Instructors: Colin Ophus, Lawrence Berkeley National Laboratory; Yao Yang, Cornell University; Steven Zeltmann, Cornell University; Stephanie Ribet, Northwestern University

With the introduction of extremely high speed direct electron detectors, a full image of the diffracted electron probe at each position can be collected, producing a four-dimensional dataset (a 4D-STEM experiment). The overall objectives of this tutorial is for researchers, who are not familiar with this technique, to be able to conduct the experiments, process/analyze the data, and utilize the technique to their research. Specifically, the researchers will learn the fundamental principles of 4D-STEM, experimental procedures, factors that affect the accuracy of the results, data processing, simulation methods, challenges, and opportunities created by 4D-STEM.