Rump Session

What Makes a Good Device Paper and How do you Measure its Impact?


  • Eilam Yalon, Technion–Israel Institute of Technology
  • Cezar Zota, IBM Research-Zurich


  • Aaron Franklin, Duke University
  • Azad Naeemi, Georgia Institute of Technology
  • Becky (R.L.) Peterson, University of Michigan
  • Curt Richter, National Institute of Standards and Technology
  • Mark Rodwell, University of California, Santa Barbara