In order to promote careful uncertainty analysis in the scientific literature, NIST will sponsor a student award for an oral or poster presentation at the 63rd Electronic Materials Conference in which a major quantitative result is accompanied by an uncertainty analysis.
Deadline has passed
Resources for Uncertainty Analysis Poster (PDF)
Any full-time student with an accepted talk or poster at the EMC Conference, enrolled as a student in an accredited university at the time of the abstract submission. Student must attend the conference, make the presentation and include the uncertainty values in their presentation. Degree program is not constrained (could be Ph.D., masters or undergraduate). Postdoctoral fellows are not eligible. Students working on a NIST site or with NIST graduate support are also not eligible.
Application PDF | Word
Example Application PDF | Word
Submit completed applications to email@example.com.
Students are encouraged to consult NIST Technical Publication 1297 (available as a free download).
A small team of NIST scientists will evaluate the applications. Supplements will be evaluated on:
- Uncertainty analysis technique (50 pts): Is propagation of error done correctly? Are there sufficient statistics?
- Clarity of presentation (20 pts): Is the measurement and analysis described clearly? Is the application legible? Are the number of significant digits included consistent with the uncertainty values?
- Complexity of analysis (30 pts): Are multiple variables analyzed? Are systematic errors considered?