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Tutorial CM1: Aberration-Corrected (Scanning) Transmission Electron Microscopy

Monday, March 28, 2016
2:30 PM - 5:00 PM
PCC North, 100 Level, Room 122 C

Part I: Aberration Correction in Transmission Electron Microscopy

This segment will also include the benefits and potential pitfalls related to aberration correction with various applications.

Part II: Quantitative Evaluation of Images Obtained in Scanning Transmission Electron Microscopy

This segment will demonstrate a software package for quantification developed by instructor Sandra Van Aert's group.

Both aberration correction technologies are still new to the fields. Since there are potential pitfalls, researchers should be aware of them when these latest instruments are used. In addition, it is always very important to evaluate experimental data quantitatively. Images obtained from scanning transmission electron microscopy approaches can now be quantified. There are always appropriate strategies for quantification.


David J. Smith, Arizona State University
Sandra Van Aert, University of Antwerp