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Call for Papers

Abstracts were due June 15, 2020.

Symposium F.MT03-Frontiers of Imaging and Spectroscopy in Electron Microscopy

Following the rapid developments in aberration correction electron optics in the early years of this century, sub-ångström spatial resolution in scanning transmission electron microscopy (S/TEM) and spectroscopy is now routinely enabling thorough investigations of how defective or locally variable atomic structures lead to new exiting physical and chemical properties.

Far from standing still, the field is now seeing further remarkable progress at the frontiers of electron spectro-microscopy. New monochromator technology has significantly improved the energy-resolution of the electron source to values of the order of few millielectronvolts. This high energy resolution provides a step-change in the possible uses of electron energy-loss spectroscopy, opening the door to vibrational spectroscopy of materials at or near atomic resolution. Additionally, the performance of detection systems e.g.direct electron cameras, has improved to the point where ‘4D-STEM’ (used here as a generic term encompassing numerous techniques such as differential phase contrast and electron Ptychography) adds to the already rich list of signals available in an electron microscope a real-time means of probing physical properties such as charge distributions and magnetic domains at a sub-ångström resolution that was not feasible before.

As many of these novel techniques are undergoing rapid development and improvements, this symposium intends to bring together researchers from a variety of scientific fields to discuss how further methodological and technical advances in microscopy can meet specific application needs. The primary aim of this symposium is thus to foster collaborative research efforts between the microscopy community and associated interdisciplinary materials fields such that new microscopy techniques can be delivered in a timely and applicable manner to accelerate the design and developments of novel functional materials and devices.

This symposium will focus on the development, advancement and applications of novel microscopy techniques, with an emphasis on revealing materials’ functionalities by developing or implementing new imaging, spectroscopy, diffraction, and in-situ techniques. The integration between microscopy, big data analytics, theoretical simulations and calculations will also be highlighted.

Topics will include:

  • Electromagnetic field imaging (4D STEM, Ptychography, DPC, Holography)
  • Electron tomography or other 3D imaging and spectroscopy
  • In-situ, operando and cryogenic microscopy for materials (heating, cooling, gas, liquid)
  • Phonon vibrational & valence spectroscopy
  • Electron magnetic circular dichroism in EELS towards magnetic spectroscopy
  • Applications for energy-related (battery, fuel cell, catalytic) and quantum materials (2D materials, multi-ferroic)
  • Smart data acquisition towards low dose and sparse sampling
  • Data analysis and mining to generate databases of existing microscopy image and spectra
  • Theoretical modeling and image/spectroscopy simulations
  • New developments in spectroscopy, low-energy focused ion beam (FIB) and scanning electron microscopies
  • In-situ characterization by advanced imaging and spectroscopy technologies

Invited Speakers:

  • Peter Crozier (Arizona State University, USA)
  • Rafael E. Dunin-Borkowski (Ernst Ruska Center, Germany)
  • Joanne Etheridge (Monash University, Australia)
  • Jordan Hachtel (Oak Ridge National Laboratory, USA)
  • Fredrik Hage (SuperSTEM, United Kingdom)
  • Stig Helveg (Denmark Technical University, Denmark)
  • Katherine L. Jungjohann (Sandia National Laboratories, USA)
  • Christoph Koch (Humboldt-Universität zu Berlin, Germany)
  • Dongsheng Li (Pacific Northwest National Laboratory, USA)
  • Sophie Meuret (CEMES/CNRS, France)
  • Colin Ophus (Lawrence Berkeley National Laboratory, USA)
  • Joe Patterson (University of California, Irvine, USA)
  • Charadutta Phatak (Argonne National Laboratory, USA)
  • Jan Rusz (Uppsala University, Sweden)
  • Ryosuke Senga (National Institute of Advanced Industrial Science and Technology, Japan)
  • Naoya Shibata (The University of Tokyo, Japan)
  • Toma Susi (University of Vienna, Germany)
  • Luiz Tizei (Centre National de la Recherche Scientifique, France)
  • Sandra Van Aert (University of Antwerp, Belgium)

Symposium Organizers

Quentin Ramasse
SuperSTEM
United Kingdom
44-0-1925-864-907, qmramasse@superstem.org

Robert Klie
University of Illinois at Chicago
USA
312-996-6064, rfklie@uic.edu

Miaofang Chi
Oak Ridge National Laboratory
USA
865-241-4284, chim@ornl.gov

Ryo Ishikawa
University of Tokyo
Japan