MRS Meetings and Events

 

EN06.02.08 2023 MRS Fall Meeting

Patterning Edge-Like Defects and Tuning Defect Propagation on the Basal Plane of Ultra-Large MoS2 Monolayers Toward Hydrogen Evolution Reaction

When and Where

Nov 27, 2023
4:45pm - 5:00pm

Hynes, Level 3, Room 306

Presenter

Co-Author(s)

Edson Leite1,Bianca Florindo1,Leonardo Hasimoto1,2,Nicolli de Freitas1,Graziâni Candiotto3,Erika Lima4,Cláudia de Lourenço1,Carlos Ospina1,Jefferson Bettini1,Renato Lima1,Rodrigo Capaz1,Murilo Santhiago1,2

Brazilian Nanotechnology National Laboratory1,UFABC2,UFRJ3,UFR4

Abstract

Edson Leite1,Bianca Florindo1,Leonardo Hasimoto1,2,Nicolli de Freitas1,Graziâni Candiotto3,Erika Lima4,Cláudia de Lourenço1,Carlos Ospina1,Jefferson Bettini1,Renato Lima1,Rodrigo Capaz1,Murilo Santhiago1,2

Brazilian Nanotechnology National Laboratory1,UFABC2,UFRJ3,UFR4
The catalytic sites of MoS<sub>2</sub> monolayers towards hydrogen evolution are well known to be vacancies and edge-like defects. However, it is still very challenging to control the position, size, and propagation of defects on the basal plane of MoS<sub>2</sub> monolayers by most of defect-engineering routes. In this work, the fabrication of arrays of etched windows on ultra-large supported [1] and free-standing MoS<sub>2</sub> monolayers using focused ion beam (FIB) is reported for the first time. By tuning the Ga<sup>+</sup> ion dose it is possible to confine defects near the etched edges or propagate them over ultra-large areas on the basal plane. The electrocatalytic activity of the arrays toward hydrogen evolution reaction (HER) was measured by fabricating microelectrodes using a new method that preserves the catalytic sites. We demonstrate that the overpotential can be decreased up to 290 mV by assessing electrochemical activity only at the basal plane. HRTEM images obtained on FIB patterned freestanding MoS<sub>2</sub> monolayers reveal the presence of amorphous regions and X-ray photoelectron spectroscopy indicate excess of sulfur in these regions. Density-functional theory calculations provide identification of catalytic defect sites. Our results demonstrate a new rational control of amorphous-crystalline surface boundaries and future insight for defect optimization in MoS<sub>2</sub> monolayers.<br/>[1] <i>Nanoscale</i>, 2022,14, 6811-6821.<br/>Acknowledgements: Serrapilheira institute (1912-31228) and FAPESP (2022/00955-0)

Keywords

2D materials | ion-beam processing | transmission electron microscopy (TEM)

Symposium Organizers

Aron Huckaba, University of Kentucky
Cecilia Mattevi, Imperial College London
Elisa Riedo, New York University
Christopher Sutton, University of South Carolina

Publishing Alliance

MRS publishes with Springer Nature