Instructors: Matthew Reese, National Renewable Energy Laboratory; Laura Schelhas, National Renewable Energy Laboratory; Jian V. Li, Air Force Research Laboratory; Azimuth Corporation; Arthur Onno; Arizona State University, PV Evolution Labs
This tutorial is intended for young researchers (students and post-graduates within 3 years of degree completion) who are active in the field of thin-film solar cells and would like to learn more about some of the fundamental characterization methods that are being used in research and development of these materials and devices. All presentations will be given by experienced researchers who are active in the characterization of Si-, III-V-, chalcogenide-, kesterite-, perovskite-, or other novel material based solar cells. Although these materials will be discussed as model systems, the presentations will primarily focus on the characterization techniques and thus should be of interest to participants from other symposia as well.
(1) understand primary PV device metrics (Voc, Jsc, FF, Efficiency) and how they relate to macro level device properties and measurement conditions.
(2) understand secondary voltage metrics and how they are related to luminescence techniques and semiconductor material properties.
(3) understand what secondary device metrics and material properties can be extracted from capacitance techniques.
(4) understand the material and device properties that can be extracted using beamline measurements in comparison to other more common/conventional measurements.
(5) knowledge of additional resources (e.g., articles, books, and experts) related to characterization methods discussed.
1-sun Thin-film PV Device Characterization
Matthew Reese, National Renewable Energy Laboratory
Luminescence and Characteristic Voltages
Capacitance Based Characterizations
Jian V. Li, Air Force Research Laboratory; Azimuth Corporation
Beamline Techniques for PV Materials Characterization
Laura Schelhas, National Renewable Energy Laboratory