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Call for Papers

Abstracts were due June 15, 2020.

Symposium F.MT02—Multimodal, Functional and Smart Scanning Probe Microscopies for Characterization and Fabrication

Research aimed at understanding the spatially distinct chemical and physical makeup and dynamic processes ongoing at solid-solid, solid-liquid, and solid-gas interfaces is central to accelerating major advances in areas including energy, national security and microbiology research. The goal of this symposium is to bring together pioneers of various advanced scanning probe microscopies (SPM) that are pushing the limits of spatial, chemical and temporal resolution, and breadth of what is measurable in material sciences with the aim of building a more coherent picture of material functionality at the defining length- and time- scales. Advances in SPMs as multifunctional tools for nanoscale studies have by their nature lead to multimodal and ultrasensitive characterization measurements that allow to isolate a myriad of functional properties of surfaces simultaneously or in a correlative manner. This has been achieved in two ways: the in-situ combination of SPMs with other analytical measurement techniques and the enhancement of the resolution of spectroscopy measurements, allowing to dissect among the selective contribution of the different physical and chemical interactions ubiquitously present at the nanoscale. This symposia will focus on topics that that highlight combining high resolution SPM measurements with correlative, chemical, electrochemical and photonic measurements of novel materials as advanced characterization techniques, while also considering advances in nanolithographic fabrication techniques using photon, electron or ion beams and/or local scanning probes to transfer energy, material or induce localized chemical reactions. Emphasis will also be placed on advances in scanning probe force measurements and mapping exploiting novel tip-sample interactions, improved detection sensitivity and widening of circumstances under which they are applied continue to push the frontier in the measurement of a broad range of material, chemical and biological systems. Particular attention will be given to advances and applications in novel approaches to force detection and techniques for probing a variety of surfaces and interactions. In addition, a unifying theme will involve data analytics and machine learning to correlate multimodal data channels.

Topics will include:

  • Multimodal probe characterization of advanced materials
  • Correlative microscopy, tip-enhanced combined optical and atomic force microscopies
  • Advances in SPM and related instrumentation with a focus on correlative microscopy on novel materials
  • Data analytic and machine learning/AI approaches to improve data interpretation and acquisition
  • High resolution chemical imaging including mass spectrometry, XPS, Raman and infra-red spectroscopies
  • Quantitative measurements of functional materials including ferroelectrics, piezoelectrics and energy storage and generation materials
  • High resolution nanomechanical measurements
  • Advances in scanning probe force spectroscopy for chemical recognition
  • Advances in cantilever and probe design for functional probing
  • Advances in SPM in liquid environment for biomaterials studies
  • Atomic scale manipulation and nanolithographic fabrication

Invited Speakers:

  • Josh Agar (Lehigh University, USA)
  • Hanna Cho (The Ohio State University, USA)
  • Sonia Contera (Oxford University, United Kingdom)
  • James De Yoreo (Pacific Northwest National Laboratory, USA)
  • Georg Fantner (École Polytechnique Fédérale de Lausanne, Switzerland)
  • David Ginger (University of Washington, USA)
  • Gabriel Gomila (Institute for Bioengineering of Catalonia, Spain)
  • Seungbum Hong (Korea Advanced Institute of Technology, Republic of Korea)
  • Anton Ievlev (Oak Ridge National Laboratory, USA)
  • Stephen Jesse (Oak Ridge National Lab, USA)
  • Yunseok Kim (Sungkyunkwan University, Republic of Korea)
  • Christine Kranz (Ulm University, Germany)
  • Jiangyu Li (University of Washington, USA)
  • Markus Raschke (University of Colorado Boulder, USA)
  • Elisa Reido (New York University, USA)
  • Kislon Voitchovsky (Durham University, United Kingdom)

Symposium Organizers

Olga Ovchinnikova
Oak Ridge National Laboratory
(865) 574-4871, ovchinnikovo@ornl.gov

Neus Domingo
Institut Català de Nanociència i Nanotecnologia
+34 937373617, neus.domingo@icn2.cat

Ricardo Garcia
Instituto de Ciencia de Materiales de Madrid
34-913349068, r.garcia@csic.es

Roger Proksch
Oxford Instruments Asylum Research
(805) 451-2833, roger.proksch@oxinst.com