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Call for Papers

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Deadline: October 28, 2021, 11:59 pm EDT

Symposium CH03—Advances in In Situ and Operando TEM Methods for the Study of Dynamic Processes in Materials

Joint symposium with MRS-Singapore

There has been significant interest in the dynamic processes of smart energy materials and devices, where the properties can be controlled by an external stimulus. The possibility for example to manipulate the electronic band structure, magnetic spin and catalytic properties of such materials opens a plethora of new applications. The nature of these dynamic materials requires operando microscopy techniques to characterize their physical properties while simultaneously measuring their functional performance. Recent technological and computational advances in transmission electron microscopy are transforming what dynamic material science processes and phase changes can be explored. The focus of this symposium is on the application of in situ/operando TEM techniques that include heating, biasing, cooling, magnetic fields and mechanical testing to induce and probe phase transitions in functional materials and devices at the nanoscale that, in synergy with theoretical methods, such as first-principles calculations, phase-field, micromagnetics, finite-element based modelling and simulations, help unravel the structure and properties of materials down to the atomic scale. Furthermore, as data collection, analysis and recording of dynamic information is becoming increasingly demanding, we also welcome contributions in computer-aided image analysis and big data processing, including based on artificial intelligence algorithms, to understand the fundamental physics governing the nano- to atomic-scale phase transitions of functional materials and devices.

Topics will include:

  • Phase transitions and dynamic process
  • In situ TEM capabilities (eg. heating, cooling, ion irradiation, mechanical testing
  • Operando TEM capabilities (eg. biasing, magnetic fields, environments)
  • Advancements in in situ holders (eg. cryogenic, vacuum transfer)
  • Sample preparation techniques for in situ/operando and TEM experimentations
  • Combination with advanced TEM techniques (phase related, spectroscopy, 4D-STEM)
  • Synergies with theoretical methods and data science
  • Computer-aided image analysis (including AI for EM) for quantitative studies
  • Controlled electron-beam-induced transitions

Invited Speakers (tentative):

  • Trevor Almeida (Commissariat à l’énergie atomique et aux énergies alternatives, France)
  • Judy Cha (Yale University, USA)
  • Miaofang Chi (Oak Ridge National Laboratory, USA)
  • Michele Conroy (Imperial College London, United Kingdom)
  • Jennifer Cookman (University of Limerick, Ireland)
  • Peter Cozier (Arizona State University, USA)
  • Arnaud Demortiere (Université de Picardie Jules Verne, France)
  • Thierry Epicier (Université de Lyon, France)
  • Christoph Gammer (The Austrian Academy of Sciences, Austria)
  • Sang Ho Oh (Sungkyunkwan University, Republic of Korea)
  • Djamel Kaoumi (North Carolina State University, USA)
  • Lena Kourkoutis (Cornell University, USA)
  • Kristian Mølhave (Technical University of Denmark, Denmark)
  • Dane Morgan (University of Wisconsin–Madison, USA)
  • Colin Ophus (Lawrence Berkeley National Laboratory, USA)
  • Christopher Regan (University of California, Los Angeles, USA)
  • Yukio Sato (Kyushu University, Japan)
  • Kiyou Shibata (The University of Tokyo, Japan)
  • Erdmann Spiecker (Friedrich-Alexander-Universität Erlangen-Nürnberg, Germany)
  • Mitra Taheri (Johns Hopkins University, USA)
  • Vasiliki Tileli (École Polytechnique Fédérale de Lausanne, Switzerland)
  • Yang Yang (The Pennsylvania State University, USA)
  • Qian Yu (Zhejiang University, China)

Symposium Organizers

Leopoldo Molina-Luna
Darmstadt University of Technology
Germany

Ursel Bangert
University of Limerick
Department of Physics
Ireland

Martial Duchamp
Nanyang Technological University
School of Materials Science and Engineering (MSE)
Singapore

Andrew Minor
University of California-Berkeley & Lawrence Berkeley National Laboratory
Department of Materials Science and Engineering & NCEM/MF
USA

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