2018 MRS Spring Meeting

Symposium EP04 : Reliability and Materials Issues of Semiconductor Optical and Electron Devices and Materials

2018-04-03   Show All Abstracts

Symposium Organizers

Osamu Ueda, Kanazawa Institute of Technology
Robert Herrick, Intel Corporation
Matteo Meneghini, University of Padova
Kenji Shiojima, University of Fukui
EP04.01: Novel Devices
Session Chairs
Robert Herrick
Osamu Ueda
Tuesday AM, April 03, 2018
PCC North, 200 Level, Room 221 B

10:30 AM - EP04.01.01
Dielectric Environment Effects on Doping Efficiency in Colloidal PbSe Nanostructures

Qinghua Zhao1,Tianshuo Zhao1,Cherie Kagan1

University of Pennsylvania1

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10:45 AM - EP04.01.02
Material Reliability of Low-Temperature Boron Deposition for PureB Silicon Photodiode Fabrication

Lis Nanver1,Keith Lyon2,Xingyu Liu1,Joe Italiano3,James Huffman3

University of Twente1,KLA-Tencor2,Lawrence Semiconductor Research Laboratory3

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11:00 AM - EP04.01.03
Influence of Surface Defects on the Gas-Sensing Properties of In2O3(111) Films

Theresa Berthold1,Simeon Katzer1,Stefan Krischok1,Julius Rombach2,Oliver Bierwagen2,Marcel Himmerlich1

Technische Universität Ilmenau1,Paul-Drude-Institut für Festkörperelektronik2

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11:15 AM - EP04.01.04
Growth and Characterization of InAs p-i-n Photodetector Through Cation Exchange for Mid-Infrared Detection on Si Substrate

Wan Khai Loke1,Kian Hua Tan1,Kwang Hong Lee2,Satrio Wicaksono1,Soon Fatt Yoon1

Nanyang Technological University1,Low Energy Electronic System IRG2

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11:30 AM - EP04.01.05
Thermal Transport in AlN Single Crystals and AlN/GaN Superlattices

Runjie (Lily) Xu1,Miguel Muñoz Rojo1,SM Islam2,Bozo Vareskic3,Huili Xing2,Debdeep Jena2,Eric Pop1

Stanford University1,Cornell University2,UCLA3

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11:45 AM - EP04.01.06
Mobility Modelling of Gallium Nitride Nanowires

Viswanathan Naveen Kumar1,Dragica Vasileska1

Arizona State University1

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EP04.02: Transistor Reliability
Session Chairs
Kenji Shiojima
J. Wuerfl
Tuesday PM, April 03, 2018
PCC North, 200 Level, Room 221 B

1:30 PM - EP04.02.01
Cooperative Defect Evolution in a Catastrophically Failed AlGaN/GaN HEMT

Andrew Lang1,Brian Downey2,David Meyer2,Mitra Taheri1

Drexel University1,U.S. Naval Research Laboratory2

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1:45 PM - EP04.02.02
RF GaAs Reliability Studies in the Real World

William Roesch1

Qorvo1

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2:15 PM - EP04.02.03
The Role of Coulomb and Interface Roughness Scattering on the Electron Mobility in Nanoscale Devices—A Green’s Function Approach

Dragica Vasileska1,Gokula Kannan1

Arizona State University1

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2:30 PM -
BREAK


3:30 PM - EP04.02.04
Material, Technology and Bias Dependent Dynamic Effects in GaN Devices

Joachim Wuerfl1,Eldad Bahat-Treidel1,Oliver Hilt1,Mihaela Wolf1,Jan Boecker2,Carsten Kuring2,Sibylle Dieckerhoff2

Ferdinand-Braun-Institut1,Technical University of Berlin2

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4:00 PM - EP04.02.05
Bias-Stress Instability in GaN Field-Effect Transistors

Jesus del Alamo1,Alex Guo1

Massachusetts Institute of Technology1

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4:30 PM - EP04.02.06
Radiation Effects in Ultra-Wide Bandgap AlN Schottky Barrier Diodes

Jossue Montes1,Houqiang Fu1,Hong Chen1,Xuanqi Huang1,Tsung-Han Yang1,Izak Baranowski1,Yuji Zhao1

Arizona State University1

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2018-04-04   Show All Abstracts

Symposium Organizers

Osamu Ueda, Kanazawa Institute of Technology
Robert Herrick, Intel Corporation
Matteo Meneghini, University of Padova
Kenji Shiojima, University of Fukui
EP04.03: High Power Transistor Reliability
Session Chairs
Robert Kaplar
Kenji Shiojima
Wednesday AM, April 04, 2018
PCC North, 200 Level, Room 221 B

8:00 AM - EP04.03.01
Automotive Quality 650V GaN HEMT Power Switch

Ken Shono1,Yoshiyuki Kotani1,Tsutomu Hosoda1,Kenji Imanishi1,Yoshimori Asai1,Ronald Barr2,Kurt Smith2,Yifeng Wu2,Likun Shen2,Saurabh Chowdhury2,Lee McCarthy2,Jim McKay2,John Gritters2,Peter Smith2,Sung Yea2,Primit Parikh2

Transphorm Japan1,Transphorm2

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8:30 AM - EP04.03.02
Hard-Switching Reliabiity Studies of 1200 V Vertical GaN PiN Diodes

Robert Kaplar1,Oleksiy Slobodyan1,Flicker Jack1,Stephanie Sandoval1,2,Chris Matthews1,2,Mike van Heukelom1,Stanley Atcitty1,Ozgur Aktas3,4,Isik Kizilyalli3,5

Sandia National Laboratories1,University of Arkansas2,Avogy3,Quora Technology4,ARPA-E5

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9:00 AM - EP04.03.03
Recent Advancements in Power GaN Reliability

Carlo De Santi1,Matteo Meneghini1,Matteo Borga1,Maria Ruzzarin1,Eleonora Canato1,Alaleh Tajalli1,Alessandro Barbato1,Elena Fabris1,Enrico Zanoni1,Gaudenzio Meneghesso1

University of Padova - DEI1

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9:30 AM - EP04.03.04
Substrate Optimization for High Reliability GaN Devices

Steve Stoffels1,Karen Geens1,Xiangdong Li1,Ming Zhao1,Enrico Zanoni2,Gaudenzio Meneghesso2,Matteo Meneghini2,Niels Posthuma1,Marleen Vanhove1,Stefaan Decoutere1

imec1,University of Padova2

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10:00 AM -
BREAK


EP04.04: Photovoltaic Reliability
Session Chairs
Robert Herrick
Y. Sin
Wednesday AM, April 04, 2018
PCC North, 200 Level, Room 221 B

10:30 AM - EP04.04.01
Contact Metallization and Encapsulation Degradation in Field-Exposed Photovoltaic Modules

Andrew Fairbrother1,Samuel de Oliveira1,Mike Kempe2,Xiaohong Gu1

NIST1,NREL2

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10:45 AM - EP04.04.02
Defect Characterization of UMG mc-Si Solar Cells Using LBIC and Luminescence Imaging Techniques

Juan Jimenez1,Luis Sanchez1,Miguel Guada1,Angel Moreton1,Sofia Rodriguez Conde1,Oscar Martinez1,Miguel Gonzalez1

University of Valladolid1

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11:00 AM - EP04.04.03
Metastability in Cu(In,Ga)(S,Se)2 Photovoltaic Devices—Effect of Buffer Layer and Alkali Treatments

Shubhra Bansal1,Curtis Walkons1,Eric Ng1

University of Nevada, Las Vegas1

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11:15 AM - EP04.04.04
Analysis of CdTe Grain Boundaries via Molecular Dynamics

David Zubia1,Sharmin Abdullah1,Rodolfo Aguirre1,Xiaowang Zhou2

University of Texas at El Paso1,Sandia National Laboratories2

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11:30 AM - EP04.04.05
2D Reaction-Diffusion Solver for Modeling Metastabilities in CdTe Thin-Film Solar Cells

Abdul Shaik1,Dragica Vasileska1,Igor Sankin2,Dmitry Krasikov2,Daniel Brinkman3,Christian Ringhofer1

Arizona State University1,First Solar2,San Jose State University3

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11:45 AM - EP04.04.06
Thermal Reliability Analysis of InGaN Solar Cells

Xuanqi Huang1,Houqiang Fu1,Hong Chen1,Izak Baranowski1,Jossue Montes1,Tsung-Han Yang1,Brendan Gunning2,Yuji Zhao1

Arizona State University1,Sandia National Laboratories2

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EP04.05: Optoelectronic Reliability
Session Chairs
Juan Jimenez
Osamu Ueda
Wednesday PM, April 04, 2018
PCC North, 200 Level, Room 221 B

1:30 PM - EP04.05.01
Thermal and Mechanical Issues of High Power Laser Diode Degradation

Juan Jimenez1,Jorge Souto1,Jose Luis Pura1

University of Valladolid1

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2:00 PM - EP04.05.02
Reliability Study of InAs Quantum Dot Lasers on Si

Daehwan Jung1,Robert Herrick2,Justin Norman1,Jennifer Selvidge1,MJ Kennedy1,Catherine Jan2,Kunal Mukherjee1,Arthur Gossard1,John Bowers1

University of California Santa Barbara1,Intel Corporation2

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2:30 PM -
BREAK


3:00 PM - EP04.05.03
Catastrophic Optical Bulk Damage—A New Failure Mode in High-Power InGaAs-AlGaAs Strained Quantum Well Lasers

Yongkun Sin1,Zachary Lingley1,Miles Brodie1,Nathan Presser1,Neil Ives1

The Aerospace Corp1

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3:30 PM - EP04.05.04
Failure Analysis of LED

Sungwook Huh1,Josh Zhao1,Huanhuan Wang1,Darren Dunphy1,David Miller1,Gregory Stone1,Sui Lim1,Mushfeque Manzur1,Michael Gariepy1

Lumileds1

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EP04.06: Device Characterization
Session Chairs
Wednesday PM, April 04, 2018
PCC North, 200 Level, Room 221 B

3:45 PM - EP04.06.01
Diagnostics of Electron Devices—Fundamentals and Logics

Giovanna Mura1

DIEE - University of Cagliari1

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4:15 PM - EP04.06.02
In Situ Analysis of Diode Lasers and Their Degradation by Using Imaging Techniques

Jens Tomm1

Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie1

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4:45 PM - EP04.06.03
Sub-bandgap Response of Graphene/SiC Schottky Emitter Bipolar Phototransistor Examined by Scanning Photocurrent Microscopy

Bobby Barker1,Venkata Surya Chava1,Kevin Daniels2,M V S Chandrashekhar1,Andrew Greytak1

University of South Carolina1,US Naval Research Laboratory2

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EP04.07: Poster Session
Session Chairs
Robert Herrick
Kenji Shiojima
Wednesday PM, April 04, 2018
PCC North, 300 Level, Exhibit Hall C-E

5:00 PM -
EP04.07.26 moved to EP04.01.06


5:00 PM - EP04.07.01
DFT Insights into Ionic Ligands Influence on CdSe Quantum Dots Ground and Excited State Properties

Levi Lystrom1,Svetlana Kilina1

North Dakota State University1

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5:00 PM - EP04.07.02
Comparative Study of Surface Energies of Native Oxides of Si(100) and Si(111) via Three Liquid Contact Angle Analysis

Saaketh Narayan1,Jack Day1,Nicole Herbots1,2,Christian Cornejo1,2,Michelle Bertram1,2,Timoteo Diaz1,2,Karen Kavanagh3,Robert Culbertson1,Rafiqul Islam2,1

Arizona State University1,Cactus Materials Inc.2,Simon Fraser University3

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5:00 PM - EP04.07.03
Characterization of GaSb/GaAs Interfacial Misfit Dislocation Defect Filtering for Heterogeneous Integration of High Mismatch III-V Materials

Satrio Wicaksono1,Kian Hua Tan1,Wan Khai Loke1,Bowen Jia1,Soon Fatt Yoon1,Teguh Asmara2,Andrivo Rusydi2

Nanyang Technological University1,National University of Singapore2

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5:00 PM - EP04.07.05
Effect of Double Charge Region Passivation Layer on the Electrical Properties of AlGaN/GaN HEMT

Zhaoxu Wang1,Qingdong Zhang1,Wu Tang1

University of Electronic Science and Technology of China1

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5:00 PM - EP04.07.06
Conformal Surface Metallization for Single Crystalline Silicon Carbide

Jun-Qian Huang1,Pochun Chen1,Cherng-Yuh Su1

National Taipei University of Technology1

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5:00 PM - EP04.07.07
Effect of Thermal Annealing and Electron Beam Irradiation on Optical Properties of InGaN

Hanxiao Liu1,Alec Fischer1,Fernando Ponce1

Arizona State University1

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5:00 PM - EP04.07.08
Sintering Atmosphere Effects on the electrical Properties of Nb:TiO2 Ceramics

Jana Staudt1,2,Thiago Martins Amaral1,Peter William de Oliveira1,Eduard Arzt1,2

INM - Leibniz Insitute for New Materials1,Universität des Saarlandes2

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5:00 PM - EP04.07.09
Measuring Surface Energies of GaAs (100) and Si (100) by Three Liquid Contact Angle Analysis (3LCAA) for Heterogeneous Nano-bondingTM

Christian Cornejo1,2,Michelle Bertram1,2,Timoteo Diaz1,2,Nicole Herbots2,1,Saaketh Narayan3,Jack Day3,Ajit Dhamdhere2,Robert Culbertson1,Rafiqul Islam2,1

Arizona State University1,Cactus Materials Inc.2,BASIS Scottsdale3

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5:00 PM - EP04.07.10
Enhancing the Performance of Field Effect Transistor Based on N-Type In2O3 Nanowires via Gallium Doped

Ziyao Zhou1,Changyong Lan1,Renjie Wei1,Dapan Li1,Senpo Yip1,Johnny Ho1

City University of Hong Kong1

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5:00 PM - EP04.07.11
Study the Effect of Different Type of Top Gate Dielectrics on a-IGZO Based Dual Gate Ion Sensitive Field Effect Transistors

Deepa Bhatt1

IIT Kanpur1

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5:00 PM - EP04.07.12
Flexible TiO2 and ZrO2 Resistive Switching Films and Arrays on PET/ITO Substrates Prepared by UV Photolysis Processes

Yuanqing Chen1,2,Lingwei Li2,Yang Song2,Aditya Yerramilli1,Yuxia Shen1,Zhao Zhao1,N. David Theodore1,3,Terry Alford1,4

Arizona State University1,Xi'an University of Technology2,NXP Semiconductors3, African University of Science and Technology4

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5:00 PM - EP04.07.13
Thermal Stability and Lifetime Assessment of Zirconium ALD Precursor

Kyuyoung Heo1,Joo Hee Son1,Wang-Eun Lee1

Korea Research Institute of Chemical Technology1

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5:00 PM - EP04.07.14
Optoelectronics Properties of Tungsten Oxide Deposited by Flame Spray Pyrolysis

Domenico Caputo1,Shaul Ajo1,Giampiero de Cesare1,Alessio Buzzin1,Antonio Tricoli2,Renheng Bo2

University of Rome Sapienza1,The Australian National University2

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5:00 PM - EP04.07.15
Direct Bandgap Cross-Over Point of Ge1-ySny Grown on Ge-Buffered Si Studied by Temperatrue-Dependent Photoluminescence

Mee-Yi Ryu1,Thomas Harris2,Yung Kee Yeo2,Buguo Wang2,John Kouvekatis3

Kangwon National Univ1,Air Force Insitute of Technology2,Arizona State University3

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5:00 PM - EP04.07.16
Laser-Induced Monolithic Fabrication of Flexible ZnS/SnO2 Ultraviolet Photodetectors with Lateral Graphene Electrodes

Cheng Zhang1,Yunchao Xie1,Heng Deng1,Travis Tumlin1,Chi Zhang1,Jheng-Wun Su1,Ping Yu1,Jian Lin1

The University of Missouri1

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5:00 PM - EP04.07.17
Inline Defect Detection of eSiGe Overgrowth in finFET Device

Kwame Owusu-Boahen1,Anthony Nhiev1,ShungTae Shon1,Sean Le1,Mohammed Hossain1

Samsung1

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5:00 PM - EP04.07.18
Integrated Photonic Waveguide Assisted Photocathodes

Fatemeh Rezaeifar1,Rehan Kapadia1

University of Southern California1

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5:00 PM - EP04.07.19
Yield Improvement of SiV- Color Centers in Diamond via Silicon/Carbon Sequential Implantation

Edward Bielejec1,Will Hardy1,Duncan Lee1

Sandia National Laboratories1

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5:00 PM - EP04.07.20
A Study of Hole Transport in Crystalline Monoclinic Selenium Using Bulk Monte Carlo Techniques

Atreyo Mukherjee1,Dragica Vasileska1,Amirhossein Goldan2

Arizona State University1,Stony Brook University2

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5:00 PM - EP04.07.21
Independent Tuning of the Conduction Band Minimum and Valence Band Maximum of Amorphous Cd-In-Ga-O Thin Films

Minseok Kim1,Hiroshi Yanagi1

University of Yamanashi1

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5:00 PM - EP04.07.22
Relation Between Ion Beam Etch Rate of SiC Single Crystal and Its Plane Direction

Je Jun Jeong1

Seoul National University1

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5:00 PM - EP04.07.23
Survey of Contact Metals to Monolayer Molybdenum Disulfide

Alexander Mazzoni1,2,Michael Valentin1,3,Robert Burke1,Matthew Chin1,Madan Dubey1

U.S. Army Research Laboratory1,University of Maryland2,University of California, Riverside3

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5:00 PM - EP04.07.24
Atomic Layer Deposition of High-k Dielectric Nanolaminates on Single-Crystal GaN and Ga2O3(001)—Combined XPS-UPS Analysis of Conduction Band Offsets

David Mandia1,Angel Yanguas-Gil1,Joseph Libera1,Jeffrey Elam1

Argonne National Laboratory1

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5:00 PM - EP04.07.25
Co-Doping and Interface Defect Management in Optically Active Cr2+:ZnSe Thin Films for Mid-IR Electroluminescent and Lasing Sources

Renato Camata1,Zachary Lindsey1,Matthew Rhoades1

University of Alabama at Birmingham1

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5:00 PM - EP04.07.27
Hybrid Electrothermal Simulations on Vertical GaN Nanowire Transistors

Yue Xiao1,Qing Hao1,Hongbo Zhao1

University of Arizona1

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5:00 PM - EP04.07.29
Collector-Emitter Voltage Bias Influence on Total Ionization Dose Effects of 60Co Gamma g Irradiation in NPN Si BJTs

Olarewaju Lawal1,Shuhuan Liu1,Zhuoqi Li1

Xian Jiaotong University1

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5:00 PM - EP04.07.30
Influences of Deposition Parameters on Structural, Optical and Electrical Characteristics of Lu2O3 Thin Films Fabricated by Reactive RF Sputtering

Senol Kaya1,Ramazan Lok1,Huseyin Karacali1,Aliekber Aktag1,Ercan Yilmaz1

Aban Izzet Baysal Univ1

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5:00 PM - EP04.07.31
The Stability and Reliability of Erbium Oxide-Based Thin-Film Capacitors Under Gamma Irradiation

Ercan Yilmaz1,Senol Kaya1

Abant Izzet Baysal Univ1

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5:00 PM - EP04.07.32
Metal Whisker Growth Induced by Localized, High-Intensity DC Electric Fields

Vamsi Borra1,Osama Oudat1,Daniel Georgiev1,Victor Karpov1,Diana Shvydka1

Univ of Toledo1

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5:00 PM - EP04.07.33
Electrically Detected Magnetic Resonance on Multi-Gate Metal Oxide Silicon Field Effect Transistors

Kenneth Myers1,Patrick Lenahan1,Chadwin Young2

The Pennsylvania State University1,The University of Texas at Dallas2

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2018-04-05   Show All Abstracts

Symposium Organizers

Osamu Ueda, Kanazawa Institute of Technology
Robert Herrick, Intel Corporation
Matteo Meneghini, University of Padova
Kenji Shiojima, University of Fukui
EP04.08: Defects in Semiconductors
Session Chairs
J. Suda
Osamu Ueda
Thursday AM, April 05, 2018
PCC North, 200 Level, Room 221 B

8:00 AM - EP04.08.01
Experimental Investigation of Point Defects in Homoepitaxial GaN

Jun Suda1,2,Masahiro Horita2

Nagoya University1,Kyoto University2

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8:30 AM - EP04.08.02
Strain-Energy Release Mechanisms of Bent Semiconductor Nanowires by Polygonization and Nanocrack Formation

Zhiyuan Sun1,Chunyi Huang1,Jinglong Guo2,Jason Dong1,Robert Klie2,Lincoln Lauhon1,David Seidman1

Northwestern University1,University of Illinois at Chicago2

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8:45 AM - EP04.08.03
Hydrogen Defect Pair Model of Negative Bias Illumination Stress Instability in Amorphous Oxide Semiconductors Such as InGaZnO

John Robertson1,Hongfei Li1,Yuzheng Guo2

University of Cambridge1,Swansea University2

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9:00 AM - EP04.08.04
Quantitative Detection of Interstitial Oxygen in Czochralski-Grown Si Crystals Via Unique Matrix-Assisted Calibration In Laser-induced Breakdown Spectroscopy (LIBS)

Dibyendu Mukherjee1,2,Seyyed Ali Davari1,2,Patrick A. Taylor3,Robert W. Standley4

Nano-BioMaterials Laboratory for Energy, Energetics & Environment (nbml-E3)1,University of Tennessee2,ChemTrace, Quantum Global Technologies, LLC Company3,GlobalWafers Co. Ltd.4

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9:15 AM - EP04.08.05
Excitation and Temperature Dependent Measurements of the Nonradiative Coefficients and Quantum Efficiency of InAsSb Lattice Matched to GaSb

Arvind Shalindar1,Preston Webster2,Rajeev Reddy Kosireddy1,Nathaniel Riordan1,Shane Johnson1

Arizona State University1,Air Force Research Laboratory (AFRL)2

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9:30 AM - EP04.08.06
Lattice Green’s Function for Modeling of Defects and Their Interactions in Diamond for Application to Electron and Optical Devices

Vinod Tewary1,Edward Garboczi1

National Institute of Standards and Technology1

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9:45 AM -
BREAK


EP04.09: Epitaxial Growth
Session Chairs
Yoriko Tominaga
Osamu Ueda
Thursday AM, April 05, 2018
PCC North, 200 Level, Room 221 B

10:15 AM - EP04.09.01
Carrier Lifetime Control in 4H-SiC Epitaxial Growth by Vanadium Doping

Hidekazu Tsuchida1,Koichi Murata1,Tetsuya Miyazawa1,Takeshi Tawara2,3,Masaki Miyazato2,3

Central Research Institute of Electric Power Industry (CRIEPI)1,National Institute of Advanced Industrial Science and Technology (AIST)2,Fuji Electric Co., Ltd.3

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10:45 AM - EP04.09.02
Effect of Pre-Growth Cleaning and Growth Parameters on Quality of Epitaxial Regrowth on InGaAs/GaAs QWs and InAs/GaAs QDs

Sadhvikas Addamane1,George Wang2,Ganesh Balakrishnan1

The University of New Mexico1,Sandia National Laboratories2

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11:00 AM - EP04.09.03
Growth Temperature Dependence of Crystallinity of Low-Temperature-Grown InxGa1-xAs Towards Fabrication of Photoconductive Antennas on the Basis of Defect Engineering

Yoriko Tominaga1,Yutaka Kadoya1

Hiroshima University1

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11:30 AM - EP04.09.04
Microstructure and Composition Study of InAsSbBi and GaAsSbBi Grown on GaSb by Molecular Beam Epitaxy

Rajeev Reddy Kosireddy1,Stephen Schaefer1,Arvind Shalindar1,Preston Webster1,Shane Johnson1

Arizona State University1

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11:45 AM - EP04.09.05
Molecular Beam Epitaxy Growth and Optical Properties of InAsSbBi and GaAsSbBi

Stephen Schaefer1,Preston Webster2,Arvind Shalindar1,Rajeev Reddy Kosireddy1,Shane Johnson1

Arizona State University1,Air Force Research Laboratory2

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EP04.10: Device Fabrication
Session Chairs
S. Fujita
Kenji Shiojima
Thursday PM, April 05, 2018
PCC North, 200 Level, Room 221 B

1:30 PM - EP04.10.01
Defect Control of α-Ga2O3 on Sapphire Substrates Grown by Mist CVD

Shizuo Fujita1,Riena Jinno1,Nobuhiro Yoshimura1,Kentaro Kaneko1

Kyoto University1

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2:00 PM - EP04.10.02
Characterization of Plasma Induced Damage, Strain and Sidewall Roughness on InP Patterns and Their Impact on Luminescence

Névine Rochat2,Marc Fouchier1,Maria Fahed1,Erwine Pargon1,Jean-Pierre Landesman3,Joyce Roque2,Denis Rouchon2,Patrice Gergaud2,Sylvain David1,Karine Rovayaz1,Eugénie Martinez2,Jean-Charles Barbé2,Sébastien Labau1

Univ. Grenoble Alpes, CNRS, LTM1,Univ. Grenoble Alpes, CEA, LETI2,Institut de Physique de Rennes, CNRS-UMR 6251, Université Rennes-13

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2:15 PM - EP04.10.03
Loss Mechanism Study and Fabrication of III-N Photonic Waveguide for Integrated Photonics Applications at Visible Spectral Wavelength

Hong Chen1,Houqiang Fu1,Xuanqi Huang1,Yuji Zhao1

Arizona State University1

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2:30 PM -
BREAK


3:30 PM - EP04.10.04
Plasma Activated Bonding of Two-Inch Sputtered AlN Wafers

Yusuke Hayashi1,Hideto Miyake1

Mie University1

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3:45 PM - EP04.10.05
Direct Heterogeneous Nano-Bonding™ of GaAs(100) to Si(100) at Near Atmospheric Pressure Below 220°C

Michelle Bertram1,2,Timoteo Diaz1,2,Christian Cornejo1,2,Nicole Herbots2,1,Robert Culbertson1,Ajit Dhamdhere2,Jacob Kintz1,2,Aliya Yano1,2,Rafiqul Islam2,1

Arizona State University1,Catcus Materials Inc.2

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