Meetings & Events

MRS Fall 2009 Meeting Logo

2009 MRS Fall Meeting & Exhibit

November 30 - December 4, 2009 | Boston
Meeting Chairs
: Kristi Anseth, Li-Chyong Chen, Peter Gumbsch, Ji-Cheng Zhao

Symposium NN : Advanced Microscopy and Spectroscopy Techniques for Imaging Materials with High Spatial Resolution

2009-11-30   Show All Abstracts

Symposium Organizers

Manfred Ruehle Max-Planck-Institute for Metals Research
Larry Allard Oak Ridge National Laboratory
Joanne Etheridge Monash University
David Seidman Northwestern University
NN1: Overviews and Techniques
Session Chairs
Manfred Ruehle
Monday AM, November 30, 2009
Room 204 (Hynes)

9:30 AM - **NN1.1
Correlating Atomic and Nanoscale 3D Structure and Chemistry by Aberration Corrected STEM, Electron Tomography and Atom Probe Tomography.

Matthew Weyland 1 2 , Xiang-Yuan Xiong 1 2 , Jasmine Shih 2 3 , Barry Muddle 3
1 Monash Centre for Electron Microscopy, Monash University, Clayton, Victoria, Australia, 2 Materials Engineering, Monash University, Clayton, Victoria, Australia, 3 ARC Centre of Excellence of Design in Light Metals, Monash University, Clayton, Victoria, Australia

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10:00 AM - **NN1.2
High-Precision Atomic Resolution Measurements by Aberration-Corrected Transmission Electron Microscopy.

Knut Urban 1
1 Solid State Research, Research Center Juelich, Juelich Germany

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10:30 AM - **NN1.3
On the Many Advances in Laser Pulsing of Atom Probe Tomographs.

Thomas Kelly 1
1 , Imago Scientific Instruments Corporation, Madison, Wisconsin, United States

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11:00 AM -
BREAK

11:30 AM - NN1.4
Quantitative Scanning Transmission Electron Microscopy.

James LeBeau 1 , Scott Findlay 2 , Xiqu Wang 3 , Allan Jacobson 3 , Leslie Allen 4 , Susanne Stemmer 1
1 Materials Department, University of California, Santa Barbara, California, United States, 2 Institute of Engineering Innovation, The University of Tokyo, Tokyo, 113-8656, Japan, 3 Department of Chemistry, University of Houston, Houston, Texas, United States, 4 School of Physics, University of Melbourne, Melbourne, Victoria, Australia

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11:45 AM - NN1.5
Imaging the Real Space Intensity Distribution of a Sub-Ångström Electron Probe after Scattering by a Crystal.

Sorin Lazar 1 2 , Gianluigi Botton 2 , Joanne Etheridge 3
1 , FEI Electron Optics, 5600 KA Eindhoven Netherlands, 2 Canadian Centre for Electron Microscopy, Dept of Materials Science and Engineering, Brockhouse Institute for Materials Research, McMaster University, Hamilton, L8S 4M1, Ontario, Canada, 3 Monash Centre for Electron Microscopy and Dept of Materials Engineering, Monash University, 3800, Victoria, Australia

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12:00 PM - NN1.6
Theoretical Analysis and Applications of Annular Bright Field Scanning Transmission Electron Microscopy Imaging.

Scott Findlay 1 , Naoya Shibata 1 2 , Hidetaka Sawada 3 , Eiji Okunishi 3 , Yukihito Kondo 3 , Takahisa Yamamoto 1 4 , Yuichi Ikuhara 1 4 5
1 , The University of Tokyo, Tokyo Japan, 2 , PRESTO, Japan Science and Technology Agency, Saitama Japan, 3 , JEOL Ltd., Tokyo Japan, 4 , Japan Fine Ceramic Center, Nagoya Japan, 5 , Tohoku University, Sendai Japan

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12:15 PM - NN1.7
Atomic Size Mismatch Strain Induced Reversed ADF-STEM Image Contrast Between Semiconductor Hetero-epitaxial Layers and Substrates.

Xiaohua Wu 1 , Jean-Marc Baribeau 1 , James Gupta 1
1 Institute for Microstructural Sciences, National Research Council Canada, Ottawa, Ontario, Canada

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12:30 PM - NN1.8
Crystallographic Analysis of a Precipitate Phase in Ni30Pt20Ti50 Shape Memory Alloys.

Libor Kovarik 1 , Fan Yang 1 , Anita Garg 2 , Ronald Noebe 2 , David Diercks 3 , Michael Kaufman 4 , Michael Mills 1
1 , The Ohio State University, Columbus, Ohio, United States, 2 , NASA Glenn Research Center, Cleveland, Ohio, United States, 3 , University of North Texas, Denton, Texas, United States, 4 , Colorado School of Mines, Golden, Colorado, United States

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12:45 PM - NN1.9
Combined TEM and APT Characterization of Nano-structured Ferritic Alloys.

James Bentley 1 , M. Miller 1 , D. Hoelzer 1
1 Materials Science & Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States

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NN2: Instrumentation
Session Chairs
David Seidman
Monday PM, November 30, 2009
Room 204 (Hynes)

2:30 PM - **NN2.1
A Review of the TEAM Project at its Transition from the Development Phase to a Research Facility.

Ulrich Dahmen 1
1 National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, California, United States

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3:00 PM - **NN2.2
Hitachi HD2700, a Dedicated High Spatial Resolution STEM for Materials Research.

Yimei Zhu 1 , Hiromi Inada 2 1 , Lijun Wu 1 , Dong Su 1 , Joe Wall 1
1 , Brookhaven National Laboratory, Upton , New York, United States, 2 , Hitachi High Technologies Corp.,, Ibaraki Japan

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3:30 PM - **NN2.3
State-of-the-Art Atom Probe Tomography.

Michael Miller 1 , Kaye Russell 1
1 MSTD, Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States

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4:00 PM -
BREAK

4:30 PM - NN2.4
Benefits of Cc-Corrected Imaging for High-Resolution and Energy-Filtered TEM.

Bernd Kabius 1 , Peter Hartel 2 , Maximilian Haider 2 , Heiko Mueller 2 , Stephan Uhlemann 2 , Ulrich Loebau 2 , Joachim Zach 2 , Goetz Hofhaus 1 , Irene Wacker 4 , Rasmus Schroeder 3
1 Material Science Division, Argonne National Laboratory, Argonne, Illinois, United States, 2 , CEOS GmbH, Heidelberg Germany, 4 , Forschungszentrum Karlsruhe, Eggenstein-Leopoldshafen Germany, 3 CellNetworks, Heidelberg University, INF 267, Heidelberg Germany

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4:45 PM - NN2.5
Using Imaging Cs-Correctors to Optimize Image Contrast: What are The Best Settings for, e.g., Graphene at 80kV and Why?

Edgar Voelkl 1 , Young-Chung Wang 1 , Bin Jiang 1 , Lianfeng Fu 1 , Jan Ringnalda 1 , Feng Shen 1 , Dong Tang 2
1 , FEI Company, Hillsboro, Oregon, United States, 2 , FEI Company, Einhoven Netherlands

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5:00 PM - NN2.6
Development of Multi-functional Analytical Environmental TEM and its Application.

Toshie Yaguchi 1 , Akira Watabe 1 , Yasuhira Nagakubo 1 , Takafumi Yotsuji 1 , Kazutoshi Kaji 1 , Takeo Kamino 1
1 , Hitachi High-Technologies Corporation, Hitachinaka-shi Japan

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5:15 PM - NN2.7
Correlative STEM at the Atomic Scale: The Ultimate Materials Analysis Tool.

David Bell 1 4 , Stephan Irsen 2 , Richard Schillinger 3 , Stefan Meyer 3
1 School of Enginnering and Applied Sciences, Harvard University, Cambridge, Massachusetts, United States, 4 Center for Nanoscale Systems, Harvard University, Cambridge, Massachusetts, United States, 2 , Forschungszentrum Caesar, Bonn Germany, 3 Carl Zeiss NTS GmbH, Carl Zeiss SMT, Oberkochen Germany

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5:30 PM - NN2.8
On the Relation between Probe Size and Image Resolution in the Helium Ion Microscope.

Larry Scipioni 1
1 , Carl Zeiss SMT, Inc., Peabody, Massachusetts, United States

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5:45 PM - NN2.9
Laser-assisted Atom Probe Analysis of Bulk Ceramics.

Tadakatsu Ohkubo 1 , Yimeng Chen 2 , Masaya Kodzuka 2 , Koji Morita 1 , Kazuhiro Hono 1 2
1 , National Institute for Materials Science, Tsukuba Japan, 2 Graduate School of Pure and Applied Sciences, University of Tsukuba, Tsukuba Japan

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NN3: Poster Session
Session Chairs
Manfred Ruehle
Winfried Sigle
Monday PM, November 30, 2009
Exhibit Hall D (Hynes)

9:00 PM - NN3.1
The Advantages and Limitations of FIB-Based Specimen Preparation for Atom Probe Tomography.

Kaye Russell 1 , Michael Miller 1
1 MSTD, Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States

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9:00 PM - NN3.10
Strain Relaxation in Planar InAs Epitaxial Layers Studied by High-Resolution Transmission Electron Microscopy.

Krishnamurthy Mahalingam 1 , Kurt Eyink 1 , Marlon Twyman 1 , Jodi Shoaf 1 , Larry Grazulis 1
1 , Air Force Research Laboratory, Wright-Patterson AFB, Ohio, United States

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9:00 PM - NN3.11
Transmission Electron Microscopy Observation on Hydrothermally-treated Aluminum Film in Ultrapure Water.

Yusuke Hosoki 1 , Junichi Shimanuki 2 , Zhiyoug Qiu 1 , Takashi Ishiguro 1
1 Materials Science and Technology, Tokyo Univercity of Science, Noda Chiba Japan, 2 , NISSAN ARC, Co. Ltd., Yokosuka Kanagawa Japan

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9:00 PM - NN3.12
Aberration-Corrected HRTEM Analysis of Transition Structure in Phase Boundary of ZrO2 Ultra-Thin Film.

Takanori Kiguchi 1 2 , Toyohiko Konno 1 2 , Naoki Wakiya 3 , Kazuo Shinozaki 4
1 Institute for Materials Research, Tohoku University, Sendai, Miyagi, Japan, 2 Center for Integrated NanoTechnology Support, Tohoku University, Sendai, Miyagi, Japan, 3 Department of Materials Science and Chemical Engineering, Shizuoka University, Hamamatsu, Shizuoka, Japan, 4 Department of Metallurgy and Ceramics Science, Tokyo Institute of Technology, Meguro, Tokyo, Japan

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9:00 PM - NN3.13
On Texture and Grain Size Evolution in Electrodeposition.

Patrick Cantwell 1 2 , Matthew Schneider 1 2 , Eric Stach 1 2
1 Materials Engineering, Purdue University, West Lafayette, Indiana, United States, 2 Birck Nanotechnology Center, Purdue University, West Lafayette, Indiana, United States

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9:00 PM - NN3.14
Informatics for Quantitative Analysis of Atom Probe Tomography Images.

Krishna Rajan 1
1 Materials Science and Engineering, Iowa State University, Ames, Iowa, United States

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9:00 PM - NN3.2
Raman Imaging – New Tool for Materials Characterization.

Sergey Mamedov 1 , Eunah Lee 1 , Fran Adar 1 , Andrew Whitley 1
1 , Horiba Jobin Yvon Inc., Edison, New Jersey, United States

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9:00 PM - NN3.3
Difference Raman for Enhancing Image Resolution By Accurate Tip Positioning of An Atomic Force Probe That Enhances or Shadows The Raman Signal.

Rimma Dekhter 1 , Hesham Taha 1 , Avraham Israel 1 , David Lewis 1 , Aaron Lewis 2
1 , Nanonics Imaging Ltd., Jerusalem, 0, Israel, 2 , Hebrew University of Jerusalem, Jerusalem, 0, Israel

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9:00 PM - NN3.4
Real Time, Digital Reciprocal Space X-ray Topographic Characterization of Substrate and Epitaxial Structures of Electronic and Related II-VI, III-V Type Materials.

Ravi Ananth 1
1 Metallyrgy & Materials Engineering, Deeco Metals, Irvington, New Jersey, United States

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9:00 PM - NN3.5
An Introduction to Backcatter Spectroscopy with the Helium Ion Microscope.

Sybren Sijbrandij 1 , Chuong Huynh 1 , John Notte 1 , Larry Scipioni 1
1 ALIS Business Unit, Carl Zeiss SMT Inc., Peabody, Massachusetts, United States

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9:00 PM - NN3.6
Imaging and Analysis of Biologically Induced Fe Phosphate Precipitates in Porous Silica.

James McKinley 1 , Tetyana Peretyazhko 1 , John Zachara 1 , Satyanarayana Kuchibhatla 1 , Donald Baer 1
1 , Pacific Northwest National Laboratory, Richland, Washington, United States

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9:00 PM - NN3.7
Visualization of Actives Delivery to Stratum Corneum using Confocal Raman Microscopy.

Laurence Senak 1
1 Materials Science, ISP, Wayne, New Jersey, United States

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9:00 PM - NN3.8
Electron Holographic and HREM Characterization of Au/SrTiO3 Nano-hetero Catalysts.

Satoshi Ichikawa 1 , Seiji Takeda 2 , Tomoki Akita