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Call for Papers

Symposium CM1—New Frontiers in Aberration Corrected Transmission Electron Microscopy

With the commercial availability of correctors for the spherical and chromatic aberrations of the imaging lenses in transmission and scanning transmission electron microscopes in the last 16 years, during which the focus has been mainly on installation, characterisation and testing of this new hardware and software, the focus now needs to shift towards new areas of science that can be addressed with this novel equipment.

This symposium intends to bring together researchers from different scientific fields discussing their needs for better resolved, faster and more controlled experimental materials studies to be conducted in aberration corrected (scanning) transmission electron microscopes.

This will include imaging, spectroscopy and diffraction based applications to materials science problems with planar and focused illumination.

Topics will include:

  • Electron diffraction from smaller volumes
  • New specimen holders for in-situ chemical experiments
  • Applications of sub-Å resolved imaging in materials science, physics and chemistry
  • Spectroscopy with more intense or highly monochromated electron beams
  • Planar illumination TEM vs. fast STEM with intensely focused beams
  • Investigation of electron beam damage mechanisms at higher doses
  • New specimen holders with integrated detectors and functionality
  • Towards time-resolved measurements with pulsed emitters and faster detectors

Invited Speakers:

  • S Van Aert (University of Antwerp, Belgium)
  • LJ Allen (University of Melbourne, Australia)
  • PM Batson (Rutgers University, USA)
  • GA Botton (McMaster University, Canada)
  • E Boyes (University of York, United Kingdom)
  • R Erni (EMPA, Switzerland)
  • M Haider (CEOS GmbH, Germany)
  • L Houben (Weizmann Institute of Science, Israel)
  • OL Krivanek (NION Co., USA)
  • J Lebeau (North Carolina State University, USA)
  • I MacLaren (University of Glasgow, United Kingdom)
  • DA Muller (Cornell University, USA)
  • DJ Smith (Arizona State University, USA)
  • E Snoeck (CEMES, CNRS Toulouse, France)
  • V Srot (Max-Planck Institute for Solid State Research, Germany)
  • S Stemmer (University of California, Santa Barbara, USA)
  • S Takeda (Osaka University, Japan)

Symposium Organizers

Thomas Walther
University of Sheffield
Electronic and Electrical Engineering
United Kingdom
44-114-222-5891, t.walther@sheffield.ac.uk

Rafal E Dunin-Borkowski
Research Centre Jülich
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons
Germany
49-2461-61-9297, rdb@fz-juelich.de

Jean-Luc Rouviere
CEA Grenoble
INAC/SP2M
France
33-4-38-78-50-86, jean-luc.rouviere@cea.fr

Masashi Watanabe
University of California, Berkeley
Materials Science and Engineering
USA