Symposium CH03-Nanoscale Materials Characterization Through Atom Probe Tomography

Atom probe tomography (APT) is an increasingly important emergent materials characterization technique for quantitative nanoscale analysis within many fields of study. APT is currently the only characterization technique able to provide near-atomic-resolution, three-dimensional, chemically resolved images with sensitivity approaching 10s of ppm. While APT was initially limited to predominantly electrically conductive materials - such as metals - advances in instrument design, computers software and hardware, site-specific sample preparation techniques, and data analysis methods have facilitated a rapid expansion in the use of the technique to other application areas. A few examples are energy generation and storage, catalysis, geology, biomaterials, superconductors, and semiconductors. The symposium will broadly cover topics relating to nanoscale materials characterization through APT. Areas of interest include, but are not limited to, current and emerging research in the following areas: engineered and functional materials, natural materials, and materials applications; data analytics, computational techniques, and software developments; correlative and complementary analysis techniques; bridging the gaps between basic science and industrial applications; and instrument development.








Topics will include:

  • APT characterization of metals including high entropy alloys, nuclear materials, high heterogeneity materials, and nanocrystalline materials
  • APT for semiconducting materials for microelectronics, power electronics, and optoelectronics applications
  • APT characterization of energy materials including solar cells, fuel cells, batteries, and thermoelectric materials
  • APT for catalytic materials including zeolites, nanoparticles, and core-shell structures
  • Pioneering in APT for novel material analysis
  • Advanced data analytics, machine learning, and data standardization
  • Correlative APT analysis with other microscopies
  • Integration of APT data and atomic simulations
  • Hardware advances in APT
  • Cryo/Vacuum transfer for sensitive materials such as solid-liquid interfaces and biological materials

Invited Speakers (tentative):

  • Andrew Breen (The University of Sydney, Australia)
  • Michele Conroy (Imperial College London, United Kingdom)
  • Alec Day (Steam Instruments, USA)
  • Arun Devaraj (Pacific Northwest National Laboratory, USA)
  • Peter Felfer (Friedrich-Alexander-Universität Erlangen-Nürnbergangen-Nürnberg, Germany)
  • Derk Joester (Northwestern University, USA)
  • Elizabeth Kautz (North Carolina State University, USA)
  • Alberto Perez-Huerta (University of Alabama, USA)
  • Konda Gokuldoss Pradeep (Indian Institute Of Technology Madras, India)
  • Katherine Rice (AMETEK, Inc., USA)
  • Lorenzo Rigutti (University of Rouen Normandie, France)
  • Xuyang Zhou (Max-Planck-Institut fuer Eisenforschung GmbH, Germany)

Symposium Organizers

Baishakhi Mazumder
University at Buffalo, The State University of New York
USA

David Diercks
Colorado School of Mines
USA
No Phone for Symposium Organizer Provided , ddiercks@mines.edu

Frederick Meisenkothen
National Institute of Standards and Technology
Materials Measurement Science Division
USA
No Phone for Symposium Organizer Provided , frederick.meisenkothen@nist.gov

Pritesh Parikh
Eurofins Nanolab Technologies
USA
No Phone for Symposium Organizer Provided , priteshparikh1990@gmail.com

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MRS publishes with Springer Nature

 

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