Structure determination in order to understand physical properties of a material is traditionally done via X-ray diffraction, using single crystals or powder. Although electron diffraction data has advantages compared to X-ray diffraction, i.e. it allows sampling of much smaller crystals and often delivers diffraction information for materials appearing “amorphous” for X-rays, its use for structure determination is less frequent. So far no automated procedure had been implemented for data acquisition and processing, so intensive training was necessary to collect data for structure characterization and use available processing software packages. Recently, we presented a new module providing a quick and easy way to collect automated 3D electron diffraction data from single crystals - automated diffraction tomography (ADT) . The module is set up entirely in STEM mode alternately acquiring µ-STEM images and diffraction patterns using a nano sized probe to access nano crystalline material even if agglomerated or embedded in a matrix. In contrast to the traditional approach, the automated diffraction data is acquired through sequentially tilting a selected crystal around an arbitrary crystallographic axis. Such a data set may miss main crystallographic zones, but as it includes a large number of high-index reflections, the overall number of collected reflections is typically higher than that achieved by manual electron diffraction data collection. Using the ADT module diffraction data is collected statically after each tilt loosing the precise information about the diffracted intensity distribution between the tilt steps. Through precession of the electron beam within an angle equal to the tilt step integrated volume data between the neighboring tilt positions can be obtained. Furthermore, PED data is known to have less dynamical artifacts. Therefore, we combined an electron beam precession unit  with the ADT data acquisition module.ADT tilt series were recorded from a variety of materials such as salt (BaSO4), small organic molecules (e.g. pharmaceuticals), MOFs and silicates with and without beam precession. Cell parameter determination and intensity extraction were performed with the self-developed automated diffraction analysis and processing package (ADAP). Subsequent application of direct methods and maximum entropy for “ab intio” structure solution and refinement turned out ot be successful. U. Kolb, T. Gorelik, C. Kübel, M.T. Otten and D. Hubert, Ultramicroscopy 107 (2007) 507; U. Kolb, T. Gorelik, M. T. Otten, Ultramicroscopy 108 (2008) 763. R. Vincent and P. A. Midgley, Ultramicroscopy 53 (1994) 271; C.S. Own, Ph.D. Dissertation, Northwestern University Evanston Illinois, (2005); A. Avilov, K. Kuligin, S. Nicolopoulos, M. Nickolskiy, K. Boulahya, J. Portillo, G. Lepeshov, B. Sobolev, J.P. Collette, N. Martin, A.C. Robins and P. Fischione, Ultramicroscopy 107 (2007) 431.