2021 MRS Spring Meeting

Virtual Exhibitor Workshop

Nanomechanical Characterization Using PinPoint™ for Atomic Force Microscopy Applications | Park Systems

Access all of the Meeting content through May 31
at https://mrs2021.cd.pathable.com/.



Monday, April 19
10:00 am – 10:15 am ET

 

Armondo Melgarejo

Armando Melgarejo, Park Systems Inc.

Why use PinPointTM Nanomechanical mode? PinPointTM is an advance imaging mode developed by Park Systems, that acquires high-resolution topography and F/D data at each pixel of the entire scan area. With PinPointTM mode, quantitative nanomechanical properties (i.e., modulus, adhesion, topography) can be obtained all at once. This presentation will cover PinPoint’sTM operation principle and the acquisition of nanomechanical properties through this method will be demonstrated using a Park Systems NX10 AFM.

 

 

 

 

Park Systems Inc. - Nanomechanical Characterization using PinPointTM for Atomic Force Microscopy Applications

Publishing Alliance

MRS publishes with Springer Nature

 

Corporate Partners

   

Symposium Support