Call for Papers

Please contact the symposium organizers with questions.

Aberration-corrected (scanning) transmission electron microscopy (S/TEM) is one of the most versatile experimental techniques to explore the atomic scale structure-property relationships. Recent advancements in direct electron detectors, monochromators, cryo-holders and sophisticated data analysis techniques have enabled atomic-scale characterization of sensitive physical properties in quantum materials such as local strain ,electric field, magnetic field, and correlated electronic states. Such measurements are critical for designing artificial systems for quantum information science and engineering. The symposium proposed here will focus on advancement in electron microscopy techniques to characterize quantum materials, including novel data collection methods, advancement in holders, detectors, stages and analysis in hyperspectral data sets, such as spectrum images and four-dimensional STEM. Abstracts will be solicited from (but not limited to) studies of the local crystalline structure, strain fields, polarization, electric/magnetic fields, electronic band structure, quantum confined bosonic states in different types of materials such as ferroics, two-dimensional materials and correlated oxides under electric biasing and cryogenic temperature conditions. Abstracts based on the novel design of holders, spectrometers and data processing will be especially encouraged.

Topics will include:

• Applications of electron microscopy to characterize topological materials, ferroics and two-dimensional materials
• Nano-diffraction for strain and domain boundary mapping
• 4D-STEM ptychography foy unravelling electric and magnetic fields
• Applications of low EELS and cathodoluminescence to image hybrid light-matter interactions and correlated electronic excitations such as phonons, excitons, polaritons and plasmons
• Applications of cryo-analytical electron microscopy techniques to understand low-temperature structural and electronic phase transitions.
• Novel cryo-electron microscopy holders, data collection and analysis methods
• Machine Learning Methods

Invited Speakers (tentative):

• Michele Conroy (Imperial College London, United Kingdom)
• Ondrej Dyck (Oak Ridge National Laboratory, USA)
• Joanne Etheridge (Monash University, Australia)
• Berit Goodge (Max Planck Institute for Chemical Physics of Solids, Germany)
• Jordan Hachtel (Oak Ridge National Laboratory, USA)
• Demie Kepaptsoglou (University of York, United Kingdom)
• Maureen J. Lagos (Mc Master University, Canada)
• James LeBeau (Massachusetts Institute of Technology, USA)
• Barnaby Levin (Direct Electron, USA)
• Yung-Chang Lin (National Institute of Advanced Industrial Science and Technology, Japan)
• Tracy Lovejoy (NION Company, USA)
• Ana M Sanchez (University of Warwick, United Kingdom)
• Sophie Meuret (Centre d’Élaboration de Matériaux et d’Etudes Structurales, France)
• Christian Monachon (Attolight AG, Switzerland)
• David Muller (Cornell University, USA)
• Colin Ophus (Lawrence Berkeley National Laboratory, USA)
• Phillip Pelz (Friedrich-Alexander-Universität Erlangen-Nürnberg, Germany)
• Jan Ringnalda (Thermo Fisher Scientific, USA)
• Claus Ropers (Max Planck Institute for Multidisciplinary Sciences, Germany)
• Mary Scott (University of California, Berkeley, USA)
• Eren Suyolcu (Max Planck Institute for Solid State Research, Germany)
• Ray Twesten (AMETEK, Inc., USA)
• Jo Verbeeck (University of Antwerp, Belgium)
• Steffi Woo (Université Paris-Saclay, France)
• Xiuzhen Yu (RIKEN, Japan)
• Yimei Zhu (Brookhaven National Laboratory, USA)
• Jian-Min Zuo (University of Illinois at Urbana-Champaign, USA)

Symposium Organizers