kevin Kjoller 1 , Lou Germinario 3 , William King 2 , Roshan Shetty 1
1 , Anasys Instruments, Santa Barbara, California, United States, 3 , LG Analytical, Kingsport, Tennessee, United States, 2 , University of Illinois, Urbana, Illinois, United States

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10:45 AM - VV4.7
Thermal Scanning Probe Lithography as a Tool for Spatially Controlled Highly Localized Nanoscale Chemical Surface Functionalization.

Joost Duvigneau 1 , H. Schoenherr 2 , G. Julius Vancso 1
1 , Twente University, Enschede Netherlands, 2 , Siegen University, Siegen Germany

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11:00 AM -
BREAK

11:30 AM - **VV4.8
Wear? Where? There! Seeing Atomic-scale Processes in Friction and Wear by Combining AFM and Electron Microscopy.

Robert Carpick 1 , Tevis D.B. Jacobs 2
1 Mechanical Engineering and Applied Mechanics, University of Pennsylvania, Philadelphia, Pennsylvania, United States, 2 Materials Science and Engineering, University of Pennsylvania, Philadelphia, Pennsylvania, United States

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12:00 PM - VV4.9
Elastic and Dissipative Shear Forces in AFM of Crystalline Organic Semiconductors.

Vivek Kalihari 2 , David Ellison 2 , Greg Haugstad 1 , C. Daniel Frisbie 2
2 Chemical Engineering & Materials Science, University of Minnesota, Minneapolis, Minnesota, United States, 1 Characterization Facility, College of Sci/Eng, University of Minnesota, Minneapolis, Minnesota, United States

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12:15 PM - VV4.10
Atomic Force Microscope Cantilevers for Quantitative Nanotribology.

Mark Reitsma 1 , Richard Gates 1 , Lawrence Friedman 1 , Robert Cook 1
1 Materials Science and Engineering Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland, United States

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12:30 PM - VV4.11
Circular Mode: A New AFM Mode for Investigating Surface Properties.

Olivier Noel 1 , Hussein Nasrallah 1 , Pierre-Emmanuel Mazeran 2
1 , University of Maine, Molecular Landscapes & Biophotonics Group, LPEC UMR 6087, Le Mans France, 2 , Mechanic of Surfaces Group, Laboratoire Roberval, UMR 6253 , Compiègne France

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12:45 PM - VV4.12
High Speed Nanometrology.

Jamie Hobbs 1 , Andrew Humphris 2 , Jeremy Howard-Knight 1 , Bin Zhao 2 1 , Priyanka Kohli 2 , David Catto 2
1 Department of Physics and Astronomy, University of Sheffield, Sheffield United Kingdom, 2 , Infinitesima Ltd, Oxford United Kingdom

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