A Nanoscale Chemical View of Stretchable Electronics
Submitted by Nathaniel Prine
The University of Southern Mississippi
A
self-healing, stretchable semiconductor composite composed of a
conjugated polymer blended with a butyl rubber elastomer is measured
using atomic-force microscopy paired with infrared spectroscopy
(AFM-IR). As a scanning probe technique, AFM-IR measures both the
surface topography and chemical composition of materials by exciting
unique chemical bond vibrations of each component and probing the
response at each scan location. In this image, the identity and
distribution of each component in the blend is resolved; red and
green-highlighted areas indicate the presence of conjugated polymer and
butyl rubber elastomer, respectively. The conjugated polymer forms a
thick web surrounded by disconnected segments of butyl rubber elastomer.
The information gathered from this image provides valuable
morphological information that will be used to further research towards
stretchable electronics.