2019 MRS Fall Meeting & Exhibit

Call for Papers

Submit an Abstract
Deadline June 13, 2019, 11:59 pm (ET)

Symposium MT05—Emerging Prospects and Capabilities in Focused Ion-Beam Technologies and Applications

Focused ion-beam (FIB) based tools have become invaluable in materials science and engineering for their capabilities in micro-/nanofabrication, imaging and spectroscopy. Source types include Liquid Metal Ion Sources (LMIS), Gas Field Ionization Sources (GFIS), plasma ion sources and laser-cooled sources, offering an ever increasing choice of focused ion species for a wide range of applications. Modification of materials by direct-write nanofabrication using milling, deposition and implantation is employed extensively in both industry and academia. Novel in-situ combinatorial techniques present new routes for exploring and quantifying materials at the nanoscale, for example through coupling to Secondary Ion Mass Spectrometry (SIMS); and through correlative imaging using ion, electron, light and x-ray based techniques, culminating in truly interdisciplinary work. This symposium aims to provide a forum for exchange on a variety of emerging technologies and applications in this area.

A broad range of topics will be addressed, with particular focus on recent technological advancements, concepts for novel ion sources, frontiers in nanofabrication, direct-write atomic and chemical disordering, in-situ platforms (e.g. heating, environmental cells), in-situ multimodal analysis, slice-and-image tomography and correlative microscopy, advances in computational techniques for data analysis, and novel simulation codes. Reflecting the interdisciplinary nature of this field, results pertaining to a wide variety of materials, including 2D materials, semiconductors, superconductors, ferroelectric and magnetic materials, polymers, and biological samples will be presented and discussed.

Topics will include:

  • Frontiers in nanofabrication
  • Localized property engineering and irradiation effects
  • FIB-based analytics: Correlative imaging and multimodal analysis
  • FIB-based solutions for biological materials
  • FIB applications in electronics
  • In-situ FIB platforms
  • Novel ion sources
  • Computational techniques
  • A tutorial complementing this symposium is tentatively planned.

Invited Speakers:

  • Ed Bielejec (Sandia National Laboratories, USA)
  • Rosa Córdoba (University of Valencia, Spain)
  • Anne Delobbe (Orsay Physics, France)
  • Jason Fowlkes (Oak Ridge National Laboratory, USA)
  • Jacques Gierak (University of Paris-Saclay, France)
  • Christelle Guillermier (Carl Zeiss, USA)
  • Songkil Kim (Pusan National University, Republic of Korea)
  • Lasse Kling (Helmholtz Zentrum Berlin for Materials and Energy, Germany)
  • Arkady Krasheninnikov (Helmholtz-Zentrum Dresden-Rossendorf, Germany)
  • Hao Li (University of California, Riverside, USA)
  • Lane Martin (University of California, Berkeley, USA)
  • Paul Mazarov (Raith, Germany)
  • Johann Michler (Swiss Federal Laboratories for Materials Science and Technology, Switzerland)
  • Olga Ovchinnikova (Oak Ridge National Laboratory, USA)
  • Mike Phaneuf (Fibics Inc., Canada)
  • Miroslava Schaffer (Max Planck Institute of Biochemistry, Germany)
  • Keana Scott (National Institute of Standards and Technology, USA)
  • Andrew Smith (Kleindiek, Germany)
  • John Thong (National University of Singapore, Singapore)
  • Tom Wirtz (Luxembourg Institute of Science and Technology, Luxembourg)
  • Hongzhou Zhang (Trinity College Dublin, Ireland)

Symposium Organizers

Frances Allen
University of California, Berkeley

Alex Belianinov
Oak Ridge National Laboratory
865-574-8408, belianinova@ornl.gov

Silke Christiansen
Helmholtz Zentrum Berlin für Materialien und Energie

Shane Cybart
University of California, Riverside
951-827-5448, shane.cybart@ucr.edu